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Muon electron pairs were detected in an Al multiplate spark chamber, exposed to a neutrino beam from the CERN PS. The leptons were not accompanied by other particles, except occasionally by protons. The background came mainly from muon associated π0 production, with one decay gamma lost. It was determined empirically, together with the small contribution from υ e reactions. For electron energies above 2 GeV the background is 5.7±1.5 events, whereas 18 (μe)-candidates have been observed. Hence the effect is established, with a rate of about 10?4 as compared to the muonic reactions above 3 GeV. Charm creation as the origin of this (μe)-production process is excluded; heavy neutral lepton production does not fit the kinematics observed. Instead the events are compatible with the two-body decay of an object with variable invariant mass of order 1 GeV, possibly resulting from axion interactions.  相似文献   
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[Theg-factor ratio of the first excited 3? and 5? states in40Ca was measured to beg 3/g 5=1.01(10) employing the implantation perturbed angular correlation technique. The static hyperfine fields (SF) in Fe and Gd hosts were used. In addition the lifetime of the 5? state was measured to be τ=426(7)ps. The values of the SF in Gd and Fe hosts were deduced and compared with systematics in this element region.  相似文献   
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Summary Observation of fluorescence reactions on TLC plates is a valuable additional tool within the scope of screening procedures for many toxicologically relevant substances commonly encountered in clinical- and forensic-toxicological analysis. The reactions are based on native fluorescence without any treatment and on reactions obtained with an approved derivatization procedure. Due to the enormous sensitivity of the fluorescence detection, the method is also applicable to very low concentrations and small amounts of biological materials. The procedures described in this article have proven their high pragmatic usefulness in many practical cases.Dedicated to Professor Dr. Wilhelm Fresenius on the occasion of his 80th birthday  相似文献   
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The local structure of Tm3+ ions incorporated into GaN epilayers was studied by means of Extended X-ray Absorption Fine Structure. The samples were doped either in situ during growth by Molecular Beam Epitaxy or by ion implantation of layers grown by Metal Organic Chemical Vapour Deposition. The implantation was done at ion energy of 300 keV and different nominal fluences of 3×1015, 4×1015 cm−2 and 5×1015 cm−2. The concentration of Tm in the samples studied was measured by Wavelength Dispersive X-ray analysis. For the in situ doped sample with concentration of 0.5%, and for all of the implanted samples, Tm was found on the Ga site in GaN. The ion implanted sample and an in situ doped sample with a similar concentration of Tm showed the same local structure, which suggests that the lattice site occupied by Tm does not depend on the doping method. When the average Tm concentration for in situ doped samples is increased to 1.2% and 2.0%, Tm is found to occupy the Ga substitutional site and the presence of a substantial number of Tm ions in the second coordination sphere indicates dopant clustering in the films. The formation of pure TmN clusters was found in an in situ doped sample with a dopant concentration of 3.4%.  相似文献   
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Zusammenfassung Die Bestimmung wasserlöslicher Polyelektrolyte, die bei der Synthese segmentierter Polyurethanionomerer entstehen, erfolgte durch konduktometrische und potentiometrische Titrationsverfahren nach Abtrennung des Serums durch Ultrazentrifugieren oder Ausfrieren des Polymeren bzw. Abtrennung der wasserlöslichen Elektrolyte mit einem gemischten Ionenaustauscher. Diese Elektrolyte enthielten abhängig von der Rezeptur zwischen 25 und 72% der vorgegebenen Ionenkonzentration. Unterstellt man glatte, kugelförmige Latexpartikeln, so beträgt die Fläche pro festhaftende ionische Gruppe nur 60–170 Å2, wodurch eine erhebliche gegenseitige Beeinflussung der Ionen resultiert.Herrn Prof. Dr. Ing. Dr. h.c. mult. H. Zahn zum 65. Geburtstag gewidtmet (O. L.).  相似文献   
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The subject of the investigations are precipitation zones, which grew as a result of chemical diffusion in AgPd30/CuSn6 bimetals. These precipitation zones have been characterized by metallography, electron probe microanalysis and x-ray diffraction. The growth of precipitation zones in the plating layer and in the substrate layer in dependence on time have been determined. The use of x-ray diffraction alone for the identification of the precipitates could not supply satisfying results in every case. This problem was solved by the application of electron probe microanalysis using a correction method, which allows the estimation of the chemical composition of small particles.Dedicated to Professor Dr. rer. nat. Dr. h. c. Hubertus Nickel on the occasion of his 65th birthday  相似文献   
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