Metal interface formation studied by high-energy reflection energy loss spectroscopy and electron Rutherford backscattering

We demonstrate that high-energy, high-resolution reflection electron energy loss spectroscopy can provide unique insights into interface formation, especially for the case where an extended interface is formed. By changing the geometry and/or electron energy the electronic structure can be probed over a range of thicknesses (from 10s of Å to more than 1000 Å). At the same time one resolves the elastically scattered electrons into different components, corresponding to scattering of atoms with different mass (so-called ‘electron Rutherford backscattering’). Thus these high-energy REELS/elastic scattering experiments obtain information on both the electronic structure and the atomic composition of the overlayer formed.     

Extraction of cross-sections of inelastic scattering from energy spectra of reflected atomic particles

REELS spectra of the electrons reflected off niobium are measured with energy resolution <0.5 eV within the 5–40 eV energy range of the probing beam. The measurements were performed for the scattering angles θ = 45° and θ = 120° by means of two electron guns. The process of energy losses is described within the framework of a model with three different energy loss laws: surface, intermediate, and bulk layers are considered. Differential cross-sections of inelastic scattering are represented in the form of simple equations.     

The spectroscopic detection of drugs of abuse in fingerprints after development with powders and recovery with adhesive lifters

The application of powders to fingerprints has long been established as an effective and reliable method for developing latent fingerprints. Fingerprints developed in situ at a crime scene routinely undergo lifting with specialist tapes and are then stored in evidence bags to allow secure transit and also to preserve the chain of evidence. In a previous study we have shown that exogenous material within a fingerprint can be detected using Raman spectroscopy following development with powders and lifting with adhesive tapes. Other reports have detailed the use of Raman spectroscopy to the detection of drugs of abuse in latent fingerprints including cyanoacrylate-fumed fingerprints. This study involves the application of Raman spectroscopy for the analysis of drugs of abuse in latent fingerprints for fingerprints that had been treated with powders and also subsequently lifted with adhesive tapes. Samples of seized ecstasy, cocaine, ketamine and amphetamine were supplied by East Sussex Police and by the TICTAC unit at St. Georges Hospital Tooting. Contaminated fingerprints were deposited on clean glass slides. The application of aluminium or iron based powders to contaminated fingerprints did not interfere with the Raman spectra obtained for the contaminants. Contaminated fingerprints developed with powders and then lifted with lifting tapes were also examined. The combination of these two techniques did not interfere with the successful analysis. The lifting process was repeated using hinge lifters. As the hinge lifters exhibited strong Raman bands the spectroscopic analysis was more complex and an increase in the number of exposures to the detector allowed for improved clarification. Spectral subtraction was performed to remove peaks due to the hinge lifters using OMNIC software. Raman spectra of developed and lifted fingerprints recorded through evidence bags were obtained and it was found that the detection process was not compromised. Although the application of powders did not interfere with the detection process the time taken to locate the contaminant was increased due to the physical presence of more material within the fingerprint.     

Surface plasmon excitation at a Au surface by 150-40,000 eV electrons

Spectra of electrons with energies between 5 and 40 keV reflected from a homogeneous Au surface have been measured and analyzed to give the normalized distribution of energy losses in a single surface and volume excitation, as well as the total probability for excitation of surface plasmons. The resulting single scattering loss distributions compare excellently in (absolute units) with data from previous work taken at lower energies (150-3400 eV). An empirical relationship is derived for the total surface excitation probability as a function of the energy. For high energies the surface scattering zone represents only a small fraction of a typical electron trajectory and hence interference effects should be small at these energies. Since we find that both the energy dependence of the surface plasmon excitation probability and the shape of the single scattering loss distributions are the same at high and low electron energies, we conclude that there is no evidence for interference effects in the entire energy range studied.     

The role of absorption in large-angle elastic scattering

The measurements of energy loss distributions obtained in electron scattering experiments at high momentum transfer are presented for Xe, Ar and methane. The spectra show a large variety of intensity distributions, clearly different from those obtained in measurements at the dipole limit. The fraction of the intensity present in the energy loss distribution compared to the elastic peak is significant, but is in line with the reduction of the elastic cross section due to absorption. It is argued that, if similar effects are present in the condensed phase, they should be dealt with in any quantitative analysis of electron transport in matter, as is often done using Monte Carlo simulations. This argument is worked out in some detail for Reflection Electron Energy Loss Spectroscopy.     

Splitting the plasmon peak in high-energy reflection electron energy loss experiments

Elastic scattering of energetic electrons over large angles (in this study 40 keV and 120°$120°$) implies momentum and hence energy transfer from an electron to a nucleus. Due to the large mass of the nucleus (relative to the mass of an electron) this energy transfer is small, but it has recently been shown that it can be resolved in a modern spectrometer. Hence the elastic peak of an overlayer/substrate system splits into different components corresponding to atoms with different mass. Here we extend this type of experiment to the plasmon part of a reflection energy loss spectroscopy (REELS) spectrum. It is shown that, for suitable systems, the plasmon peak of an overlayer/substrate system is split by the same amount as the elastic peak. This is a consequence of the fact that detection of an electron in REELS always requires a large-angle elastic scattering event. Moreover, we show that the relative intensity of the plasmon components contains information on the depth distribution of the scatterers.     

Experimental confirmation of the EPES sampling depth paradox for overlayer/substrate systems

Elastic-peak electron spectroscopy (EPES) has been one of the main tools for obtaining the inelastic mean free path of electrons in solids. Recently it has become clear that, if this type of experiment is done using an energetic electron beam (20-40 keV) and large scattering angles, then the recoil energies of the elastic scattering event for different elements can be resolved. This recoil energy is mass dependent and this fact makes it possible to separate the elastic-peak contributions due to electrons scattered from light and heavy elements. Here we use this energy separation to determine experimentally the sampling depth for an overlayer/substrate system. The sampling depth for a (high-Z) Au overlayer on a (low-Z) C substrate is found to be about two orders of magnitude smaller than for a C overlayer on a Au substrate, whereas the inelastic mean free path of electrons in both materials differ much less. This effect is shown to be a consequence the strong Z dependence of the elastic scattering cross section. The dependence of the spectra on the electron kinetic energy and sample rotation is also dramatically different for both sample geometries.