蒙脱石与碱性驱替剂反应室内实验研究

用聚四氟乙烯塑料惰性反应器在25℃条件下,以20 g/L的固液比,研究了蒙脱石与不同质量分数的NaOH和Na2CO3碱性驱替剂间的作用,反应时间为0～120 h,根据硅、铝标准曲线,对反应后液相中的硅、铝元素质量分数参数分别进行了分光光度法测定,根据反应前后碱液质量分数的变化,计算各条件下的绝对碱耗量,测定NaOH溶液驱替过程中,蒙脱石填砂管渗透率和注入压力变化。实验结果表明:蒙脱石在碱溶液溶蚀,在溶蚀反应前期溶液中硅铝离子明显增加。相同温度下,蒙脱石在NaOH溶液中比Na2CO3溶液中碱耗量高。在碱溶液驱替过程中,渗透率经过几个波动之后逐渐稳定,稳定之后下降幅度小,呈指数关系。     

基于数值模拟的CZSi单晶收尾控制参数研究

采用理论分析和有限元数值模拟相结合的方法研究了晶体收尾过程中的温度分布与热量传递.解释了"倒草帽"形收尾(收尾前段晶体直径猛然收缩)的成因,指出了改进收尾形状的方法,研究结果对于合理设定直拉硅单晶收尾工艺参数具有一定的参考意义.通过对比试验,仿真计算结果与单晶炉实验测试结果相吻合.     

The study of amorphous incubation layers during the growth of microcrystalline silicon films under different deposition conditions

<正>The structural un-uniformity of μc-Si:H films prepared using a very high frequency plasma-enhanced chemical vapour deposition method has been investigated by Raman spectroscopy,spectroscopic ellipsometer and atomic force microscopy.It was found that the formation of amorphous incubation layer was caused by the back diffusion of SiH_4 and the amorphous induction of glass surface during the initial ignition process,and growth of the incubation layer can be suppressed and uniformμc-Si:H phase is generated by the application of delayed initial SiH_4 density and silane profiling methods.     

The Role of Silicon Oxide Layers in Luminescence of Ensembles of Silicon Quantum Dots

Based on the quantum confinement-luminesecence center model,to ensembles of spherical silicon nanocrystals (nc-Si)containg two kinds of luminescence centers(LCs) in the SiOx layers surrounding the nc-Si,the relationship between the photolumincescence(PL) and the thickness of the SiOx layer is studied with the excitation energy flux density as a parameter.When there is no SiOx layer surrounding the nc-Si,the electron-heavy hole pair can only recombine inside the nc-Si,then the PL bluehift with reducing particle sizes roughly accords with the rule predicted by the quantum confinement model of Canham.When there presences a SiOx layer,some of the carriers may tunnel into it and recombine outside the nc-Si at the LCs to emit visible light.The thicker the SiOx layer is,the higher the radiative recombination rate occurred outside the nc-Si will be.When the central Scale of the nc-Si is much smaller than the critical scale,the radiative recombination rate outside the nc-Si dominates,and visible PL will be possible for some nc-Si samples with big average radius,greater than 4nm,for example.When there is only one kind of LC in the SIOx layer,the PL peak position does not shift with reducing particle sizes.All these conclusions are in accord with the experimental results.When there are two or more kinds of LCs in the SiOx layer,the PL peak position energy and intensity swing with reducing particle sizes.     

离子辐照对单晶Si中预注入B原子扩散的影响

室温下使用MeV能量级Si,F和O离子对5keV B离子预注入后的n-型单晶Si(100)进行了辐照,应用二次离子质谱仪测试分析了掺杂物B原子的分布剖面及其变化.结果表明,高剂量Si,F和O离子的附加辐照可以抑制热激活退火中B原子发生的瞬间增强扩散.在相同的辐照条件下,Si近表面区域中SiO₂层的存在更有助于限制B原子的瞬间增强扩散.结合卢瑟福沟道背散射分析和DICADA程序计算对实验结果进行了讨论.     

多孔硅-导电聚酯材料复合发光器的光学特性研究

poly-4-dicyanomethylene-4H-cyclopenta[2,1-b:3,4-b]dithiophene monolayer(PCDM)是一种导电,低导带聚酯材料。如果在多孔硅纳米结构中附上一层以自组方式生成的PCDM单分子层,就可以制成能够产生稳定电致发光的器件。发光器的结构是金／PCDM／多孔硅／硅／铝,发光器的电致发光,在白天可用肉眼观察到。有很宽的发光波长,几乎覆盖了整个可见光区域且峰值位于650nm,发光器的面积为1cm^2,启动正向电压在14－30V,电流约300mA。经长时间测试,发光器的稳定性很好,在空气中放置3个月,在输入功率不变的情况下,发光强度也不发生变化,当施以反向电压时,样品仍可以发光而且稳定性较高,在250h内I－V未发生明显变化,扫描电镜图像显示PCDM覆盖的表面要比多孔硅表面平整,而PCDM分子有可能进入到多孔硅纳米孔径当中去,起到了提高发光器稳定性和延长其寿命的作用。     

氢化非晶硅薄膜退火形成的纳米硅及其光致发光

本文报道对氢化非晶硅(a-Si:H)薄膜在600～620℃温度下快速退火10s可以形成纳米晶硅(nc-Si),其Raman散射表明,在所形成的nc-Si在薄膜中的分布是随机的,直径在1.6～15nm范围内,并且在强激光辐照下观察了nc-Si在薄膜中的结晶和生长情况.经退火所形成的nc-Si可见光辐射较弱,不能检测到它们的光致发光(PL),但用氢氟酸腐蚀钝化后则可检测到较强的红PL,并且钝化后的nc-Si在空气中暴露一定的时间后,其辐射光波长产生了蓝移.文中就表面钝化和量子限制对可见光辐射的重要性作了讨论.     

TRANSPORT PROPERTIES OF μc-Si:H FILMS PREPARED BY VERY HIGH HYDROGEN-DILUTED SILANE PLASMA

Highly hydrogen-diluted silane plasma is used to fabricate microcrystalline silicon films in a plasma-enhanced chemical vapour deposition system. X-ray diffraction and micro-Raman scattering spectroscopy are utilized to characterize their microstructure properties. Dark conductivity and drift mobility are measured by the travelling wave method. With the decreasing gas flow ratio of silane-to-hydrogen from 2% to 0.2%, the crystalline volume fraction and the drift mobility increase at room temperature. Meanwhile, the dark conductivity increases initially and then decreases. The relationship between the microstructures and transport properties is discussed.     

电磁分离降低铝硅合金中铁含量

利用电磁分离法去除铝熔体中初生富铁相,以降低合金中铁含量,并在自制电磁分离实验装置上对A-12%S-1.1F-1.2%Mn熔体进行连续电磁分离,结果表明,经过一次电磁分离使熔体中＞10um的初生富铁相全部去除,铁含量从1．13％降低到0．67％,而处理后的合金重熔凝固后仍然形成大量初生富铁相,再次进行电磁分离处理则使铁含量进一步降低到0．41％,Fe铝熔体中扩散和富铁相的凝固特性决定需要两次以上电磁分离才能有效地降低合金中铁含量,达到了铝硅合金工业生产的需要。     

Low frequency effects of surface states on 4H—SiC metal—semiconductor field effect transistor

The process-related surface state effect is investigated the fabrication of SiC devices, and a nonllnear model for 4H-SiC power metal-semiconductor field effect transistor (MESFET) is propose, which takes into account the surface related parameters. The frequency-and temperature-dependent transconductance dispersion is readily demonstrated in terms of the improved model. Simulation results show that larger dispersion and higher transition frequency occur in 4H-SiC MESFET than in GaAs MESFET. The advantage of this analytical model over the two-dimensional numerical simulation is the simplicity of calculations, therefore it is suitable for the processing improvement of SiC devices