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电子产品研制阶段可靠性增长试验研究 总被引:1,自引:0,他引:1
结合工程实际经验,深入讨论了可靠性增长过程及实现途径,在保持试验条件和改进过程不变的条件下,实施了对具体型号电子产品的可靠性增长试验,达到了预期的可靠性增长目标,并且利用可靠性增长试验的数学模型(AMSAA模型)来评估产品的可靠性增长,对开展可靠性增长与可靠性增长试验工作具有重要的实际意义. 相似文献
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美国安捷伦公司(原惠普公司)的Agilent-VEE,NI公司的Lab VIEW和Lab Windows/CVI开发软件等是国际上公认的优秀的虚拟仪器开发平台软件,人们对以应用后两者开发测试系统比较了解,但对VEE在测试系统中的应用少有介绍。本文介绍基于Agilent-VEE平台和GPIB总线的实用测试系统的组成、特点及仪器控制方式。 相似文献
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As we approach 100 nm technology the interconnect issues are becoming one of the main concerns in the testing of gigahertz system-on-chips. Voltage distortion (noise) and delay violations (skew) contribute to the signal integrity loss and ultimately functional error, performance degradation and reliability problems. In this paper, we first define a model for integrity faults on the high-speed interconnects. Then, we present a BIST-based test methodology that includes two special cells to detect and measure noise and skew occurring on the interconnects of the gigahertz system-on-chips. Using an inexpensive test architecture the integrity information accumulated by these special cells can be scanned out for final test and reliability analysis. 相似文献
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Erik Jan Marinissen 《Journal of Electronic Testing》2002,18(4-5):435-454
Modular testing is an attractive approach to testing large system ICs, especially if they are built from pre-designed reusable embedded cores. This paper describes an automated modular test development approach. The basis of this approach is that a core or module test is dissected into a test protocol and a test pattern list. A test protocol describes in detail how to apply one test pattern to the core, while abstracting from the specific test pattern stimulus and response values. Subsequent automation tasks, such as the expansion from core-level tests to system-chip-level tests and test scheduling, all work on test protocols, thereby greatly reducing the amount of compute time and data involved. Finally, an SOC-level test is assembled from the expanded and scheduled test protocols and the (so far untouched) test patterns. This paper describes and formalizes the notion of test protocols and the algorithms for test protocol expansion and scheduling. A running example is featured throughout the paper. We also elaborate on the industrial usage of the concepts described. 相似文献
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V. I. Dashkevich 《Journal of Applied Spectroscopy》2002,69(6):862-870
Based on a semiclassical theory, investigations were made of the dynamics and spectral composition of pulsed generation with self-injection of priming radiation from the active part of a three-mirror linear resonator, the passive part of which contains an active loss modulator and serves as the output reflector of the laser. It is shown that there exists a range of resonator parameters at which pulsed lasing has virtually a single frequency irrespective of the detuning of the frequencies of the priming radiation and of the nearest eigenmode of the composite resonator. Considering graphically the phase conditions of generation, it is established that among pulsed lasers with self-injection of priming radiation which are constructed on the basis of three-mirror linear and branched resonators, the most efficient for creating single-frequency generation are those in which the length of the main resonator, where generation of the pulse occurs, is larger than the length of the additional one intended for forming the priming radiation. With an inverse ratio of the lengths of the resonators, the conditions of single-frequency pulsed generation becomes dependent on the priming radiation frequency. 相似文献