一类拟线性神经传播方程的紧LOD差分格式

通过引入变量将方程从形式上降阶,提出了求解一类拟线性神经传播方程的紧局部一维（LOD）差分格式,并应用能量方法给出了格式的误差估计,得到该格式在L^2模下具有O（Δt^2＋h^4）的精度．最后通过数值例子验证了算法的有效性．     

双连梁短肢剪力墙结构非线性随机演化分析

在混凝土随机损伤力学研究的基本框架内,基于混凝土弹塑性损伤本构模型和概率密度演化理论,从荷载位移曲线、混凝土和钢筋应变、混凝土损伤和截面内力几个方面对双连梁短肢剪力墙结构进行了分析.分别通过样本轨道、系综数值特征和概率密度三种方式描述了结构非线性随机演化力学行为.研究表明,在结构不同层次的反应中,出现了概率密度曲面"多脊"和"多峰"的复杂演化现象,混凝土非线性与随机性耦合使得结构不同层次的反应变得复杂多样.研究同时发现,在结构受力行为演化过程中,随机性与确定性之间可以互相转化.     

复杂构造条件下回采巷道稳定性研究

在现场监测的基础上,针对金源煤矿复杂构造条件下回采巷道稳定性问题进行研究。监测获得回采巷道受断层影响的变形与破坏规律,探讨了断层因素对巷道稳定性的影响,通过理论计算掘进及回采期间支架受力,分析得出回采期间巷道支架上的载荷是巷道掘进期间的6倍左右,巷遭处于极不稳定状态,提出了调整巷道布置方案的安全措施。     

基于Lade-Duncan强度准则的统计损伤本构模型及其修正研究

在损伤力学理论基础上,根据Lemaitre应变等价性理论,并假定岩石微元强度服从Weibull随机分布,在微元强度度量方法上考虑损伤阀值的影响,结合Lade-Duncan强度破坏准则,建立了统计损伤本构模型。通过岩石三轴应力-应变试验曲线对模型进行验证,拟合效果良好;并针对模型不能反映残余应力阶段特征的不足进行修正。用公式法代替比较法求取损伤修正参数,建立了更加完善的统计损伤本构模型。通过与未修正模型对比发现,修正后的统计损伤模型能更好的模拟岩石破坏全过程的应力应变关系并能表征岩石残余强度特征,从而验证了该模型的合理性和可行性。     

围压状态下的混凝土本构模型

利用已有不同围压下的混凝土三向压缩试验, 分析研究不同围压条件对混凝土强度和应力-应变关系的影响。试验表明, 把混凝土简单视为脆性材料的观点并不符合实际情况, 塑性特征也是混凝土材料主要力学特征。由热力学定律出发, 本文提出了多次方形式的屈服函数和与围压状态相关联的损伤标准化函数, 提出了考虑围压状态的混凝土本构模型。试验结果与数值计算比较表明, 该本构关系可以很好地描述混凝土在不同围压状态下的力学损伤发展和脆-塑性转换力学特征, 也可以描述拉伸作用下的应力-应变关系, 具有一定的普遍意义。     

A two-scale time-dependent damage model based on non-planar growth of micro-cracks

This paper presents the theoretical developments and the numerical applications of a time-dependent damage law. This law is deduced from considerations at the micro-scale where non-planar growth of micro-cracks, following a subcritical propagation criterion, is assumed. The orientation of the crack growth is governed by the maximum energy release rate at the crack tips and the introduction of an equivalent straight crack. The passage from micro-scale to macro-scale is done through an asymptotic homogenization approach. The model is built in two steps. First, the effective coefficients are calculated at the micro-scale in finite periodical cells, with respect to the micro-cracks length and their orientation. Then, a subcritical damage law is developed in order to establish the evolution of damage. This damage law is obtained as a differential equation depending on the microscopic stress intensity factors, which are a priori calculated for different crack lengths and orientations. The developed model enables to reproduce not only the classical short-term stress-strain response of materials (in tension and compression) but also the long-term behavior encountering relaxation and creep effects. Numerical simulations show the ability of the developed model to reproduce this time-dependent damage response of materials.     

A phase field model of electromechanical fracture

Structural reliability analyses of piezoelectric solids need the modeling of failure under coupled electromechanical actions. However, the numerical simulation of failure due to fracture based on sharp crack discontinuities may suffer in situations with complex crack topologies. This can be overcome by a diffusive crack modeling based on the introduction of a crack phase field. In this work, we develop a framework of diffusive fracture in piezoelectric solids. We start our investigation with the definition of a crack surface functional of the phase field that Γ-converges for vanishing length-scale parameter to a sharp crack topology. This functional provides the basis for the definition of suitable dissipation functions which govern the evolution of the crack phase field. Based on experimental results available in the literature, we suggest a non-associative dissipative framework where the fracture phase field is driven by the mechanical part of the coupled electromechanical driving force. This accounts for a hierarchical view that considers (i) the decrease of stiffness due to mechanical rupture as the primary action that is followed by (ii) the decrease of electric permittivity due to the generated free space. The proposed definition of mechanical and electrical parts of the fracture driving force follows in a natural format from a kinematic assumption, that decomposes the total strains and the total electric field into energy-enthalpy-producing parts and fracture parts, respectively. Such an approach allows the insertion of well-known anisotropic piezoelectric storage functions without change. We end up with a three-field-problem that couples the displacement with the electric potential and the fracture phase field. The latter is governed by a micro-balance equation, which appears in a very transparent form in terms of a history field containing a maximum fracture source obtained in the time history of the electromechanical process. This representation allows the construction of a very robust algorithmic treatment based on a operator split scheme, which successively updates in a typical time step the history field, the crack phase field and finally the two piezoelectric fields. The proposed model is considered to be the canonically simple scheme for the simulation of diffusive electromechanical crack propagation in solids. We demonstrate its modeling capacity by means of representative numerical examples.     

结构损伤的非概率区间识别方法

基于结构时域加速度响应,利用区间分析方法对具有外界激励和测量数据不确定性的结构系统进行损伤识别.不确定性量被处理为有界区间数,基于参考有限元模型和被测加速度响应,经过提出的两步模型参数的区间修正方法分别得到了未损伤和损伤结构区间模型,进而通过定义的PoDE(Possibility of Damage Existence)确定了结构各单元的损伤可能性.最后以十杆平面桁架系统为例,对区间方法与概率方法的损伤识别结果进行对比,讨论了损伤程度和不确定度对识别结果的影响,结果表明了本文方法的可行性与有效性.     

塑性损伤本构模型的自由能势函数研究

自由能势函数是不可逆热力学量及其共轭量的标量泛函,是广义标准材料模型的重要组成.论文根据损伤状态、过程、作用和伪势的定义和定理,分析了损伤耗散势的数学和物理含义,探讨了损伤耗散势的理论基础和描述耗散势的一般理论方法.研究了耗散势、损伤作用和自由能势函数的相互关系,给出了满足上述基本原理的自由能表达式,基于增量最小原理的变分形式得到了损伤理论基本方程的数值离散方程,实验模拟验证了该文理论和数值方法的正确性和有效性.     

Study on the drain bias effect on negative bias temperature instability degradation of an ultra-short p-channel metal-oxide-semiconductor field-effect transistor

This paper studies the effect of drain bias on ultra-short p-channel metal-oxide-semiconductor field-effect transistor (PMOSFET) degradation during negative bias temperature (NBT) stress. When a relatively large gate voltage is applied, the degradation magnitude is much more than the drain voltage which is the same as the gate voltage supplied, and the time exponent gets larger than that of the NBT instability (NBTI). With decreasing drain voltage, the degradation magnitude and the time exponent all get smaller. At some values of the drain voltage, the degradation magnitude is even smaller than that of NBTI, and when the drain voltage gets small enough, the exhibition of degradation becomes very similar to the NBTI degradation. When a relatively large drain voltage is applied, with decreasing gate voltage, the degradation magnitude gets smaller. However, the time exponent becomes larger. With the help of electric field simulation, this paper concludes that the degradation magnitude is determined by the vertical electric field of the oxide, the amount of hot holes generated by the strong channel lateral electric field at the gate/drain overlap region, and the time exponent is mainly controlled by localized damage caused by the lateral electric field of the oxide in the gate/drain overlap region where hot carriers are produced.