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B.H. Bayramov V.V. Toporov Sh.B. Ubaydullaev L. Hildisch E. Jahne 《Solid State Communications》1981,37(12):963-966
Raman scattering measurements have been performed on In1?xGaxP (0.62?x?1) over the entire frequency range of first and second order scattering. Besides the already known disorder activated band between the LO(Γ) and TO(Γ) modes a new disorder activated band is found in the region of transverse acoustic phonons around 87 cm-1. The position of the new band shifts only slightly with composition while its strength and line-shape change. 相似文献
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The present work is concerned with a reduction procedure for impurities in GaP substrate slices. Bý annealing of GaP in contact with high purity gallium the concentration of definite impurities is reduced. Heat treatment of GaP under phosphorus pressure introduces another efficient extraction mechanism which is based on phosphosilicate glass gettering and well known in silicon technology.
相似文献3.
In the two systems of mixed crystals GaxPAs1–x and GaxIn1–xP the refraction index — using the wavelength of the green Hg line (λ = 5461 Å) — is determined ellipsometrically in dependence on the mole fraction x. The nonlinearity parameter cn of this dependence is compared with that estimated theoretically by the use of PENNS model. 相似文献
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