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Charge ordering modulations in a Bi<sub>0.4</sub>Ca<sub>0.6</sub>MnO<sub>3</sub> film with a thickness of 110 nm 下载免费PDF全文
The low temperature sample stage in a transmission electron microscope is used to investigate the charge ordering behaviours in a Bi 0.4 Ca 0.6 MnO 3 film with a thickness of 110 nm at 103 K.Six different types of superlattice structures are observed using the selected-area electron diffraction(SAED) technique,while three of them match well with the modulation stripes in high-resolution transmission electron microscopy(HRTEM) images.It is found that the modulation periodicity and direction are completely different in the region close to the Bi 0.4 Ca 0.6 MnO 3 /SrTiO 3 interface from those in the region a little further from the Bi 0.4 Ca 0.6 MnO 3 /SrTiO 3 interface,and the possible reasons for this are discussed.Based on the experimental results,structural models are proposed for these localized modulated structures. 相似文献
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针对多数超声波电源存在频率漂移、跟踪性能差、易失谐,造成能量转换效率低、甚至设备损坏等诸多问题,设计了一种基于数字控制、可实现快速频率跟踪的超声波电源。将改进的粒子群算法(PSO)结合比例积分微分(PID)控制应用于频率控制过程,实现了启动瞬间及工作过程均能快速检测超声波换能器的谐振频率,并调整对应输出脉冲频率,使换能器工作于谐振状态,高效地将电能转换成声能。 相似文献
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The low temperature sample stage in a transmission electron microscope is used to investigate the charge ordering behaviours in a Bi0.4Ca0.6MnO3 film with a thickness of 110 nm at 103 K. Six different types of superlattice structures are observed using the selected-area electron diffraction (SAED) technique, while three of them match well with the modulation stripes in high-resolution transmission electron microscopy (HRTEM) images. It is found that the modulation periodicity and direction are completely different in the region close to the Bi0.4Ca0.6MnO3/SrTiO3 interface from those in the region a little further from the Bi0.4Ca0.6MnO3/SrTiO3 interface, and the possible reasons for this are discussed. Based on the experimental results, structural models are proposed for these localized modulated structures. 相似文献
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简要介绍了FEI Titan80—300STEM扫描透射电镜中装配的Wien-filter型能量单色器(monochromator).文章特别指出,装配有能量单色器的FEI Titan80—300STEM扫描透射电镜,可以直接给出高能量分辨率(~0.1eV)的电子能量损失谱.利用高分辨电子能量损失谱,在高能损失区,对于K或L能级自然宽度(natural width of energy level)小于0.5eV的元素,可以获得更细致的的近限精细结构(energy-loss near-edge structure),更有利于解析其电子结构;在低能损失区,可以用于精确地确定半导体材料的带隙(bandgap)以及p型掺杂引起的带隙能的变化. 相似文献
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