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Direct Measurement of Evanescent Wave Interference with a Scanning Near-field Optical Microscope
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Evanescent wave interference is studied theoretically and experimentally. The interference patterns were directly measured with a scanning near-field optical microscope. The acquired image of the interference pattern is clear and has better contrast than that previously acquired with a photon-scanning tunnelling microscope or lasertrapped particles. The spatial period of the interference fringes is 180 nm, which agrees with the theoretical value. The results indicate that the probe of the scanning near-field optical microscope has a resolution beyond 100nm. The relation between the evanescent field intensity and the distance is also measured. When the separation between the probe and the interface is up to 18Ohm, the intensity can decrease to 1/e of the maximum. 相似文献
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密立根油滴实验测量结果的不确定度评价 总被引:2,自引:1,他引:1
介绍了具体实验教学中所采用的不确定度模式,并结合密立根油滴实验讨论了该实验的测量不确定度的评定。 相似文献
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SNOM应用于光电材料和器件的光学特性的探测和表征 总被引:2,自引:0,他引:2
介绍了近场光学及近场探测的原理 ,给出了其用于光电器件研究中的一些结果。近场光学方法具有超衍射分辩的本领和纳米局域光场探测的能力 ,适用于多种光电材料的探测与表征 ,包括 :LD、光纤波导器件、光子晶体器件等。纳米局域光场和倏逝场的探测发现了许多远场探测无法得到的结果 ,为光电器件纳米结构的研究提供了有力证据 相似文献
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