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采用溶胶-凝胶法制备了MgxZn1-xO(x=0,0.1,0.2,0.3,0.4,0.5)纳米粉体。X射线衍射谱表明:在较高的温度(850℃以上)下退火,MgxZn1-xO纳米粉体从单一的纤锌矿结构相中分离出MgO相的掺杂浓度x约为0.13,且随着x的增加,MgO相含量呈指数型增长。室温光致发光谱显示:MgO相分离对紫外与绿光发射的相对强度有直接的影响,随着MgO相分离的出现,紫外发光峰蓝移,并随着MgO相的增加,紫外发光峰的强度受抑,绿光发光峰变强。样品的室温透过率显示:MgxZn1-xO的禁带宽度在x=0.1时达到最大值并受MgO相分离的影响而减小。 相似文献
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pH值对溶胶-凝胶法制备的掺铝氧化锌薄膜光电性能的影响 总被引:1,自引:0,他引:1
采用溶胶-凝胶法在普通载玻片上制备出c轴择优取向的ZnO: Al(ZAO)透明导电薄膜,研究了溶胶pH值对其结构、表面形貌、电学和光学性能的影响.结果表明:随着pH值的降低晶粒尺寸增大;当溶胶pH值从8.4降低到6.8时,薄膜的电阻率先降低而后略有升高,当pH值为7.2时其电阻率达到最小值2.6×10-3 Ω·cm,进一步分析表明,溶胶pH值的变化影响了薄膜晶界散射,而后者又使载流子迁移率发生了变化;薄膜的透光率在可见光部分随着pH值的降低而升高,而禁带宽度则从3.36 eV降到3.32 eV. 相似文献
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本文研究了三个不同退火温区下(低于450℃、450~700℃和高于700℃)影响Bi2Sr2CaCu2Oy单晶抗磁转变宽度的因素.发现普遍被接受的在700℃以下退火温区的分界线并不明确.ΔTc的变化强烈依赖于退火条件,即使在250℃的较低退火温度下,Tc和ΔTc也可以通过快速淬火而得到显著改善.然而在700℃以上、不同条件下退火均得到较宽的ΔTc与已有的报道是一致的,这可能是Bi2Sr2CaCu2Oy单晶的本征行为.以上结果可以用额外氧的含量和位置、阳离子迁移引起的结构调整来解释. 相似文献
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Electrical and optical properties of Sb-doped ZnO thin films synthesized by sol–gel method 下载免费PDF全文
Sb-doped ZnO thin films with different values of Sb content (from 0 to 1.1 at.%) are deposited by the sol-gel dip- coating method under different sol concentrations. The effects of Sb-doping content, sol concentration, and annealing ambient on the structural, optical, and electrical properties of ZnO films are investigated. The results of the X-ray diffraction and ultraviolet-visible spectroscopy (UV-VIS) spectrophotometer indicate that each of all the films retains the wurtzite ZnO structure and possesses a preferred orientation along the c axis, with high transmittance (〉 90%) in the visible range. The Hall effect measurements show that the vacuum annealed thin films synthesized in the sol concentration of 0.75 mol/L each have an adjustable n-type electrical conductivity by varying Sb-doping density, and the photoluminescence (PL) spectra revealed that the defect emission (around 450 nm) is predominant. However, the thin films prepared by the sol with a concentration of 0.25 mol/L, despite their poor conductivity, have priority in ultraviolet emission, and the PL peak position shows first a blue-shift and then a red-shift with the increase of the Sb doping content. 相似文献
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采用溶胶-凝胶浸渍提拉法在玻璃衬底上制备了Sn掺杂ZnO(SZO)薄膜。通过X射线衍射(XRD)和扫描电镜(SEM)研究了Sn掺杂对薄膜表面形貌和微结构的影响。XRD结果表明,所有ZnO薄膜样品都存在(002)择优取向。SEM结果表明随着掺杂浓度的增加,薄膜表面由颗粒向纳米棒转变。电学结果显示掺杂浓度为3at%时,电学性能最好,最低电阻率为6.9×10-2Ω.cm。室温光致发光谱(PL)显示所有的SZO薄膜样品在(325 nm光激发下)380 nm和398 nm两处都有发光峰,随着掺杂浓度的增大,398 nm处的发光强度先增大后减小,然后再增大;380nm处的发光强度始终增大,这些现象与薄膜的表面结构的变化有关。 相似文献
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Numerical study on the dependence of ZnO thin-film transistor characteristics on grain boundary position 下载免费PDF全文
The dependence of transistor characteristics on grain boundary(GB) position in short-channel ZnO thin film transistors(TFTs) has been investigated using two-dimensional numerical simulations.To simulate the device accurately,both tail states and deep-level states are taken into consideration.It is shown that both the transfer and output characteristics of ZnO TFTs change dramatically with varying GB position,which is different from polycrystalline Si(poly-Si) TFTs.By analysing the mechanism of the carrier transportation in the device,it is revealed that the dependence is derived from the degrees of carrier concentration descent and mobility variation with GB position. 相似文献