入射粒子与靶相互作用中电子能损的高阶修正

研究了在较高能入射离子（He离子、 12_C离子）与靶相互作用中电子能量损失的物理机制, 分别探讨了电子能量损失中的相对论修正、 壳修正、 密度修正以及Barkas效应和Bloch效应等修正的贡献, 发现壳修正、 Barkas效应修正和Bloch效应修正在能量小于100 MeV时是重要的, 而相对论修正和密度修正是在能量大于100 MeV时起作用。 加入各种修正项之后, 电子阻止本领的计算结果和实验值（ICRU49）符合更好。 The mechanisms of electronic energy loss in the process of incident particles interaction with Si and Al₂O₃ at proper energies are investigated. The contribution to the electronic energy loss from high order corrections, such as the relativistic correction, the shell correction, the density correction, the Barkas effect correction and the Bloch effect correction are discussed respectively. It is found that the shell correction, the Barkas effect correction and the Bloch effect correction are important at low energies, the relativistic correction and the density correction are important at high energies. The calculated results with these higher order corrections are in good agreement with the experiment data (ICRU49).