Effect of the structure of smooth copper surfaces on the accuracy of determination of the optical constants of copper

The accuracy of determination of the optical constants of smooth copper surfaces produced by different technologies is analyzed, with particular attention paid to the consideration of the influence of scattered radiation (which is ignored by many authors) on the retrieval of the optical constants of copper surfaces from reflected radiation. The neglect of scattered radiation can lead to errors as high as 50% in determining the optical constants for bulk copper. For thin films, the errors are much lower. The influence of surface oxidation during measurements in air and surface features of studied objects on the parameters to be determined is analyzed as well. It is shown that errors in determination of the constants are maximal in the plasma resonance region of copper.

     

Photoluminescence spectra of copper-based planar nanostructures

We have studied the luminescence of planar nanostructures based on amorphous copper, excited by a low-intensity source in the UV region of the spectrum. We have shown that it is dependent on the packing density of copper granules on the surface of the quartz substrate, the presence of chains of granules, the optical properties of the surrounding medium, and the oxidation time. The observed maxima at the wavelengths of 400 nm and 520 nm correspond to luminescence of the quartz and copper oxide Cu₂O. The maximum at 650 nm is located in the region of plasma resonances of the oxidized copper chains and aggregates, and is enhanced in the “hot spot” region near the surface of interacting copper particles. __________ Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 73, No. 4, pp. 510–515, July–August, 2006.