大台井"川法"密集柱支撑力分析

从单体液压支柱的特性出发，结合大台井实际的煤层和顶板条件，计算了俯伪斜走向分段密集采煤法密集柱的支撑力。影响密集柱支撑力的相关参数主要有煤层厚度与倾角、采深、控顶距等。密集柱支撑力的大小随煤层厚度增加而增大，顶板压力主要由密集柱承担；随煤层倾角的增大而减小；随采深增加而线性增大，深部开采时应考虑适当增加支护强度；随控顶距增大而增加，但增加幅度较小。所得到的结论为大台井“川法”采煤的实施提供了理论依据。     

桥式起重机水平刚架结构的设计计算

为桥式起重机金属结构设计中,全面、准确地考虑水平载荷的影响,本文介绍了桥式起重机在惯性力、风力、偏斜侧向力作用下,水平刚架结构的计算简图和准确、简单的内力计算式。方便了设计,提高了计算精度,可供设计选用。     

存在滑移时两圆球间的幂律流体挤压流动

基于Reynolds润滑理论分析了壁面滑移对任意圆球颗粒间幂律流体的挤压流动的影响。研究表明有壁面滑移时挤压流动的粘性力可通过引进本文定义的滑移修正系数分离出无滑移解。推导出的挤压力滑移修正系数是一积分表达式，依赖于滑移参数、幂律指数、球间隙和积分上限。一般地壁面滑移导致粘性力减小，粘性力的减小量随幂律指数的增大而增大，表明壁面滑移对剪切增稠流变材料有更大的影响；粘性力的减小量还随着滑移参数的增大而增加，而这恰与假设相符合；粘性力的减小量又随球间隙减小或积分上限的增大（从液桥情况到完全浸渍）而减小直到趋于常数，这一特性在离散元模拟时可以有效地减少计算量。     

Morphological and chemical study of the initial growth of CdS thin films deposited using an ammonia-free chemical process

We study the initial growth stages of CdS thin films deposited by an ammonia-free chemical bath deposition process. This ammonia-free process is more environmentally benign because it reduces potential ammonia release to the environment due to its high volatility. Instead of ammonia, sodium citrate was used as the complexing agent. We used atomic force microscopy (AFM), Rutherford backscattering (RBS) and X-ray photoelectron spectroscopy (XPS) to investigate the morphological and chemical modifications at the substrate surface during the first initial stages of the CdS deposition process. Additionally, X-ray diffraction (XRD) and optical transmission spectroscopy measurements were carried out to compliment the study. XPS results show that the first nucleation centers are composed by Cd(OH)₂ which agglomerate in patterns of bands, as demonstrated by AFM results. It is also observed that the conversion to CdS (by anionic exchange) of the first nucleus begins before the substrate surface is completely covered by a homogenous film.     

原子力显微术轻敲模式中探针样品接触过程及相位衬度研究

借助简单的有阻尼受迫振子模型，研究了原子力显微术轻敲模式中探针与样品接触时间t_c、样品的表面形变D_z和相位衬度对探针设置高度z_c及样品杨氏模量E_s的依赖关系.结果发现,t_c与D_z均随E_s及z_c的增大而减小，同时探针与样品作用过程伴随很小的能量耗散.对轻敲过程中相移量φ的研究表明，E_s较大的样品有较小的φ，且φ随 关键词： 原子力显微术 轻敲模式 相位衬度     

Atomic scale properties of interior interfaces of semiconductor heterostructures as determined by quasi-digital highly selective etching and atomic force microscopy

We report on first experiments combining quasi-digital highly selective etching and atomic force microscopy (AFM) to examine the interior interfaces of semiconductor heterostructures. Lattice matched (GaIn)As/InP heterostructures grown by metalorganic vapour-phase epitaxy (MOVPE) are taken as a model system to check the capabilities of this new method. Standard selective etchants for different material systems have been optimized in selectivity and etch rate to achieve a quasi-digital etching behaviour. In this way, the real structure of interior interfaces can be determined by AFM. We find a significant difference between the surface of the heterostructure and the interior interfaces.     

手摇套料钻的理论分析及改进意见

本文揭示了从日本引进的手摇套料钴的工作进给原理为一差动螺旋传动,阐明了它的使用方法,详细分析了它的齿轮传动、螺纹传动、刀具结构及几何角度,并提出了相应的改进意见。     

类氢及碱金属原子激发态寿命的半经典计算公式

根据对应原理,得到了类氢原子能态平均寿命半经典的计算公式τ(n,l),然后利用相对论单通道量子数亏损理论进行推广,得到用来计算考虑总角动量J的激发态寿命公式τ(n,l,l+1/2)和τ(n,l,l-1/2),利用单通道量子数亏损理论得到了碱金属原子n、l远大于1时激发态寿命的半经典公式τ(n.l)=τ0(m+M/nm/v/+M)2v7l(l+1/2)/n4,其计算结果和实验数据符合的很好.     

对扩散运动中粒子动能平均值发散问题的讨论

从扩散运动的不规则力出发 ,指出了泰勒理论导致扩散运动中粒子动能平均值发散的根源 ,从而提出了解决此问题的一种新的理论模型—即粒子碰撞前速度与碰撞中速度的变化量不应是完全独立的概率变量 .     

Simultaneous imaging of the structure and fluorescence of a supramolecular nanostructure formed by the coupling of π‐conjugated polymer chains in the intermolecular interaction

We fabricated a micrometer‐long supramolecular chain in which π‐conjugated polyrotaxane was coupled. A new experimental setup was designed and constructed, and the simultaneous direct imaging of the structure and fluorescent function was achieved. Furthermore, we identified the formation of a polymer intertwined network and observed novel fluorescence due to a long‐range interaction via this intertwined network over a distance of 5 μm or more without quenching over 15 min in the near field. © 2005 Wiley Periodicals, Inc. J Polym Sci Part A: Polym Chem 44: 801–809, 2006