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利用低温扫描电子显微镜(LTSEM),我们对高温超导 YBaCuO 外延膜的临界电流密度J_c 和临界温度 T_c 的分布进行了观察.低温扫描电镜是目前可以观察超导薄膜中 J_c、T_c 分布情况的仪器,本文详细说明了利用 LTSEM 来观察超导薄膜 J_c、T_c 分布情况的原理,以及如何将 SEM 改装为 LTSEM.实验结果表明 YBaCuO 外延膜表面临界电流密度 J_c 和临界温度 T_c 的分布是不均匀的,但其不均匀性比多晶膜小得多,而且其分布情况与膜的表面形貌有关. 相似文献
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THE ELECTRON-BEAM IRRADIATION ON THE HIGH TEMPERATURE SUPERCONDUCTING THIN FILMS: A NUMERICAL SIMULATION OF THE LOW TEMPERATURE SCANNING ELECTRON MICROSCOPY 下载免费PDF全文
Low-temperature scanning electron microscopy (LTSEM) is a promising measuring technique for probing the spatial distribution of the superconducting properties of the high-temperature superconducting (HTS) thin films. A theoretical analysis of the electron-beam irradiation on the HTS thin films in the LTSEM has been carried out. An inhomogeneously distributed grain array model has been applied in the analysis, and some numerical sim-ulations have been carried out on the electron-beam induced voltage (EIV) signals in the LTSEM experiments. The comparisons of our numerical results with the LTSEM experi-mental data indicate that it is quite reasonable to use a two-dimensional Josephson junction array for stimulating the inhomogeneous HTS thin film sample. Our numerical results also show that the EIV signals are influenced by the electron-beam power used in the LTSEM, and a reduction of the electron-beam power is suggested in order to eliminate the errors in estimating the local values of critical temperature Tc and critical current Ic by the sample temperature and the bias current at which the first EIV signal occurs. 相似文献
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接地面由超导体或导体构成的高温超导微带线的传输特性 总被引:1,自引:0,他引:1
本在准静态近似成立的情况下,利用传输线理论和损耗唯象等效法,结合二流体模型和实验数据对高温超导微带线的传输特性进行了较全面的分析,考虑到超导薄膜膜厚的影响,分别计算了超导带来的损耗,介质损耗,接地面分别为超导薄膜和正常金属时的损耗,并着重讨论了接地面为正常金属时的各项损耗,计算结果表明在低频区域,介质损耗和接地面的损耗不能忽略,而且还是损耗的主要来源,这与普通金属微带线的特性有较大差别。从给出的 相似文献
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