Investigating microcrystalline cellulose crystallinity using Raman spectroscopy

Cellulose - Microcrystalline cellulose (MCC) is a semi-crystalline material with inherent variable crystallinity due to raw material source and variable manufacturing conditions. MCC crystallinity...     

Potentiometric evaluation of calix[4]arene anion receptors in membrane electrodes: phosphate detection

Ion-selective membrane electrodes doped with the urea- or thiourea-functionalised calix[4]arenes, 5,11,17,23-tetra-tert-butyl-25,27-bis[[4-N′-(phenylureido)butyl]oxy]-26,28-dipropoxy calix[4]arene (I) and 5,11,17,23-tetra-tert-butyl-25,27-bis[[4-(N′-phenylthioureido)-butyl]oxy]-26,28-dipropoxy calix[4]arene (II), were evaluated for anion sensing. Potentiometric results show that these calixarene ionophore-based membrane electrodes exhibit a good sensitivity to aqueous solutions of the monohydrogen orthophosphate species HPO₄²⁻ in the concentration range 5.0 × 10⁻⁵ to 1.0 × 10⁻¹ M, with near-Nernstian response slopes of −33.0 and −28.0 mV dec⁻¹ for ionophores I and II, respectively. Selectivity coefficient values for monohydrogen orthophosphate over a range of common anions were determined by the fixed interference and matched potential methods and indicated that these membrane electrodes exhibit a good selectivity for HPO₄²⁻ with respect to the other anions, including sulfate and nitrate.     

Expanded scope of heterocyclic biaryl synthesis via a palladium-catalysed thermal decarboxylative cross-coupling reaction

The palladium-catalysed decarboxylative cross-coupling of heterocyclic aromatic carboxylates and aryl halides is described. The cross-coupling proceeds under relatively mild conditions using catalytic Pd(0) and tetrabutylammonium bromide (TBAB). Utilizing a mixed solvent system consisting of N,N-dimethylformamide (DMF) and N-methyl-2-pyrrolidone (NMP), the cross-coupling system operated at temperatures ranging from 80 to 140 °C.     

The order parameter model for structural relaxation in glass

The order parameter model assumes that the state of a glass or liquid depends on T, P and a number of order parameters Z_i. Structural relaxation is due to the kinetically impeded evolution of the order parameters following a rapid change in T or P. The linear relaxation function for the evolution of property Q (V or H) in response to a change in X (T or P) is of the form φ_QX = Σ_igⁱ_QX exp(?tτ_i). Expressions are derived for the qeighting coefficients gⁱ_QX in terms of the dependences of V and H on the various order parameters. It is shown that gⁱ_VT = gⁱ_HP and that gⁱ_VTgⁱ_HP/gⁱ_VPgⁱ_HT = II, where II is the Prigogine-Defay ratio. The corresponding relations among the relaxation functions are φ_VT = φ_HP and φ_VTφ_HP/φ_VPφ_HT ? II. The predictions of the order parameter model for structural relaxation are compared with and found generally to agree with existing literature data. A number of suggestions for future investigations to test this model are made.     

Effect of thermal history on conductivity and electrical relaxation in alkali silicate glasses

Electrical conductivity σ₀ and electric field relaxation measurements have been carried out as a function of thermal history for two alkali silicate glasses, Na₂O3SiO₂ and K₂O3SiO₂. Specimens of each glass with three different thermal histories, two of the anneal-and-quench type and one of the rate-cool type, were studied. The average structural or fictive temperature T_f of each of the specimens was characterized by measuring their indices of refraction. Effects of thermal history on σ₀ and its activation enthalpy $\text{H}{}_{\mathrm{\sigma }}{}^1$ were in accord with results of previous investigators. That is, for a given type of thermal history σ₀ was lower and $\text{H}{}_{\mathrm{\sigma }}{}^1$ higher the lower T_f. In addition it was found that for two specimens with the same T_f or index of refraction but different thermal histories the rate-cooled specimen exhibited a lower conductivity than the annealed-and-quenched specimen, in accord with the results of Ritland. The distribution of relaxation times τ_σ for decay of the electric field due to ionic migration was found to be due primarily to a distribution in the pre-exponential term ln $\text{τ}{}_{\mathrm{\sigma }}{}^1$ in the equation $\text{ln}\text{τ}{}_{\mathrm{\sigma }}\text{=}\text{ln}\text{τ}{}_{\mathrm{\sigma }}{}^1\text{+ H}{}^1\text{/RT}$; the distribution in $\text{H}{}^1$ was extremely narrow. Differences in thermal history caused small differences in the distribution of τ_σ, but no difference in the average activation enthalpy $\text{〈H}{}^1\text{〉}$ for τ_σ. From this result it appeared that the dependence of the conductivity activation enthalpy $\text{H}{}_{\mathrm{\sigma }}{}^1$ on thermal history was due to the effect of thermal history on the temperature dependence of the distribution in τ_σ.     

Bulk and impurity infrared absorption in 0.5 As2Se30.5 GeSe2 glass

A study of infrared absorption in the 250–4000 cm^?1 region has been carried out for 0.5 As₂Se₃0.5 GeSe₂ glasses quantitatively doped with oxide impurity. The frequencies of the intrinsic 2- and 3-phonon absorption bands at 490 and 690 cm^?1 correspond well to those predicted from combinations of the high frequency bands in the first order IR and Raman spectra of As₂Se₃ and GeSe₂ glasses.Glasses doped with As₂O₃ exhibit the same oxide impurity absorptionbands as those doped with GeO₂. Unlike As₂Se₃ glass, at impurity concentrations up to 1000 ppm As₂O₃, 0.5 As₂Se₃0.5 GeSe₂ glass exhibits only one major oxide impurity species, characterized by absorption bands at 780 and 1260 cm^?1 and due to oxygen bonded to network Ge. The observation of a much weaker network AsO vibration band at 670 cm^?1 confirms that oxygen bonds preferentially to Ge in this glass. The same minor oxide species appears to determine excess IR absorption at the CO₂ laser wavelength of 10.6 μm in both As₂Se₃ and 0.5 As₂Se₃ 0.5 GeSe₂ glasses. The frequencies and intensities of absorption bands due to hydrogen impurities are also quite comparable for these two materials.     

Electrical relaxation from hydrated surface layers in alkali silicate glasses

Complex impedance plots for a 25 Na₂O?75 SiO₂ glass exposed to the ambient atmosphere indicate the presence of a relaxation at frequencies well below those for the electrical relaxation of the bulk material, but above the frequencies where electrode polarization takes place. This low frequency relaxation is shown to occur in a high resistivity surface layer having a thickness a few times 0.1 μm and formed by the action of atmospheric water vapor. The rate of growth of the surface layer could be monitored by means of the impedance measurements and was found to decrease with the duration of exposure of the glass to the laboratory atmosphere. Complex impedance plots for a chemically durable lithium aluminosilicate glass indicate that the hydrated surface layer thickness is much smaller than in the 25 Na₂O?75 SiO₂ glass.