Investigation of Structure and Growth of Self-Assembled Polyelectrolyte Layers by X-ray and Neutron Scattering under Grazing Angles

The structure of self-assembled polyelectrolyte thin films on float glass has been investigated by interface sensitive X-ray and neutron scattering methods. Special emphazis was given to the adsorption process of poly (ethylene imine) and polystyrole sulfonate as an important model system which is often used as a basis for subsequent multilayer buildup. From complementary X-ray and neutron reflectivity data, the vertical film density profile was derived for various growth parameters, including kinetic effects of different adsorption times. In addition to specular reflectivity, we have for the first time employed nonspecular X-ray scattering to study lateral structure parameters in self-assembled polyelectrolyte films. Furthermore, the technique of time-resolved in situ X-ray reflectivity during film growth has been demonstrated and is discussed in view of its future potential. Copyright 2000 Academic Press.     

X-ray coherence and ultra small angle resolution at grazing incidence and exit angles

We measure the nonspecular x-ray scattering at grazing incidence and exit angles from a GaAs surface, modulated by an one-dimensional lateral grating of effectively variable periodicity 1 md60 m. Due to the projection onto the sample surface, the lateral coherence length is enlarged by a factor of more than 100. The line broadening of the diffraction maxima is used to deduce the number of periods that add up coherently for a given periodd and given angle of incidence. We demonstrate that the scattering geometry used allows for large coherently illuminated lengths on the sample and ultra small angle resolution of one- or two-dimensional objects. Thus structures of m size and larger will be accessible by coherent x-ray scattering.     

Investigations of two-level tunneling systems in n-irradiated quartz by diffuse x-ray scattering

Abstract

Recent observation of the acoustic saturation and of phonon echoes in crystalline quartz after light irradiation with fast neutrons indicates that there are the same low-energy atomic tunnelling systems as in Si0₂ glass.

We report measurements of the diffuse X-ray scattering and of the lattice parameter change from neutron irradiated quartz single crystals studying the strength and symmetry of strain defects and their local correlations. For dose 3 × 10¹⁸ n/cm² the diffuse scattering close to the Bragg peaks together with the lattice parameter change shows that the neutrons create defective regions with a volume change of 29 mean atomic volumes. The distortion field of these regions shows no high symmetry. The radius of the heavily strained region is ～ 10 Å. For higher doses the regions grow a little bit but mainly new defective regions are built.

According to the various volume fractions of defective regions at various doses the first strong amorphous halo at about K≈ 1.5 A^?1 was detected. Since this amorphous scattering is isotropic and during annealing the regions disappear mainly without changing their size we are led to the conclusion that the defective regions are glass-like in nature. So the size of the tunnelling system has to be smaller than 20 Å.     

Erholungsvorgänge in UV-bestrahltem Silberchlorid

The formation of defects in AgCl single crystals under UV and X-ray exposure and their thermal annealing are studied by measuring the optical density, the lattice parameter change, the X-ray Ag-reflection and by electronmicroscopical observations. Specks of crystalline silver are found to be produced at the surface of the crystals as well as in the interior. According to surface and volume darkening the isochronal annealing curves exhibit two stages. The activation energy for stage I, (0,59±0,08) eV, is suggested to be the energy for the thermal formation of electrons and Ag ₀ ⁺ -ions from Ag-aggregates. Stage II appears when the crystal is annealed in chlorine at above 523 °K. It is due to the regeneration of silver at the surface, where chlorine was able to leave the crystal during exposure.     

Nanometer-scale resolution of strain and interdiffusion in self-assembled InAs/GaAs quantum dots

Tomographic nanometer-scale images of self-assembled InAs/GaAs quantum dots have been obtained from surface-sensitive x-ray diffraction. Based on the three-dimensional intensity mapping of selected regions in reciprocal space, the method yields the shape of the dots along with the lattice parameter distribution and the vertical interdiffusion profile on a subnanometer scale. The material composition is found to vary continuously from GaAs at the base of the dot to InAs at the top.     

X-ray investigation of the mean square thermal displacements in VDx, NbHx and TaHx interstitial alloys

X-Ray measurements of the integrated Bragg intensities from V, Nb and Ta single crystals as a function of hydrogen (D) concentration and temperature have been carried out. Two different methods were applied: (i) the usual angular dispersive method using MoK_α1 characteristic radiation; and (ii) the energy dispersive method using the white spectrum of the Mo tube and an intrinsic Ge detector. From the results the thermal Debye-Waller factor for the three metals and its change with hydrogen concentration are determined. The mean square of the thermal displacements (u²) decreases with hydrogen (D) concentration. For NbH_x(D_x) this agrees well with (u²) values as determined from measured phonon density of states spectra. The results are also given in terms of a Debye temperature depending on H(D) concentration.     

Attenuation of phonon scattering intensities by point defects

The cross section of the coherent, inelastic neutron scattering is characteristically decreased in the presence of defect-induced lattice distortions. This effect is in analogy to the attenuation of Bragg intensities due to a static Debye-Waller factor. The integrated scattering intensities from transversal acoustic (TA-) phonons of the system NbN_0.014 have been measured and are shown to be attenuated with respect to the scattering intensities from the phonons of a pure Nb crystal. We discuss the obtained results through comparison with various model calculations.