Research on structure of Cu2ZnSn(S, Se)4 thin films with high Sn-related phases

Cu2ZnSn(S, Se)4 (CZTSSe) thin films were deposited on flexible substrates by three evaporation processes at high temperature. The chemical compositions, microstructures and crystal phases of the CZTSSe thin films were respectively characterized by inductively coupled plasma optical emission spectrometer (ICP-OES), scanning electron microscopy (SEM), X-ray diffraction (XRD) and Raman scattering spectrum. The results show that the single-step evaporation method at high temperature yields CZTSSe thin films with nearly pure phase and high Sn-related phases. The elemental ratios of Cu/(Zn+Sn)=1.00 and Zn/Sn=1.03 are close to the characteristics of stoichiometric CZTSSe. There is the smooth and uniform crystalline at the surface and large grain size at the cross section for the films, and no other phases exist in the film by XRD and Raman shift measurement. The films are no more with the Sn-related phase deficiency.     

衬底温度对CZTSSe薄膜结构特性的影响

采用热蒸发法制备铟锌锡硫(CZTSSe)薄膜。采用低 温一步 法在300℃衬底温度下制备CZTSSe薄膜;采用两步法,即在衬底温度 分别为300℃制备CZTSSe 薄膜;将衬底温度设定为480℃不变,一步蒸发沉积CZTSSe薄膜。通 过对X射线衍射(XRD)、 扫描电镜(SEM)、拉曼谱对比发现,在300℃低温下一步法和300℃ 、480℃两 步法沉积的薄膜表面粗糙,碎小晶粒较多;在480℃一步高温法制备 的薄膜表面平整, 晶粒大小均匀,3个衍射峰的半高峰宽变窄,薄膜的结晶质量得到 改善,且没有发现其它杂相的拉曼特征峰,沉积出适合作为制备CZTSSe薄膜太阳电池的 吸收层。     

铜锌锡硫薄膜材料及其器件应用研究进展

铜锌锡硫薄膜材料组成元素储量丰富, 环境友好, 成本低廉, 成为最具前景的薄膜材料之一. 目前, Cu₂ZnSn(S, Se)₄ (CZTSSe)薄膜太阳电池的最高转换效率已经达到12.6%. 本文总结了Cu₂ZnSnS₄ (CZTS)的发展历史, 依次介绍了CZTS薄膜材料的结构特性、光学特性、电学特性、界面特性和Na对CZTS 薄膜的影响, 详细介绍了CZTS薄膜的制备方法及器件应用的最新研究进展, 总结了目前CZTS薄膜太阳电池发展中存在的问题, 展望了今后的研究方向.     

溶液PH值对CdS薄膜结构特性的影响

采用化学水浴沉积(CBD)工艺在玻璃衬底上制 备CdS薄膜,研究溶液PH值对CdS 薄膜结构特性的影响。薄膜的厚度、组份、晶相结构和表观形貌分别由台阶仪、X射线荧光 光谱(XRF)、X射线衍射(XRD)和场发射扫描电子显微镜(FESEM)来表征。溶液的 PH值为11.26、 11.37和11.48时,CdS薄膜的晶相以六方相为主,薄膜的厚度先增大后减小; PH值为11.62、11.66时,薄膜的晶相以立方相为主,薄 膜的厚度进一步减小。同时,随着溶液PH值 增大,CdS薄膜的晶格常数也逐渐增大。两种晶相的CdS薄膜缓冲层与CIGS薄膜分别构成异 质 对形成异质结时的晶格失配分别为32.297%和1.419%,界面态密度分别为2.792×10¹⁴和8.507×10¹²,因此高效CIGS薄 膜太阳电池更需要立方相的CdS薄膜。     

Research on structural characteristics of large-scale CdS thin films deposited by CBD under low ammonia condition

Cadmium sulfide (CdS) buffer layers with the scale of 10 cm×10 cm are deposited by chemical bath deposition (CBD) with different temperatures and thiourea concentrations under low ammonia condition. There are obvious hexagonal phases and cubic phases in CdS thin films under the conditions of low temperature and high thiourea concentration. The main reason is that the heterogeneous reaction is dominant for homogeneous reaction. At low temperature, CdS thin films with good uniformity and high transmittance are deposited by adjusting the thiourea concentration, and there is almost no precipitation in reaction solution. In addition, the low temperature is desired in assembly line. The transmittance and the band gap of CdS thin films are above 80% and about 2.4 eV, respectively. These films are suitable for the buffer layers of large-scale Cu(In,Ga)Se2 (CIGS) solar cells.     

沉积预制层衬底温度对CIGS薄膜结构特性的影响

采用三步共蒸发工艺在玻璃衬底上制备CIGS薄膜, 研究沉积预制层的衬底温度对CIGS薄膜 结构特性的影响。薄膜的厚度、组份、晶相结构、表观形貌和电学特性分别由台阶仪、X射 线荧光光谱(XRF)、X射线衍射(XRD)、场发射扫描电子显微镜(FESEM)和霍耳效应测量仪来表征。沉积 预制层的衬底温度 较低(如300℃)时,预制层中Ga含 量较低,容易形成In₂Se₃相;而衬底温度较高(如400℃) 时,预制层中Ga含量较高,容易形成(In,Ga)₂Se₃相;原因是Ga₂Se₃的形成焓(－462.4kJ/mol)比In₂Se₃的(－360kJ/mol)低,没有In₂Se₃稳定;In₂Se₃相比Ga₂S e₃相更容易稳定存在,尤其是在低温下;当温度较高 时,Ga₂Se₃相也容易存在,与In₂Se₃一起形成(In,Ga)₂Se₃固溶体。而且,衬 底温度较高(如400℃)时,沉积 的CIGS薄膜中的Ga含量比其它两种衬底温度下沉积的薄膜都高,薄膜粗糙度较小,迁移率和 载流子浓度都比较大,电阻率较小。