Insulator–metal transition in Mn-doped NaNbO3 induced by chemical and thermal treatment

The transition between insulator and metal conductor states, induced by oxygen non-stoichiometry, was studied for NaNbO₃ : Mn crystals. Conditions for an optimal reduction were determined on the basis of TGA tests. The temperature dependencies of the resistance measured on the macroscale showed that the transition from thermally activated to metallic features depends on the level of oxygen deficiency. The LC-AFM measurement exhibited non-homogeneous electric resistance on the nanoscale. We ascribed the local insulator–metal transition to changeover in the electronic state of the Nb ions occurring in filaments. The Mn dopant stabilised the induced oxygen non-stoichiometry and the metallic conduction down to room temperature.     

Quasi in situ Ni K‐edge EXAFS investigation of the spent NiMo catalyst from ultra‐deep hydrodesulfurization of gas oil in a commercial plant

Ni species on the spent NiMo catalyst from ultra‐deep hydrodesulfurization of gas oil in a commercial plant were studied by Ni K‐edge EXAFS and TEM measurement without contact of the catalysts with air. The Ni–Mo coordination shell related to the Ni–Mo–S phase was observed in the spent catalyst by quasi in situ Ni K‐edge EXAFS measurement with a newly constructed high‐pressure chamber. The coordination number of this shell was almost identical to that obtained by in situ Ni K‐edge EXAFS measurement of the fresh catalyst sulfided at 1.1 MPa. On the other hand, large agglomerates of Ni₃S₂ were observed only in the spent catalyst by quasi in situ TEM/EDX measurement. MoS₂‐like slabs were sintered slightly on the spent catalyst, where they were destacked to form monolayer slabs. These results suggest that the Ni–Mo–S phase is preserved on the spent catalyst and Ni₃S₂ agglomerates are formed by sintering of Ni₃S₂ species originally present on the fresh catalyst.     

光纤水听器相位生成载波解调非线性因素的抑制方法

为了消除非线性因素对相位生成载波解调结果的干扰,降低相位生成载波解调过程中低通滤波器的频响特性对相位生成载波解调结果的影响,该文提出了一种基于扩展卡尔曼滤波椭圆参数估计的相位生成载波微分交叉相乘解调方法。该方法在综合考虑各种非线性因素对相位生成载波微分交叉相乘解调结果的影响的基础上,对传统的相位生成载波微分交叉相乘解调过程进行了改进。经过计算机仿真和实验验证,该文所提出的扩展卡尔曼滤波微分交叉相乘方法能够有效地抑制非线性因素对相位生成载波解调结果的干扰,相比传统的相位生成载波微分交叉相乘方法,其信噪比提高了35.0 d B,总谐波失真降低了30.7 dB,信噪谐波比提高了31.0 dB,且扩展卡尔曼滤波微分交叉相乘方法受解调过程中低通滤波器频响特性的影响较小。     

广义扩展有限元法及其在裂纹扩展分析中的应用

结合广义有限元法(GFEM)和扩展有限元法(XFEM)的特点,提出了一种新的数值方法——广义扩展有限元法(GXFEM)。阐述了广义扩展有限元法的基本原理,对相关公式进行推导,探讨数值实施中需注意的重要问题,给出利用广义扩展有限元法进行断裂分析时应力强度因子的计算方法,编写了广义扩展有限元法程序。通过算例进行了应力强度因子的计算,模拟了结构裂纹的扩展过程。算例结果表明,利用广义扩展有限元法计算裂纹扩展问题,不需要进行过密的网格划分,且网格在裂纹扩展后无需重新剖分,具有相当高的计算精度。     

为实现准等熵压缩的波阻抗梯度飞片的实验研究

采用粉末冶金方法,制备出波阻抗沿厚度方向呈特定分布的WMoTi体系梯度飞片,在二级轻气炮上进行了梯度飞片击靶实验的初步研究.结果表明,利用梯度飞片可以实现对靶样品的准等熵压缩,击靶后产生的波阵面是平缓、连续上升的,明显不同于冲击压缩的陡峭波阵面,靶面压力峰值最高达到了167GPa.波阻抗按二次函数分布的梯度飞片能够获得最佳的击靶波形 关键词： 波阻抗梯度飞片 准等熵压缩     

具有突变率的广义生-灭过程的遍历性

给出具有突变率的广义生-灭过程的遍历与指数遍历的充分必要条件，以及强遍历的充分条件。     

太阳黑子数与电离层TEC的相关性分析

为了研究电离层TEC与太阳黑子数在短周期上的相关关系,采用1997～2004年的太阳黑子数资料与同期厦门站的电离层TEC数据,利用小波功率谱分析的方法提取3个尺度的短周期,并利用小波相干谱的方法重点研究了两者在278 d周期上的相关性。研究表明：太阳黑子数和电离层TEC主要存在准27 d、准半年周期以及年周期等短周期,而且电离层TEC和太阳黑子在准27 d周期上有良好的相关性。位相计算表明,电离层TEC的变化滞后于太阳黑子数2～3 d。厦门地区TEC与太阳活动的相关性在夏季比其他季节更强,这对提高该地区电离层TEC预报精度有很大意义。     

Selective etching of ZnTe in HF:H2O2:H2O solution: Interpretation of extended defect‐related etch figures

HF:H₂O₂:H₂O solution (40%wt.HF: 30wt.%H₂O₂: H₂O, 3:2:1 by volume) was used to reveal extended defects (line, face and volume defects) in bulk ZnTe crystals grown from Te solution. The etch patterns were analyzed based on their size, shape and distribution. The etch figures, both in the shape of pits and hillocks with high resolution, show forms controlled by the symmetries of the respective faces were produced. Two different sizes of pits were observed, the larger‐size pits correspond to dislocations penetrating the surface, however, the smaller‐size texture pits are produced on the defect‐free region, which serve as standard pits on respect faces. The face defects, such as grain boundaries, sub‐grain boundaries, dislocation walls, twins and stacking faults, can be all displayed clearly. Another essential feature of the etchant is that, it can effectively dissolve Te‐rich phase (Te inclusion/precipitates), which makes it promising to reveal the shape of this volume defect.     

The Use of Constituent Spectra and Weighting in Extended Multiplicative Signal Correction in Infrared Spectroscopy

Extended multiplicative signal correction (EMSC) is a widely used preprocessing technique in infrared spectroscopy. EMSC is a model-based method favored for its flexibility and versatility. The model can be extended by adding constituent spectra to explicitly model-known analytes or interferents. This paper addresses the use of constituent spectra and demonstrates common pitfalls. It clarifies the difference between analyte and interferent spectra, and the importance of orthogonality between model spectra. Different normalization approaches are discussed, and the importance of weighting in the EMSC is demonstrated. The paper illustrates how constituent analyte spectra can be estimated, and how they can be used to extract additional information from spectral features. It is shown that the EMSC parameters can be used in both regression tasks and segmentation tasks.     

Monitoring of the process of formation of epitaxial films with the use of ultrasoft x-ray spectroscopy

The distinctive features of the atomic and electronic structure of thin surface layers of substances in the process of formation of epitaxial silicon films on silicon are studied using the procedures of reflection and scattering of ultrasoft x-ray radiation. The angular distribution of the scattered x-ray radiation (the scattering indicatrices) and the near fine structure of SiL_2,3 spectra of reflection are investigated. The assumption of the sensitivity of the observed peak of anomalous scattering (the Yoneda peak) of x-ray radiation to the presence, in the surface regions of the materials, of extended double-boundary defects, the defects of packing, grain boundaries, dislocations, etc. is made. It is shown that the experimental procedure used makes it possible to obtain information on the surface layers of substances. Translated from Zhurnal Priklaldnoi Spektroskopii, Vol. 67, No. 4, pp. 496–498, July–August, 2000.