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1.
The influence of surface structure of technical materials on results and statements of surface analytical methods has been investigated. Especially surface roughness as a typical property of rolled products has been observed. For this purpose samples of steel (technical surface, roughness up to 5 m) and silicon wafers (polished surface) have been analyzed by SNMS and GDOS in order to get information about changes of the surface roughness as function of the sputtering time and their influence on the statements about the depth profiles obtained. 相似文献
2.
马堍恭 《山东大学学报(理学版)》2012,47(9):121-126
为了探讨空间分数阶随机生长模型的动力学标度行为,利用Grümwald-Letnikov分数阶导数定义方法求解空间分数阶Edwards-Wilkinson(SFEW)方程在1+1维情况下的数值解,得到了在不同分数阶导数值时的生长指数、粗糙度指数、动力学指数和局域粗糙度指数,这些结果与标度分析得到的结果是一致的。研究结果表明SFEW模型没有出现奇异动力学行为,仍然遵守Family-Vicsek正常标度规律。同时结果也显示,非局域相互作用对SFEW方程的动力学标度行为有着显著的影响。 相似文献
3.
Hexagonal-pillar shaped pure Fe single crystal whiskers with six {1 1 0} side planes were obtained by means of chemical vapor deposition. Atomically resolved scanning tunneling microscopy images obtained on the {1 1 0} surface showed a quasi-hexagonal atomic array with mesoscopic-range periodic height modulation of about 1/3 of an atomic step. This height modulation was found to be a result of an interference between the quasi-hexagonal top-layer and the sub-surface bcc-Fe{1 1 0} layer. Unit vectors of the mesoscopic-range modulation turned out to be expressed as , where and are the primitive vectors of the two-dimensional atomic array in the top-layer and those in the sub-surface layer, respectively. The two-dimensional density of atoms in the top-layer is slightly higher by 0.46% than that in the sub-surface layer. 相似文献
4.
热敏电阻温度计的设计与制作 总被引:2,自引:0,他引:2
本文介绍了设计性实验“热敏电阻的设计与制作”的实施情况。说明了只要选题合适、要求恰当,设计性实验不仅可行,而且对物理实验训练的总结提高十分有效。 相似文献
5.
Shan-Shan ShaoFu-Zhen Xuan Zhengdong WangShan-Tung Tu 《Applied Surface Science》2011,257(23):9915-9920
The closed-form solutions of bending curvature and stress distribution in film/substrate system with the synthesis surface effect are proposed by minimizing the total potential energy. Effects of the roughness and the residual surface stress on stress in film are addressed. Results reveal that, at a given thickness of the substrate, effects of roughness and residual surface stress on the bending curvature become significant with decreasing the film thickness. The roughing surface will enlarge the magnitudes of bending curvature and film stress. The direction change of residual surface stresses can lead to a reversed bending of film/substrate system. 相似文献
6.
J.F. Zhu 《Surface science》2005,574(1):34-42
The adsorption of Pb onto a NiAl(1 1 0) single crystal surface at 300 K has been studied by Auger electron spectroscopy (AES), Low energy electron diffraction (LEED), molecular beam/surface scattering and single crystal adsorption calorimetry (SCAC). AES indicates a Stranski-Krastanov growth mode, i.e., Pb initially grows on NiAl(1 1 0) two-dimensionally until the first layer completes at 0.89 ML, where a superstructure is observed by LEED, followed by 3D islanding. Measurements of the Pb gas that does not stick indicate that Pb sticks on NiAl(1 1 0) with an initial probability of 0.99. The initial heat of adsorption of Pb on NiAl(1 1 0) is 249 ± 10 kJ/mol. Due to the repulsive interactions between Pb adatoms, the heat of adsorption decreases within the first layer to a value identical to the heat of sublimation of bulk Pb (195 kJ/mol), where it remains at higher coverages. This first application of adsorption calorimetry on such a thick sample (75 μm versus 0.2-8 μm previously) demonstrates that adsorption calorimetry can be extended to a wider range of surfaces, since this thickness can be achieved with nearly any single crystal material by simple mechanical thinning. 相似文献
7.
Hasan B.?Uzun Kenneth S.?AlexanderEmail author 《Probability Theory and Related Fields》2003,127(1):62-88
We consider boundary roughness for the ``droplet' created when supercritical two-dimensional Bernoulli percolation is conditioned to have an open dual circuit surrounding the origin and enclosing an area at least l2, for large l. The maximum local roughness is the maximum inward deviation of the droplet boundary from the boundary of its own convex hull; we show that for large l this maximum is at least of order l1/3(logl)–2/3. This complements the upper bound of order l1/3(logl)–2/3 proved in [Al3] for the average local roughness. The exponent 1/3 on l here is in keeping with predictions from the physics literature for interfaces in two dimensions.
The research of the first author was supported by NSF grant DMS-9802368. The research of the second author was supported by NSF grants DMS-9802368 and DMS-0103790.Mathematics Subject Classification (2000): Primary 60K35; Secondary 82B20, 82B43 相似文献
8.
9.
Based on the results of scanning tunneling microscopy studies of the reconstructed Si(5 5 12)-2 × 1 surface, its atomic structure has been found. It turns out that Si(5 5 12)-2 × 1 consists of four one-dimensional structures: honeycomb (H) chain, π-bonded H′ (π) chain, dimer-adatom (D/A) row, and tetramer (T) row. Its period is composed of three subunits, i.e., (i) (3 3 7) unit with a D/A row [D(3 3 7)], (ii) (3 3 7) unit with a T row [T(3 3 7)], and (iii) (2 2 5) unit with both a D/A and a T row. Two kinds of adjacent subunits, T(3 3 7)/D(3 3 7) and D(3 3 7)/(2 2 5), are divided by H chains with 2× periodicity due to buckling, while one kind of adjacent subunits, T(3 3 7)/(2 2 5), is divided by a π chain with 1× periodicity. Two chain structures, H and π chains, commute with each other depending upon the external stresses perpendicular to the chain, which is the same for two row structures, D/A and T rows. It can be concluded that the wide and planar reconstruction of Si(5 5 12)-2 × 1 is originates from the stress balance among two commutable chains and two commutable rows. 相似文献
10.
We present electron microscope (FEI NanoSEM) and atomic force microscopy measurements of surface roughness in nanochannels in photonic crystal fibers (PCF). A method was invented to cleave the PCF along the axis without damaging the surface structure in the nanochannels allowing us to characterize the morphology of the nanochannels in the PCF. A multi-wall carbon nanotube mounted onto commercial AFM probes and super sharp silicon non-contact mode AFM probes were used to characterize the wall roughness in the nanochannels. The roughness is shown to have a Gaussian distribution, and has an amplitude smaller than 0.5 nm. The height–height correlation function is an exponential correlation function with an autocorrelation length of 13 nm, and 27 nm corresponding with scan sizes of 200×100 nm2, and 1600×200 nm2, respectively. 相似文献