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物理学   1篇
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As a newly developed method for fabricating Josephson junctions, a focused helium ion beam has the advantage of producing reliable and reproducible junctions. We fabricated Josephson junctions with a focused helium ion beam on our 50 nm YBa2Cu3O7-δ(YBCO) thin films. We focused on the junction with irradiation doses ranging from 100 to 300 ions/nm and demonstrated that the junction barrier can be modulated by the ion dose and that within this dose range, the junct...  相似文献   
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