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1.
对传统的超重、失重演示实验进行了改进,使弹簧秤的指针能静止在超重(或失重)的位置上,从而能准确地读出读数,提高演示效果. 相似文献
2.
区域经济的发展受许多不同因素的影响,本结合西藏社会经济发展的特点,选取了总产值指标、第一产业指标、第二产业指标和第三产业指标等四大类指标体系,采用灰色关联分析法对西藏的区域经济系统进行了简要的分析评价,以研究西藏区域经济的发展状况,从社会经济的角度探讨西藏经济发展落后的原因,以期能为西藏经济发展政策提供参考依据。 相似文献
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Present paper deals with the structural, magnetic and transport studies of as-deposited as well as annealed Co/GaAs(0 0 1) thin film at different temperatures. The X-ray diffraction measurements show oriented growth of as-deposited Co film in the hcp (0 0 2) direction. However, the sample annealed at higher temperatures shows formation of ternary Co2GaAs phase at the interface. Corresponding magnetic and transport measurements show decrement in magnetization and resistivity with annealing temperatures. The observed reductions in magnetization and resistivity values are mainly attributed to the formation of ternary Co2GaAs phase at the interface. 相似文献
5.
High temperature annealing effect on structural and magnetic properties of Ti/Ni multilayer (ML) up to 600 °C have been studied and reported in this paper. Ti/Ni multilayer samples having constant layer thicknesses of 50 Å each are deposited on float glass and Si(1 1 1) substrates using electron-beam evaporation technique under ultra-high vacuum (UHV) conditions at room temperatures. The micro-structural parameters and their evolution with temperature for as-deposited as well as annealed multilayer samples up to 600 °C in a step of 100 °C for 1 h are determined by using X-ray diffraction (XRD) and grazing incidence X-ray reflectivity techniques. The X-ray diffraction pattern recorded at 300 °C annealed multilayer sample shows interesting structural transformation (from crystalline to amorphous) because of the solid-state reaction (SSR) and subsequent re-crystallization at higher temperatures of annealing, particularly at ≥400 °C due to the formation of TiNi3 and Ti2Ni alloy phases. Sample quality and surface morphology are examined by using atomic force microscopy (AFM) technique for both as-deposited as well as annealed multilayer samples. In addition to this, a temperature dependent dc resistivity measurement is also used to study the structural transformation and subsequent alloy phase formation due to annealing treatment. The corresponding magnetization behavior of multilayer samples after each stage of annealing has been investigated by using Magneto-Optical Kerr Effect (MOKE) technique and results are interpreted in terms of observed micro-structural changes. 相似文献
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S K Deshpande S M Chaudhari Ashok Pimpale A S Nigavekar S B Ogale V G Bhide 《Pramana》1991,37(4):373-385
An automated linear laboratory EXAFS spectrometer of the Johansson type has been indigenously developed. Only two translational
motions are required to achieve the necessary Rowland circle configuration for the (fixed) X-ray source, the dispersing and
focusing bent crystal and the receiving slit. With the available crystals the spectral region from 5 to 25 keV can be scanned.
The linear motions of the crystal and receiving slit including the detector assembly are achieved by employing software-controlled
DC motors and utilizing optical encoders for position sensing. The appropriate rotation of the crystal is achieved by the
geometry of the instrument. There is a facility to place the sample alternately in the path of the X-ray beam and out of the
path to record both the incident X-ray intensityI
0 and the transmitted intensityI employing the scintillation detector. An arrangement with a two-window proportional detector before the sample to measureI
0 and the scintillation detector to recordI is also developed; in this case it is not necessary to oscillate the sample. Fast electronic circuits are employed to minimize
counting errors. The instrument is user-friendly and it is operated through a menu-driven IBM compatible PC. EXAFS spectra
of high resolution have been recorded using the spectrometer and employing the Si(111) reflecting planes; the X-ray source
being a Rigaku 12 kW rotating anode with Cu target. We describe the spectrometer and discuss its performance with a few representative
spectra. 相似文献
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