Raman Spectrum of Epitaxial Graphene on SiC （0001） by Pulsed Electron Irradiation

We report new Raman features of epitaxial graphene （EG） on Si-face 4H-SiC prepared by pulsed electron irradiation （PEI）. With increasing graphene layers, frequencies of G and 2D peaks show blue-shifts and approach those of bulk highly-oriented pyrolytic graphite. It is indicated that the EG is slightly tension strained and tends to be strain-free. Meanwhile, single Lorentzian line shapes are well fitted to the 2D peaks of EG on SiC（O001） and their full widths at half maximum decrease with the increasing graphene layers, which indicates that the multilayer EG on Si-face can also contain turbostratic stacking by our PEI route instead of only AB Bernal stacking by a traditional thermal annealing method. It is worth noting that the stacking style plays an important role on the charge carrier mobility. Therefore our findings will be a candidate for growing quality graphene with high carrier mobility both on the Si- and C-terminated SiC substrate. Mechanisms behind the features are studied and discussed.     

White Emitting ZnS Nanocrystals： Synthesis and Spectrum Characterization

Spherical organic-bonded ZnS nanocrystals with 4.0 4-0.2 nm in diameter are synthesized by a liquid-solid-solution method. The photoluminescence spectrum of sample （[S^2-]/[Zn^2＋] = 1.0） shows a strong white emission with a peak at 490nm and - 170 nm full widths at half maximum. By Gauss fitting, the white emission is attributed to the overlap of a blue emission and a green-yellow emission, originating from electronic transitions from internal S^2- vacancies level to valence band and to the internal Zn^2＋ vacancy level, respectively. After sealingZnS nanocrystals onto InGaN chips, the device shows CIE coordinates of （0.29,0.30）, which indicates their potential applications for white light emitting diodes.     

宽禁带半导体碳化硅单晶生长和物性研究进展

本文介绍了最近几年在SiC单晶生长和晶片加工技术产业化进程中的系列进展。研究出SiC单晶生长的扩径技术,4英寸SiC晶体单晶直径达105 mm。晶体质量逐步提高,至2011年,大部分晶片微管密度小于1个/cm2,反映晶体结晶质量的X射线摇摆曲线半高宽小于20″;生长的导电型SiC晶体电阻率小于0.02Ω.cm,半绝缘型SiC晶体电阻率大于108Ω.cm,电阻率分布均匀性良好。研究出即开即用SiC晶片批量加工技术,晶片表面粗糙度低于0.2 nm,翘曲度和总厚度变化满足工业化批量生产要求。与此同时,在基础物性研究方面也取得了系列研究成果。首次在实验上给出了直接证据证明SiC晶体中的双空位能够诱导出磁性,并从理论上予以证明。利用多种方法在SiC衬底上成功制备出大面积、高质量、性能优异的石墨烯。     

基于图像分割的尾矿坝干滩长度监测

干滩长度是反映影响尾矿库安全稳定的重要参数之一。为了测量尾矿坝干滩的长度,提出一种基于图像分割的干滩长度监测系统。根据尾矿库地形特点通过获取尾矿库水域边界图像,在Emgu CV环境下,使用OTSU阈值分割法、轮廓识别、分水岭法等算法过滤图片中尾矿库周围的植物、水面的波纹和倒影,自动清晰地识别干滩和水面的分界水线,并对水线像素坐标点进行分析与处理,实时得出最准确的干滩水线像素坐标。创新性地只通过一次标志物标定就能得出水线坐标与干滩长度的函数,从而得到尾矿坝干滩长度。经过浙江建德铜矿尾矿坝实地测量,该方法长度误差小于2.6%。