Courants caractéristiques et analyse de SEREigen currents and RCS analysis

In this Note, we return to the theory of characteristic modes which was introduced 30 years ago for electromagnetic scattering problems. A simple mathematical framework is proposed and complete definitions are given. The potential interest of this theory in terms of Radar Cross Section (RCS) analysis is then discussed, especially in the low frequency case. Finally, a 3-D example is presented to illustrate the efficiency of this decomposition. To cite this article: Y. Morel et al., C. R. Mecanique 332 (2004).     

Analysis of Threshold Current and Wall-Plug Efficiency of Diode Lasers with Asymmetric Facet Reflectivity

Threshold current and differential quantum efficiency of broad contact lasers with asymmetric facet reflectivity are discussed with the purpose to reveal factors essential for optimisation of the wall-plug efficiency of such lasers. Lasers with low front facet reflectivity and short cavity often exhibit behaviour difficult to explain with a classical theory. More rigorous calculation performed in this work show that differential quantum efficiency is indeed less affected by a change of the front facet reflectivity or cavity length than predicted by such theory. These findings greatly simplify criteria for optimisation of the wall-plug efficiency of broad contact lasers with coated facets.     

Study on the EM Scattering of Rivets on the Plate

The electromagnetic (EM) scattering by rivets on the conducting plate is studied for the first time by using electric field integral equation (EFIE) in conjunction with the moment method. The surfaces of the rivets and the plate are partitioned into triangular cells, the current distribution on the patches is represented by sub-domain type basis function, the EFIE is translated into matrix equation by the Galerkin method, then the current coefficient is obtained. The results show the properties of radar cross section (RCS) varying with the incident angle when there are rivets on the plate.     

XRR and GISAXS study of silicon oxynitride films

Thin films of silicon oxynitride have largely replaced pure silicon oxide films as gate and tunnel oxide films in modern technology due to their superior properties in terms of efficiency as boron barrier, resistance to electrical stress and high dielectric strength. A single chamber system for plasma enhanced chemical vapor deposition was employed to deposit different films of SiO_xN_yH_z with 0.85 < x < 1.91. All films were previously characterized by Rutherford back-scattering and infrared spectroscopy to determine the stoichiometry and the presence of various bonding configurations of constituent atoms. We used X-ray reflectivity to determine the electron density profile across the depth, and we showed that the top layer is densified. Moreover, grazing incidence small-angle X-ray scattering was used to study inhomogeneities (clustering) in the films, and it is shown that plate-like inhomogeneities exist in the top and sphere-like particles at the bottom part of the film. Their shape and size depend on the stoichiometry of the films.     

反光板(合作目标)反射率测量仪

本文介绍了反光板（合作目标）反射率测量仪的研制。仪器采用对称双光路比较测量法，给定两束相等光通量的光束，分别作为参考光束和测试光束，并用分束器实现原光路取样，从而解决了合作目标反光板入射光线与反射光线重合不能用常规测试方法来检测的难题。由于采用对称双光路的方法，入射光通量是相对恒定的，不受外界因素影响，从而使反射率测量仪达到精度高、重复性好和环境要求低的设计要求。     

CO2激光外差接收的实时强度成像

利用国内的元器件建立了声光调制CO_2激光外差接收系统,并进行了实验室内静止目标的实时强度成像,成像距离3m,成像视场7°× 5°,像素128×98,4个颜色梯度显示像强度.     

Surface Modification of Fine Particles with a SnO<Subscript>2</Subscript> Film by Using a Polyhedral-Barrel Sputtering System

Fine particles were modified with a thin film of SnO₂ by using a barrel sputtering system that is a dry process. The conditions for the preparation of SnO₂ were studied by reactive sputtering onto a glass plate substrate. The optimal conditions for the preparation of tetragonal SnO₂ were identified as 60% partial oxygen pressure and 1.0 Pa total gas pressure with the substrate at room temperature. Under the optimized conditions, the surfaces of Al flake particles were modified with a thin film of SnO₂. XRD and SEM/EDS analysis of the prepared samples showed that the Al particle surfaces were uniformly modified by a thin film of SnO₂ in all cases. The film thicknesses were 80, 130, and 180 nm at RF outputs of 195, 350, and 490 W. These measured thicknesses coincided with the values estimated from the interference colors of the samples.     

Deposition and characterization of Langmuir‐Blodgett films of cadmium arachidate/SWCNTs composites

The incorporation of single‐wall carbon nanotubes (SWCNTs) in cadmium arachidate film by means of the Langmuir‐Blodgett (LB) technique was investigated as a function of arachidic acid/SWCNT mass ratio at the air/water interface and in Langmuir‐Blodgett films. The behaviour at the air/water interface shows that SWCNTs act as an independent phase with respect to the cadmium arachidate. Deposition conditions are optimized when the weight ratio between the arachidic acid (AA) and SWCNTs is in the range 0.018:1 to 1:1. The general order of the LB multilayered structure was destroyed by the progressive density increase in SWCNT quantity as evidenced by X‐ray reflectivity (XRR) analysis. Scanning electron microscopy images indicated that when a multilayered structure was formed its layers consisted of SWCNT bundles stacked one over the other. Copyright © 2006 John Wiley & Sons, Ltd.     

Mineral–water interfacial structures revealed by synchrotron X-ray scattering

Chemical reactions occurring at the mineral–water interface are controlled by an interfacial layer, nanometers thick, whose properties may deviate from those of the respective bulk mineral and water phases. The molecular-scale structure of this interfacial layer, however, is poorly constrained, and correlations between macroscopic phenomena and molecular-scale processes remain speculative. The application of high-resolution X-ray scattering techniques has begun to provide substantial new insights into the molecular-scale structure of the mineral–water interface. In this review, we describe the characteristics of synchrotron-based X-ray scattering techniques that make them uniquely powerful probes of mineral–water interfacial structures and discuss the new insights that have been derived from their application. In particular, we focus on efforts to understand the structure and distribution of interfacial water as well as their dependence on substrate properties for major mineral classes including oxides, carbonates, sulfates, phosphates, silicates, halides and chromates. We compare these X-ray scattering results with those from other structural and spectroscopic techniques and integrate these to provide a conceptual framework upon which to base an understanding of the systematic variation of mineral–water interfacial structures.     

雷达辐射源信号双谱二次特征提取方法

现有的双谱特征提取方法可以满足信号分类识别，但是出现了交叉项、平凡双谱以及特征维数过高等一些问题。针对以上问题，提出一种双谱二次特征提取方法，将双谱转化为灰度图像，以灰度值表示双谱幅度；再利用图像处理技术提取双谱二次特征，提取出能够表征辐射源信号双谱图像纹理信息的灰度共生矩阵特征集；将该特征集与Hu-不变矩特征集进行对比实验。仿真结果表明：该方法具有更好的分类识别性能，对于CW、LFM和NLFM信号的平均识别率均达90%以上。