高质量氮化镓材料的光致发光研究

利用氨气源分子束外延（GSMBE）技术,在改型Ⅳ型分子束外延设备上生长高质量GaN单晶外延材料,并对样品进行了光致发光测量。分析室温和低温光致发光谱,系统地研究GaN的发光峰及其起源,并对常见的黄色发光带现象及其微结构起因进行探讨。     

Effect of Stress in GaN/AIInGaN Grown on GaN Templates with Different Stress States

We clarify the effect of the stress in GaN templates on the subsequent AIlnGaN deposition by simply growing 150nm AIInGaN on a 30μm GaN template （sample 1） prepared by hydride vapor phase epitaxy and a 2.3μm thin control GaN template （sample 2） prepared by metalorganic chemical vapor deposition. X-ray diffraction and secondary iron mass spectroscopy measurements reveal the stress states （tensile stress and full relaxed for samples 1 and 2, respectively） and compositions （Al0.169In0.01 Ga0.821N, Al0.171In0.006 Ga0.823N for samples 1 and 2, respectively） of AlInGaN. By carefully eliminating other possible factor, as template surface roughness, it is concluded that different stress states of AlInGaN should stem from different stress states of GaN templates.     

Survey of plasmonic gaps tuned at sub-nanometer scale in self-assembled arrays

Frontiers of Physics - Recent progress in the observation of surface-enhanced Raman scattering (SERS) is reviewed to examine the possibility of finding a novel route for the effective...     

中国半导体照明发展综述

半导体照明是21世纪初兴起的产业,也是我国第三代半导体材料成功产业化的第一个突破口,技术发展日新月异,是国际高科技领域竞争的焦点之一。目前,我国半导体照明产业已经形成了完整的产业链,功率白光LED、硅基LED和全光谱LED等核心技术同步国际,紫外LED、可见光通讯、农业光照和光医疗等创新应用走在世界前列。介绍了我国在半导体照明方面的研究进展,回顾了相关产业的发展情况,并对未来进行了展望。     

Localized deep levels in AlxGa1-xN epitaxial films with various Al compositions

By using high-temperature deep-level transient spectroscopy(HT-DLTS) and other electrical measurement techniques,localized deep levels in n-type AlxGa1-xN epitaxial films with various Al compositions(x = 0, 0.14, 0.24, 0.33, and 0.43)have been investigated. It is found that there are three distinct deep levels in AlxGa1-xN films, whose level position with respect to the conduction band increases as Al composition increases. The dominant defect level with the activation energy deeper than 1.0 eV below the conduction band closely follows the Fermi level stabilization energy, indicating that its origin may be related to the defect complex, including the anti-site defects and divacancies in AlxGa1-xN films.     

具有渐变量子垒的氮极性AlGaN基LED实现载流子调控和性能增强

为了获得高效率的AlGaN基深紫外发光二极管,提出了具有渐变量子垒的氮极性结构来调控载流子的传输.通过氮极性结构在p型电子阻挡层中形成的反向极化诱导势垒,改善空穴注入和电子泄漏问题.另外研究了不同的渐变方向和渐变程度对器件性能的影响.模拟结果显示,在12nm的AlGaN量子垒上沿着(000-1)方向从Al组分0.65线性渐变到0.6,可以有效平衡量子垒的势垒高度和斜率,从而极大的增强空穴注入,光输出功率相较于传统结构提高了53.6%.该设计为电子泄漏和空穴注入问题提供了直接而有效的解决方案,在实现更高效率的深紫外发光二极管方面显示出广阔的前景.     

Effect of Nanorod Diameters on Optical Properties of GaN-Based Dual-Color Nanorod Arrays

Dual-color(blue and green) InGaN/GaN nanorod light-emitting diodes(LEDs) with three different nanorod diameters are fabricated. Enhancement of luminescence intensity per area is observed in blue and green wells,to varying degrees. When the diameter is 40 nm, it sharply decreases, which could be explained by the sidewall nonradiative recombination. Time-resolved photoluminescence is conducted to study the carrier lifetime. High recombination rate is observed in nanorod arrays, and is an order of magnitude less than that of the planar LED.When the diameter is 40 nm, the nonradiative lifetime decreases, and this explains the decrease of intensity. The3 D-FDTD simulations show the enhancement of light extraction out of geometry structure by calculating the transmittance of the nanorod arrays.     

载流子复合机制对InGaN多量子阱蓝光LED调制带宽的影响

通过设计InGaN多量子阱LED有源区的不同结构,研究了载流子复合机制对LED调制速度的影响。结果显示,由于窄量子阱LED的载流子空间波函数重叠几率更高,且电子泄露效应更显著,所以复合速率更快,调制带宽更高。In组分为1%的InGaN量子垒LED可提高辐射复合的权重,使得调制带宽高于GaN量子垒LED;In组分为5%时,电子泄露和俄歇复合占据主导地位,且由于这两种复合机制复合速率很快,所以调制带宽显著提高。     

量子垒高度对深紫外LED调制带宽的影响

AlGaN基深紫外LED由于具有高调制带宽和小芯片尺寸,在紫外光通信领域受到越来越多的关注.本研究通过改变生长AlGaN量子垒层的Al源流量,生长了三种具有不同量子垒高度的深紫外LED,研究了量子垒高度对深紫外LED光电特性和调制特性的影响.研究发现,随着量子垒高度的增加,深紫外LED的光功率出现先增加后减小的趋势,量...     

Large-scale SiO2 photonic crystal for high efficiency GaN LEDs by nanospherical-lens lithography

Wafer-scale SiO2 photonic crystal （PhC） patterns （SiO2 air-hole PhC, SiO2-pillar PhC） on indium tin oxide （ITO） layer of GaN-based light-emitting diode （LED） are fabricated via novel nanospherical-lens lithography. Nanoscale polystyrene spheres are self-assembled into a hexagonal closed-packed monolayer array acting as convex lens for expo- sure using conventional lithography instrument. The light output power is enhanced by as great as 40.5% and 61% over those of as-grown LEDs, for SiO2-hole PhC and SiO2-pillar PhC LEDs, respectively. No degradation to LED electrical properties is found due to the fact that SiO2 PhC structures are fabricated on ITO current spreading electrode. For SiO2- pillar PhC LEDs, which have the largest light output power in all LEDs, no dry etching, which would introduce etching damage, was involved. Our method is demonstrated to be a simple, low cost, and high-yield technique for fabricating the PhC LEDs. Furthermore, the finite difference time domain simulation is also performed to further reveal the emission characteristics of LEDs with PhC structures.