基于常温无外压的转移印刷技术构筑半球状多级Ag基底

基于自组装技术制备了3种不同粒径的聚苯乙烯微球阵列,并翻制了与微球阵列互补的软模板.基于室温无外压的转移印刷技术制备了聚甲基丙烯酸甲酯半球形微纳阵列,然后基于原位光还原技术在聚甲基丙烯酸甲酯半球表面制备Ag纳米颗粒,构筑了拉曼增强的半球状多级Ag基底.转移印刷技术的关键是利用软模板自身的低表面能和表面羟基化的图案化材料与亲水基底界面间的氢键作用力.     

梁受正弦分布压力作用的解析解

对梁受正弦分布压力作用的情况，本文以矩形截面简支梁为例，通过构造满足所有边界条件和双调和方程的应力函数给出了相应的解析解，这为求解梁受任意分布压力作用的解的问题打下了基础。     

Nonlinear dynamic behavior of a clamped–clamped beam from BNC nanotube impacted by fullerene

Nonlinear Dynamics - We investigate the rational and semi-rational solutions of the integrable Kadomtsev–Petviashvili (KP)-based system, which appears in fluid mechanics, plasma physics, and...     

面缺陷对三维胶体晶体光学性质的影响

利用化学自组装方法和旋涂技术,成功地将二氧化硅(SiO2)微球体植入聚苯乙烯微球组成的蛋白石中,获得了嵌有面缺陷的三维胶体晶体.经SiO2渗透后,煅烧除去聚苯乙烯微球,获得了反相结构的光子晶体.胶体球粒直径增大时,无论晶体中有无缺陷态的存在,蛋白石及其反相结构透射谱中峰的位置发生红移,反之则产生蓝移.在胶体球粒直径一定时,对于降低折射率的缺陷,其透射谱峰中缺陷态的位置发生红移;对于增加折射率的缺陷,其透射谱峰中缺陷态的位置发生蓝移.透射谱还与缺陷层的厚度等因素有关.     

时滞依赖型中立系统的鲁棒稳定性分析

研究了一类不确定中立型系统的时滞依赖稳定性问题.利用基于LMI正定解的存在性,给出了一个新时滞依赖型稳定性判据,相比于已有文献本文具有低的保守性.最后通过数值算例验证了本文得到的结论的正确性和有效性.     

Synthesis of Janus Particle Arrays and Janus Films through an Interfacial Polymerization Method

Russian Journal of Physical Chemistry A - We report the fabrication of Janus particle arrays and Janus films through the combination of selfassembly of spheres on a water surface and interfacial...     

From planar defect in opal to planar defect in inverse opal

We demonstrate a facile method of fabricating opal and inverse opal structures with a planar defect. A single layer of silica beads was embedded into polystyrene opals by combining an inward-growing self-assembly method with spin-coating technique. After the infiltration of silica followed by the removal of the polystyrene beads by calcination, an inverted structure was obtained. The silica beads were connected together by the infiltrated silica, thus a solid silica phase with the silica beads as a planar defect embedded in the inverse silica opal was obtained. The thickness of the defect layer can be adjusted by changing the size of the silica beads. Scanning electron microscope images showed the good quality of the crystal and the uniformity of the defect layer. Optical transmission spectra indicated the existence of a defect state induced by the defect layer in both the opal and inverse opal structures. High-cost techniques such as lithography and chemical vapor deposition are not involved in the fabrication of inverse opals with planar defects.