排序方式: 共有30条查询结果,搜索用时 15 毫秒
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Zatsepin A. F. Buntov E. A. Zatsepin D. A. Boqizoda D. A. Guseva M. B. Vyatkina S. P. Kas’yanova A. V. 《Physics of Atomic Nuclei》2018,81(11):1660-1663
Physics of Atomic Nuclei - The diversity of carbon materials has allowed them to be used for fundamental and applied research to date. The newest modifications of carbon, such as nanodiamonds,... 相似文献
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Formation and electron-beam annealing of implantation defects in a thin-film Si-SiO2 heterostructure
Zatsepin A. F. Kaschieva S. Biryukov D. Yu. Dmitriev S. N. Buntov E. A. 《Technical Physics》2009,54(2):323-326
Technical Physics - The radiation-induced defects in a 20-nm-thick SiO2 film on a silicon wafer are studied by optically stimulated electron emission. Accelerated (12-keV) silicon ions is found to... 相似文献
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H. Mühe Mc. Candless E. Valenta Utz Wilh Vaubel B. Ahlström O. Aschan J. Kondakow J. Schindelmeiser R. Böhme H. Herzfeld J. E. Teeple R. Adan J. Marcusson Darmois H. Wolff C. Piest R. Marcille EA. Parry M. Adams H. W. Fosse K. Ihnatowzcz 《Analytical and bioanalytical chemistry》1917,56(10-11):541-560
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RD Harris WS Baker Van Stipdonk MJ RM Crooks EA Schweikert 《Rapid communications in mass spectrometry : RCM》1999,13(14):1374-1380
A suite of keV polyatomic or 'cluster' projectiles was used to bombard unoxidized and oxidized self-assembled monolayer surfaces. Negative secondary ion yields, collected at the limit of single ion impacts, were measured and compared for both molecular and fragment ions. In contrast to targets that are orders of magnitude thicker than the penetration range of the primary ions, secondary ion yields from polyatomic projectile impacts on self-assembled monolayers show little to no enhancement when compared with monatomic projectiles at the same velocity. This unusual trend is most likely due to the structural arrangement and bonding characteristics of the monolayer molecules with the Au(111). Copyright 1999 John Wiley & Sons, Ltd. 相似文献
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Zatsepin AF Buntov EA Kortov VS Tetelbaum DI Mikhaylov AN Belov AI 《J Phys Condens Matter》2012,24(4):045301
Results of the investigation of photoluminescence (PL) mechanisms for silicon dioxide films implanted with ions of silicon (100 keV; 7 × 10(16) cm(-2)) and carbon (50 keV; 7 × 10(15)-1.5 × 10(17) cm(-2)) are presented. The spectral, kinetic and thermal activation properties of the quantum dots (Si, C and SiC) formed by a subsequent annealing were studied by means of time-resolved luminescence spectroscopy under selective synchrotron radiation excitation. Independent quantum dot PL excitation channels involving energy transfer from the SiO(2) matrix point defects and excitons were discovered. A resonant mechanism of the energy transfer from the matrix point defects (E' and ODC) is shown to provide the fastest PL decay of nanosecond order. The critical distances (6-9 nm) of energy transport between the bulk defects and nanoclusters were determined in terms of the Inokuti-Hirayama model. An exchange interaction mechanism is realized between the surface defects (E(s)'-centres) and the luminescent nanoparticles. The peculiarities of an anomalous PL temperature dependence are explained in terms of a nonradiative energy transfer from the matrix excitons. It is established that resonant transfer to the luminescence centre triplet state is realized in the case of self-trapped excitons. In contrast, the PL excitation via free excitons includes the stages of energy transfer to the singlet state, thermally activated singlet-triplet conversion and radiative recombination. 相似文献
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Aderholz M Aggarwal MM Akbari H Allport PP Badyal SK Ballagh HC Barth M Baton JP Bingham HH Brucker EB Burnstein RA Campbell JR Cence RJ Chatterjee TK Clayton EF Corrigan G Coutures C DeProspo D Devanand De Wolf EA Faulkner PJ Foeth H Fretter WB Gupta VK Hanlon J Harigel G Harris FA Jabiol MA Jacques P Jain V Jones GT Jones MD Kafka T Kalelkar M Kasper P Kohli JM Koller EL Krawiec RJ Lauko M Lys JE Marage P Milburn RH Miller DB Mittra IS Mobayyen MM Moreels J Morrison DR Myatt G Nailor P 《Physical review D: Particles and fields》1992,45(7):2232-2243