The physics of space charge instabilities and temporal chaos in extrinsic photoconductors

This paper reviews experimental and theoretical work carried out on space charge instabilities and temporal chaotic behavior in cooled extrinsic p-type Germanium photoconductors. Measured dc current-voltage (I–V) characteristics of these devices are strongly nonlinear for moderate electric fields 0.1 V/cm due to field dependence of the rates of free hole capture and impurity impact ionization. Below the threshold field for impurity breakdown, Ge samples behave like damped nonlinear oscillators, exhibiting characteristic chaotic response when driven by a time-periodic voltage. Above impurity breakdown, we observe voltage-controlled negative differential resistance (NDR) in the I–V curves accompanied by spontaneous current oscillations due to moving space charge domains with velocities 10³ to 10⁴ cm/s. Measurements are well explained by a simple rate equation model in which negative differential behavior in the impact ionization rate plays a crucial role. Related work on semiconductor chaos and possible future directions for research are also mentioned.     

Analysis of t-butylphenol acetylene condensed resin with methyl-methine linkages in vulcanized rubber by pyrolysis-gas chromatography/mass spectrometry

Methyl-methine linkages of Novolac, a commercially available t-butylphenol acetylene condensed (TBPA) resin, have been identified by recognition of pyrolysis pathways using pyrolysis-gas chromatography/mass spectrometry (Py-GC/mS) in vulcanized rubber. The diagnostic mass spectrum of t-butylphenol with methyl-methine linkages between phenolic rings was observed at m/z 192, corresponding to 4-t-butyl-2-ethyl-6-methylphenol. Other molecular ions were observed at m/z 178, 164, and 150 in the characteristic pyrolyzates. The ion at m/z 192 in the TBPA resin was observed to be characteristic for methyl-methine linkages between the phenolic groups, and the analytical pyrolysis-GC/mS method was thus able to identify the resin at low levels in vulcanized rubber. Copyright 1999 John Wiley & Sons, Ltd.