氮化铜薄膜的结构与组成分析

采用反应直流磁控溅射的方法在室温下,在玻璃基底上成功制备了多晶氮化铜(Cu3N)薄膜.XRD显示薄膜是择优生长取向的,在低氮气分压时薄膜择优[111]晶向生长,在高氮气分压条件下薄膜的择优生长取向为[100]、[111];XPS分析表明,在低氮气分压时,薄膜主要由Cu3N和Cu组成;在高氮气分压时,薄膜主要由Cu3N组成,而Cu的含量很少.     

含纳米硅粒SiO2薄膜的光致发光

采用RF磁控溅射技术制备含纳米硅的SiO2薄膜.通过对Si-SiO2复合靶的比分进行调节控制,并在不同的温度下进行高温退火得到不同粒径的纳米硅.利用XRD对样品进行分析得出纳米硅的平均粒径;对样品测量光致发光谱,其发光峰分别位于361 nm和430 nm,比较发现光致发光的峰位随比分的改变有微小的蓝移.文中对发光机理进行初步讨论.     

含纳米硅氧化硅薄膜的光致发光特性

利用射频磁控溅射复合靶技术,通过调节复合靶的百分比制得富硅的氧化硅薄膜,并在不同的温度下退火,制得含纳米硅的氧化硅薄膜.通过Raman谱的测量,计算出800℃退火的薄膜中纳米硅晶粒的平均尺寸为5.6 nm,用X射线衍射测量同样的样品得出其粒径为6.0 nm.在室温下测量光致发光(PL)谱,探测样品的峰位为360 nm,并结合光致发光激发谱(PLE),研究相应的激发与发光中心.     

不同衬底生长ZnO薄膜的结构与发光特性研究

采用射频磁控溅射方法分别在蓝宝石(Al2O3)(0001)和硅(100)衬底上制备ZnO薄膜．通过X-光衍射测量与分析表明两者都沿C轴方向生长，在Al2O3衬底上的ZnO薄膜结晶质量优于在Si衬底上的薄膜样品．然而，由原子力显微镜观测发现在Al2O3衬底上的薄膜晶粒呈不规则形状，且有孔洞，致密性较差；而在Si衬底上的ZnO薄膜表面呈较规则的三维晶柱，致密性好．光致发光测量表明，不同衬底上生长的ZnO薄膜表现出明显不同的发光行为．     

RF磁控溅射制备TiO2薄膜及其性能讨论

用RF磁控溅射法制备了TiO2薄膜，考察了工作压强、靶与基片距离对薄膜沉积速率、均匀性的影响以及靶材料、基片及退火温度对薄膜晶体结构的影响．获得的，TiO2薄膜在很宽的温度范围(400～900℃)内保持锐钛矿型晶体结构．     

溅射法制备的ZnO薄膜的光发射

报道了用射频磁控溅射法在硅衬底上制备出具有好的(002)择优取向的多晶ZnO薄膜，在514nm处观察到显著的单色绿光发射峰；且随着氧分压的增加，绿光发射峰的强度减弱．经真空中退火该发射峰增强；而在氧气中退火该发射峰强度减弱．该发射峰强度依赖于氧分压的事实表明：514nm绿光发射峰与ZnO薄膜中的氧空位缺密切相关，认为它来自于氧空位缺陷深施主能级上的电子到价带顶上的跃迁．     

Preparation and properties of antimony thin film anode materials

Metallic antimony thin films were deposited by magnetron sputtering and electrodeposition. Electrochemical properties of the thin film as anode materials for lithium-ion batteries were investigated and compared with those of antimony powder. It was found that both magnetron sputtering and electrodeposition are easily controllable processes to deposit antimony films with flat charge/discharge potential plateaus. The electrochemical performances of antimony thin films, especially those prepared with magnetron sputtering, are better than those of antimony powder. The reversible capacities of the magnetron sputtered antimony thin film are above 400 mA h g^-1 in the first 15 cycles.     

基于银薄膜/荷叶SERS效应直接检测婴儿配方奶粉中三聚氰胺

以天然荷叶为衬底,结合真空磁控溅射法沉积银薄膜,制备出了一种高效的表面增强拉曼散射(SERS)活性基底.研究发现银/荷叶基底对婴儿配方奶粉中掺杂的三聚氰胺(MA)表现出良好的识别能力,而不需作额外的样品预处理.对掺杂不同浓度三聚氰胺的奶粉溶液进行定量分析,在5~50 mg/L质量浓度范围内获得了较好的线性关系(线性相关系数R20.99).根据3σ准则,检测极限估计为1 mg/L.此外,银/荷叶基底具有良好的均匀性和重复性(相对标准偏差为7.64%和10.54%).该方法对婴儿配方奶粉中三聚氰胺的检测具有简单快速、成本低且无损等优点.     

Observation of defect clustering in Gd-doped calcium fluoride

Abstract

Solid solutions Ca_1-xGd_xF_2+x for 3 × 10^?7≤ x ≤10^?1 have been studied by electron paramagnetic resonance (EPR) and ionic thermal currents (ITC). The EPR experiments show the presence of two single-ion sites a cubic and a tetragonal Gd³⁺ center which co-exist with comparable abundances for intermediate impurity concentrations. The cubic center predominates at very low and high concentrations. Seven different relaxation processes have been identified from the ITC spectra and the variation of their intensity vs. x was measured. The absolute concentrations of the cubic and nn Gd³⁺ dipoles were calculated. The scavenging of interstitial fluorines by the neutral clusters explains both the abundance of cubic sites at high concentration and the variety of orientable clusters detected by ITC.     

Thermalization of the flow of sputtered target atoms during ion-plasma deposition of films

The boundary of the zone in which sputtered atoms are thermalized in the substrate–target drift space during the ion-plasma magnetron deposition of films is determined theoretically and experimentally. A comparison of the thicknesses of films deposited on the front and back sides of substrates situated at different distances from the target makes it possible to divide the flow of atoms sputtered toward substrates into direct and diffusion flows and to determine the dimensions of the spatial zone in which sputtered atoms are thermalized. The experimental data are in quantitative agreement with the results of a statistical simulation of the thermalization process of atomic particles during the ion-plasma deposition. This simulation enables optimization of the technology of defect-free growth of films with uniform thickness on substrates with complex 3D configuration.