基于线偏振光反射率测量介质折射率的研究

研究线偏振光的振幅反射率与介质折射率的关系,提出一种测量介质材料折射率的方法。文中从菲涅耳公式出发,推导出各向同性介质的线偏振光反射率与折射率的关系式,给出基于线偏振光反射率测定介质折射率的原理。设计实验方案,在不同入射角情况,定出线偏振光p方向和s方向两种线偏振光在玻璃表面的反射率,得到线偏振光振幅反射率随入射角变化的实验曲线。依此实验数据得出材料的折射率。结果表明,测出的介质材料的折射率与理论值相符,所采取的测定方案可行。     

Real-time surface profile measurement using a feedback type of sinusoidal phase modulating interferometer

In this paper, we propose a sinusoidal phase modulating (SPM) interferometer that is insensitive to external disturbances, and its measuring principle is analyzed theoretically. In the SPM interferometer, the interference signal is detected by a high-speed image sensor based on a low-speed CCD and a signal processing circuit is used to obtain the phase of each point on the surface. Therefore, the surface profile can be measured real-time. The experiments measuring the surface profile of a wedge-shaped optical flat show that the measurement time of the SPM interferometer is less than 10 ms, the repetitive measurement accuracy is 4.2 nm. The results show that the impacts of nonlinear distortion of the piezoelectric transducer (PZT) and part external disturbance are removed.     

Eine Apparatur zur Messung natürlicher 4C-Aktivitäten

Aufbau, Arbeitsweise und Eigenschaften einer Apparatur, mit der naturliche ^l4C-Aktiviäten in Grund- und Oberflächenwässern gemessen werden können, werden beschrieben.

Die Messung erfordert 3 Arbeitsschritte: Probenahme, Synthese von Benzol, welches dann den Probenkohlenstoff enthält, und Messung der ¹⁴C-Aktivität in einem Flüssigkeitsszintillationszähler.

Die Apparatur kann zur Datierung von Wasserproben im Altersbereich zwischen 200 und 37000 a verwendet werden.     

冷原子系综中偏振关联光子对的产生和测量

我们在~(87)Rb冷原子系综中进行了关联光子对的产生和测量。通过自发拉曼散射过程,产生了一个Stokes光子和一个原子自旋波激发。利用电磁感应透明效应将存储在原子系综中的自旋波转化为一个anti-Stokes光子。在两相互正交的偏振基下,测量了Stokes光子和anti-Stokes光子之间的交叉关联函数。实验结果表明,交叉关联函数g~(2)达到~75,表现了强的非经典关联。基于现场可编程门阵列(FPGA)的自编程的多通道符合器被用于光子脉冲信号的采集和逻辑处理,大大提高了偏振关联光子对的产生和测量速度,为以后量子中继技术中的高效信息处理提供了重要基础。     

Optimum Temporal Pulse Shape of Launched Light for Optical Time Domain Reflectometry Type Sensors Using Brillouin Backscattering

We investigated numerically the relationship between the temporal shape of an optical pulse launched into an optical fiber and the power spectrum of the Brillouin backscattered light it produces. We analyzed the measurement error of the peak-power frequency of the Brillouin backscattered light power spectra obtained from the launched light with various pulse shapes. In this investigation and analysis, we characterized the pulse shape by the width, leading-trailing time, and steepness. Regardless of the launched pulse shape, the peak-power frequency-measurement error increases as the pulse width shortens. For identical launched pulse widths, a triangular pulse generates the Brillouin backscattered-light power spectrum with both the narrowest profile and the largest peak power, and consequently provides the minimum error when we measure the peak-power frequency. This shows that a temporally triangular pulse is the best for the launched light.     

The determination of material parameters of microcomponents using digital holography

Progresses in microsystem technology promise a lot of new applications in industry and research. However, the increased complexity of the microsystems demand sensitive and robust measurement techniques. Fullfield and non invasive methods are desirable to get access to spatially resolved material properties and parameters.This contribution describes a simple and fast interferometric method for the analysis of shape and deformation of small objects by optical means. These quantities together with a well defined loading of the components can be the starting point for the determination of material parameters like Poisson-ratio, Young's modulus or the thermal expansion coefficient. Holographic interferometry and multiple wavelength contouring as well as multiple source point contouring are precise enough to fulfill the requests for precision and resolution in microsystem technology even on complex shaped structures with steps or gapsA new adaptive, iterative algorithm is developed and applied to the measured results that allows the numerical evaluation of the phase data to get absolute shape and deformation information in Cartesian coordinates. Surfaces with holes, gaps and steps can be registered without any ambiguities. Digital holography as the underlying holographic recording mechanism is extremely suitable for small objects and lead to simple and compact setups in which the objects’ shape as well as their deformation behavior can be recorded. Experiments using silicon microbeams and an object from fine mechanics are described to show the great potential of these fast and robust measurement techniques with respect to the determination of material parameters.     

Entangling atoms in photonic crystals

We propose a method for entangling a system of two-level atoms in photonic crystals. The atoms are assumed to move in void regions of a photonic crystal. The interaction between the atoms is mediated either via a defect mode or via a resonant dipole-dipole interaction. We show that these interactions can produce pure entangled atomic states. We analyze the problem with parameters typical for currently existing photonic crystals and Rydberg atoms and we show that the atoms can emerge from photonic crystals in entangled states. Depending on the linear dimensions of the crystal we estimate that a pair of atoms entangled in a photonic crystal can be separated by tens of centimeters. Receive 11 June 1999 and Received in final form 4 October 1999     

次条纹积分干涉计量

叙述了次条纹积分干涉干时的原理，仅用一幅光载频干涉纹图获取全部位相信息。先用分段积分法求出条纹初始位相，再由最小二乘原理，迭代出信息的位相解。并讨论了条纹位相的算法，误差修正和测量面形的应用。     

C-V analysis of rapidly thermal annealed SF6 plasma treated AlGaN/GaN heterostructures

We studied influence of rapid thermal annealing on electrical parameters of SF₆ plasma treated AlGaN/GaN heterostructures. The main emphasis by the evaluation was laid on C-V measurement and simulation, but also I-V and SIMS measurement were used. It was found that the diminished sheet carrier concentration of a two-dimensional electron gas after plasma treatment recovered significantly at the temperature of 500 °C. By using C-V measurement, it was possible to assess besides the changes of the two-dimensional electron gas concentration after annealing also the changes in the Schottky barrier heights and to find out the doping concentration in AlGaN barrier and GaN channel layer. The trend in Schottky barrier height changes after annealing was confirmed also by I-V measurement.     

Improved method for loss measurements in planar waveguides

A method employing an isosceles prism and a right-angle one is developed for loss measurement in planar waveguides. During the measuring process, the isosceles prism is fixed and the right-angle prism fixed on the waveguide slides by following the waveguide. Only by adjusting the gap thickness we can realize the loss measurement in planar waveguides. The method is demonstrated with an Ag/Na ion-exchanged waveguide fabricated on BK7 glass from AgNO₃ melt diluted with NaNO₃ (mass ratio 1:9), with the condition of 4 h and . The experimental results show that the method has the advantages on convenient operation, accurate results and no required end polishing.