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Theory predicts that the currents in scanning tunneling microscopy (STM) and the attractive forces measured in atomic force microscopy (AFM) are directly related. Atomic images obtained in an attractive AFM mode should therefore be redundant because they should be similar to STM. Here, we show that while the distance dependence of current and force is similar for graphite, constant-height AFM and STM images differ substantially depending on the distance and bias voltage. We perform spectroscopy of the tunneling current, the frequency shift, and the damping signal at high-symmetry lattice sites of the graphite (0001) surface. The dissipation signal is about twice as sensitive to distance as the frequency shift, explained by the Prandtl-Tomlinson model of atomic friction. 相似文献
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The current and planned research in nanoscience and engineering will make possible a paradigm shift in nanoscale devices and structures. 相似文献
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Atomic force microscope 总被引:8,自引:0,他引:8
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Synthesis, integration, and electrical properties of individual single-walled carbon nanotubes 总被引:4,自引:0,他引:4
J. Kong C. Zhou A. Morpurgo H.T. Soh C.F. Quate C. Marcus H. Dai 《Applied Physics A: Materials Science & Processing》1999,69(3):305-308
High-quality single-walled carbon nanotubes (SWNTs) are synthesized by chemical vapor deposition (CVD) of methane on silicon-dioxide
substrates at controlled locations using patterned catalytic islands. With the synthesized nanotube chips, microfabrication
techniques are used to reliably contact individual SWNTs and obtain low contact resistance. The combined chemical synthesis
and microfabrication approaches enable systematic characterization of electron transport properties of a large number of individual
SWNTs. Results of electrical properties of representative semiconducting and metallic SWNTs are presented. The lowest two-terminal
resistance for individual metallic SWNTs (≈5 μm long) is ≈16.5 kΩ measured at 4.2 K.
Received: 17 May 1999 / Accepted: 18 May 1999 / Published online: 14 July 1999 相似文献
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