Bulk and microprobe analysis for trace elements with synchrotron radiation

Blood serum samples were irradiated by monochromatic synchrotron radiation (15 keV) and by 2.4-MeV protons to compare their performance for the detection of trace elements by x-ray fluorescence (XRF) spectrometry. Absolute concentration assignment was based on the addition of an internal standard and on a method which uses the incoherent and coherent radiation as a flux monitor of the incoming beam. Preliminary experiments with a synchrotron XRF microprobe are reported.     

The capabilities of proton induced X-ray fluorescence in analytical chemistry

The possibility to use proton induced X-ray fluorescence in trace analysis is investigated. Sensitivities and detection limits for elements from Z=24 are determined. The influence of a NaCl matrix on these parameters is measured and some possibilities are given to use the technique in analytical practice.     

On the use of relative deceleration values for the determination of silicon by PIGE

By spiking the samples with a compound containing both a non-analyte and an analyte element, to which a relative deceleration property for 5 Me V protons has been ascribed, relative deceleration values for the samples could be obtained by measuring the prompt -yields induced in the non-analyte element. These values are used to correct for matrix effects in elemental analysis using PIGE techniques. In addition to this, the analytical results thus obtained can also be compared to those obtained by the simultaneous application of the analyte spiking technique to the collected yield data. These non-analyte spiking approaches were used to analyze silicon in polymer materials. These methods were tested by analyzing the two reference standards BCS 308 and Standard Chrome Ore XXXI. Li₂SiO₃, containing both the non-analyte as well as the analyte element, was selected as comparator and spike. Results obtained for the polymer samples were also compared to those obtained by PIXE.