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Xilin Peng Augusto Morrone Konstantin Nikolaev Mark Kief Mark Ostrowski 《Journal of magnetism and magnetic materials》2009,321(18):2902-2910
In this paper, we investigated the effect of background base pressure, wafer-transferring time between process modules, and stack layer material selection on the current-in-plane giant magneto-resistive (CIP-GMR) interface properties and the resulted CIP-GMR performance. Experimental results showed that seed layer/AFM interface, AFM/pinned layer (PL) interface, pinned layer/Ru interface, and reference layer (RL)/Cu spacer interface are among the most critical ones for a CIP-GMR device. By reducing the background impurity level (water moisture and oxygen), optimizing the wafer process flow sequence, and careful stack-layer material selection, such critical interfaces in a CIP-GMR device can be preserved. Consequently, a much robust GMR performance control can be achieved. 相似文献
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Stephen MT Hoke Gaoyang Liang A Irina Mutiu Julie Genereaux Christopher J Brandl 《BMC biochemistry》2007,8(1):16
Background
Spt7 is an integral component of the multi-subunit SAGA complex that is required for the expression of ~10% of yeast genes. Two forms of Spt7 have been identified, the second of which is truncated at its C-terminus and found in the SAGA-like (SLIK) complex. 相似文献4.
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