Rapid Thermal Annealing Effects on Structural and Optical Properties of Self-Assembled InAs／GaAs Quantum Dots Capped by InAIAs／InGaAs Layers

Effects of rapid thermal annealing on the optical and structural properties of self-assembled InAs/GaAs quantum dots capped by the InAlAs/InGaAs combination layers are studied by photoluminescence and transmission electron microscopy. The photoluminescence measurement shows that the photoluminescence peak of the sample after 850℃ rapid thermal annealing is blue shifted with 370meV and the excitation peak intensity increases by a factor of about 2.7 after the rapid thermal annealing, which indicates that the InAs quantum dots have experienced an abnormal transformation during the annealing. The transmission electron microscopy shows that the quantum dots disappear and a new InAlGaAs single quantum well structure forms after the rapid thermal annealing treatment. The transformation mechanism is discussed. These abnormal optical properties are attributed to the structural transformation of these quantum dots into a single quantum well.     

基于Ge2Sb1.5Bi0.5Te5可饱和吸收体的锁模光纤激光器

Ge2Sb1.5Bi0.5Te5薄膜具有宽光谱吸收和高稳定性的特点.在金镜上采用磁控溅射制备了40 nm厚的Ge2Sb1.5Bi0.5Te5薄膜,将其在150℃下退火20 min,退火后Ge2Sb1.5Bi0.5Te5由非晶态转变为晶态.测试发现晶态Ge2Sb1.5Bi0.5Te5可饱和吸收体的调制深度提高到了原来的1...     

1310 nm高功率超辐射发光二极管的制备及性能研究

为优化1310 nm超辐射发光二极管输出性能,提高器件输出功率,针对J型波导结构的1310 nm超辐射发光二极管的波导结构参数及器件散热能力进行研究.结果表明波导刻蚀深度、弯曲角度和绝缘层厚度是影响器件实现高功率输出的重要因素.基于研究结果对超辐射发光二极管器件结构及工艺进行优化,制备出脊宽5μm、弯曲角度8°、刻蚀深...