基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像

本文结合近场扫描结构和纳米线-微光纤耦合技术,提出了一种基于硫化镉纳米线/锥形微光纤探针结构的被动近场光学扫描成像系统.该系统采用被动式纳米探针,保留了纳米探针对样品表面反射光的强约束优势.其理论收集效率为4.65‰,相比于传统的金属镀膜近场探针收集效率提高了一个数量级,可有效地提高扫描探针对样品形貌信息的检测能力;而后通过硫化镉纳米线与微光纤之间高效的倏逝场耦合,将检测的光强信号传输到远场进行光电探测,最终实现对目标样品形貌的分析成像,其样品宽度测量误差在7.28%以内.该系统不需要外部激发光路,利用显微镜自身光源进行远场照明,被动扫描探针仅作为样品表面反射光的被动收集系统.本文基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像方案,可有效地降低探针的制备难度和目标光场的检测难度,简化扫描成像的结构,为近场光学扫描显微系统之后的发展提供新的思路.     

Enhanced photoluminescence of monolayer MoS2 on stepped gold structure

Different MoS₂/Au heterostructures can play an important role in tuning the photoluminescence (PL) and optoelectrical properties of monolayer MoS₂. Previous studies of PL of MoS₂/Au heterostructures were mainly limited to the PL enhancement by using different Au nanostructures and PL quenching of monolayer MoS₂ on flat Au surfaces. Here, we demonstrate the enhanced excitonic PL emissions of monolayer MoS₂/Au heterostructures on Si/SiO₂ substrates. By transferring the continuous monolayer MoS₂ onto a stepped Au structure consisting of 60-nm and 100-nm Au films, the MoS₂/Au-60 and MoS₂/Au-100 heterostructures exhibit enhanced PL emissions, each with a blue-shifted PL peak in comparison with the MoS₂/SiO₂. Furthermore, the PL intensity of MoS₂/Au-60 is about twice larger than that of MoS₂/Au-100. The different enhanced excitonic PL emissions in MoS₂/Au heterostructures can be attributed to the different charge transfer effects modified by the stepped Au structure. This work may provide an insight into the excitonic PL and charge transfer effect of MoS₂ on Au film and yield novel phenomena in MoS₂/Au heterostructures for further study of PL tuning and optoelectrical properties.     

Theoretical analysis of optical force density distribution inside subwavelength-diameter optical fibers

We investigate the microscopic optical force density distributions respectively inside a subwavelength-diameter(SD)fiber with flat endface and inside one with oblique endface by using a finite-difference time-domain(FDTD) method.Optical force density distributions at the fiber endfaces can now be readily available. The complete knowledge of optical force density distributions not only reveal features regarding the microscopic near-field optomechanical interaction, but also provide straightforward explanations for the sideway deflections and other mechanical motions. Our results can provide a useful reference for better understanding the mechanical influence when light transports in a microscale or nanoscale structure and for developing future highly-sensitive optomechanical devices.     

基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像

本文结合近场扫描结构和纳米线-微光纤耦合技术,提出了一种基于硫化镉纳米线/锥形微光纤探针结构的被动近场光学扫描成像系统.该系统采用被动式纳米探针,保留了纳米探针对样品表面反射光的强约束优势.其理论收集效率为4.65‰,相比于传统的金属镀膜近场探针收集效率提高了一个数量级,可有效地提高扫描探针对样品形貌信息的检测能力;而后通过硫化镉纳米线与微光纤之间高效的倏逝场耦合,将检测的光强信号传输到远场进行光电探测,最终实现对目标样品形貌的分析成像,其样品宽度测量误差在7.28%以内.该系统不需要外部激发光路,利用显微镜自身光源进行远场照明,被动扫描探针仅作为样品表面反射光的被动收集系统.本文基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像方案,可有效地降低探针的制备难度和目标光场的检测难度,简化扫描成像的结构,为近场光学扫描显微系统之后的发展提供新的思路.