Quantitative surface analysis by Auger and x-ray photoelectron spectroscopy

Recent developments in quantitative surface analysis by Auger (AES) and x-ray photoelectron (XPS) spectroscopies are reviewed and problems relating to a more accurate quantitative interpretation of AES/XPS experimental data are discussed. Special attention is paid to consideration of elementary physical processes involved and influence of multiple scattering effects on signal line intensities. In particular, the major features of core-shell ionization by electron impact, Auger transitions and photoionization are considered qualitatively and rigorous approaches used to calculate the respective transition probabilities are analysed. It is shown that, in amorphous and polycrystalline targets, incoherent scattering of primary and signal Auger and photoelectrons can be described by solving analytically a kinetic equation with appropriate boundary conditions. The analytical results for the angular and energy distribution, the mean escape depth, and the escape probability as a function of depth of origin of signal electrons as well as that for the backscattering factor in AES are in good agreement with the corresponding Mote Carlo simulation data. Methods for inelastic background subtraction, surface composition determination and depth-profile reconstructions by angle-resolved AES/XPS are discussed. Examples of novel techniques based on x-ray induced photoemission are considered.     

辣根过氧化物酶自组装多层膜结构形貌与活性的研究

用分子沉积自组装作制备了阳离子化和阴离子化的辣根过氧化物酶自组装膜；并用原子力显微镜（AFM）研究了不同离子化辣根过氧化物酶单层及多层自组装膜的形貌结构与自组装膜的活性变化关系。结果表明：阴离子化的辣根过氧化物酶自组装膜的表面形貌比较粗糙，均方根粗糙度（RMS）及酶分子粒径较大，且组装膜的活性比较大。     

Atomic structure of InAs quantum dots on GaAs

In recent years, the self-assembled growth of semiconductor nanostructures, that show quantum size effects, has been of considerable interest. Laser devices operating with self-assembled InAs quantum dots (QDs) embedded in GaAs have been demonstrated. Here, we report on the InAs/GaAs system and raise the question of how the shape of the QDs changes with the orientation of the GaAs substrate. The growth of the InAs QDs is understood in terms of the Stranski–Krastanow growth mode. For modeling the growth process, the shape and atomic structure of the QDs have to be known. This is a difficult task for such embedded entities.

In our approach, InAs is grown by molecular beam epitaxy on GaAs until self-assembled QDs are formed. At this point the growth is interrupted and atomically resolved scanning tunneling microscopy (STM) images are acquired. We used preparation parameters known from the numerous publications on InAs/GaAs. In order to learn more about the self-assemblage process we studied QD formation on different GaAs(0 0 1), (1 1 3)A, and ( )B substrates. From the atomically resolved STM images we could determine the shape of the QDs. The quantum “dots” are generally rather flat entities better characterized as “lenses”. In order to achieve this flatness, the QDs are terminated by high-index bounding facets on low-index substrates and vice versa. Our results will be summarized in comparison with the existing literature.     

Ion pair generation rates near planar3H and63Ni electron capture detector foils

The ion-pair generation rate (ionization topography) in plasmas from⁶³Ni and particularly Ti³H₄ foils, as used in electron capture detectors, was measured at room temperature using large, parallel plates of low backscattering ability in nitrogen gas of varying density. For one atmosphere pressure, the fall-off of ion pair formation as calculated from the exponential region equalsN ₀·e ^–0.19d for⁶³Ni andN ₀·e ^–1.4d for³H (whereN ₀ is the initial ionization rate immediately adjacent to the foil andd is the distance from the foil in mm). The experimentally measured half ranges (distances from the foil within which 50% of all possible ion pairs are created) are 2.7 mm for⁶³Ni and 0.27 mm for³H. The half ranges calculated from the exponential region where there is less interference from electron backscattering, are 3.7 and 0.5 mm, respectively. The latter values are considered closer to the true, unimpeded ionization topography near planar⁶³Ni and³H foils.Material taken from doctoral thesis     

Copper passivity and its breakdown in sodium bicarbonate solutions: A scanning electron microscopy and x-ray photoelectron and auger spectroscopy study

Effect of bicarbonate ions on the copper passivity and its local breakdown is studied by cyclic voltammetry, Auger spectroscopy, x-ray photoelectron spectroscopy, and scanning electron microscopy. Comparing data for solutions with various sodium bicarbonate concentrations shows copper to undergo pitting in 0.02 M NaHCO₃, whereas it remains stably passive in 0.10 M NaHCO₃. Independent studies suggest that carbonates play a protective role in stabilization of the oxide-hydroxide passive film on copper.     

Fully aromatic thermotropic liquid crystalline polyesters of substituted 4,4′-biphenols. IV. Homopolyesters with terephthalic acid and copolyesters with terephthalic acid and 4-hydroxybenzoic acid

A series of fully aromatic thermotropic polyesters based on mono-, di-, and tetra-substituted biphenols was prepared by the melt polycondensation method and examined for their thermotropic behavior by a variety of experimental techniques. The homopolyesters obtained from substituted biphenols containing either one phenyl or two phenyl groups as substituent(s) and TA formed nematic melts, but the homopolymers of the substituted biphenols containing either four sec-butyl groups or two tert-butyl groups with TA had melting transitions, T_m, above 400°C. Thus, it was not possible to determine whether they formed nematic melts. On copolymerization with 30 mol % HBA most of the resulting copolyesters had much lower T_m values, compared to those of respective homopolyesters, and the copolymers of the biphenol monomer containing the tert-butyl groups formed a nematic melt at an observable temperature. However, the copolymer of the biphenol with sec-butyl groups still had a T_m above 400°C. © 1993 John Wiley & Sons, Inc.     

纳秒脉冲激光清洗石化设备对清洗表面的影响

采用纳秒脉冲激光对石化设备普遍使用的20钢表面锈蚀层以及油污进行了激光清洗试验,通过正交实验法得到优化后的激光清洗工艺参数,在激光功率18 W,激光脉冲重复频率75kHz,扫描速度3 000mm/s的清洗工艺参数下可有效去除20钢表面的锈蚀层;在激光功率20 W,激光脉冲重复频率75 kHz,扫描速度2 250 mm/s的清洗工艺参数下可有效去除20钢表面附着的油污。分析了激光清洗前后材料表面形貌的变化,研究了激光清洗前后表面的显微硬度以及耐腐蚀性,结果表明：激光清洗可以在不改变材料的耐腐蚀性能的同时提升材料表面的显微硬度,从而达到理想的激光清洗效果。     

Effect of molecular orientation distribution and crystallinity on the measurement of the crystal lattice modulus of nylon 6 by x-ray diffraction

The crystal lattice modulus of nylon 6 (-type) was measured by x-ray diffraction using nylon 6 films drawn up to five times. The measured crystal lattice modulus was 173–175 GPa for all specimens whose crystallinity and the Young's modulus were beyond 46% and 3.75 GPa, respectively. These results indicate that a state of homogenous stress can be achieved. In contrast, the values were scattered for the speciments whose crystallinity and Young's modulus are less than the above values. To study the origin, a numerical calculation of the crystal lattice modulus, as measured by x-ray diffraction, was carried out by considering effects on the orientation factors of molecular chains and crystallinity. In this calculation, a previously introduced model was employed, in which oriented crystalline layers are surrounded by oriented amorphous phases so that the strains of the two phases at the boundary are identical. The theoretical results calculated by the introduced model indicated that the crystal lattice modulus by x-ray diffraction is almost equal to the intrinsic crystal modulus if the morphology of the test specimen can be represented as a series model. In contrast, if a parallel model is more appropriate, the difference between the measured modulus and the intrinsic value can be pronounced. Such morphological dependence was found to be less pronounced with increasing high degree of molecular orientation and crystallinity.     

Intramolecular and liquid structure of 2,2,2-trifluoroethanol by X-ray diffraction

Intramolecular and liquid structure of 2,2,2-trifluoroethanol (TFE) have been investigated by x-ray diffraction at 25°C. The structural parameters for the skeleton of the molecules in the liquid phase are similar to those in the gas phase. The conformers of TFE molecules in the liquid phase are discussed. The O...O distance at about 284 pm and additional F...O one at about 302 pm were found to be characteristic for the first neighbor interactions. Various models (dimers and trimers) have been examined for analyzing the first neighbor structure. The liquid structure was explained in terms of small clusters consisting of two to three molecules rather than of a more extended polymeric network.Central Research Institute for Chemistry of the Hungarian Academy of Sciences, Budapest, P. O. Box 17, H-1525, Hungary.     

Crystal structure of a tetrabromo derivative of cyclopropyldihydroarglabin and its antifungal activity

A tetrabromo derivative of arglabin was synthesized stereoselectively. The molecular structure of the new compound was established using PMR and 13C NMR spectra and an x-ray structure analysis. Its antifungal activity was demonstrated. __________ Translated from Khimiya Prirodnykh Soedinenii, No. 3, pp. 253–254, May–June, 2006.