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In this paper we discuss the recovery of derivatives and thecomputation of rigorous and useful upper bounds for the pointwiseerror in the recovered derivatives, for finite element approximationsof the Laplace equation with Neumann boundary conditions, especiallyat points close to or on a smooth, curved boundary. We analyzethe dipole image technique for the case of curved boundaries,and show how to compute reliable recovered derivatives and errorbounds even in the limiting case of points lying on the curvedboundary. Numerical experiments show reasonably tight errorbounds for points both close to and away from a curved boundary. 相似文献
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We have deposited relatively thick (∼60 nm) Ge layers on Br-passivated Si(111) substrates by thermal evaporation under high
vacuum conditions at room temperature. Ge has grown in a layer-plus-island mode although it is different from the Stranski-Krastanov
growth mode observed in epitaxial growth. Both the islands and the layer are nanocrystalline. This appears to be a consequence
of reduction of surface free energy of the Si(111) substrate by Br-passivation. The size distribution of the Ge nanoislands
has been determined. The Br-Si(111) substrates were prepared by a liquid treatment, which may not produce exactly reproducible
surfaces. Nevertheless, some basic features of the nanostructural island growth are reasonably reproducible, while there are
variations in the details of the island size distribution. 相似文献
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