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401.
基于对已报道Gd-Cu配合物的文献调研,发现一类{LnCu3}簇合物(Ln=Gd(1),Tb(2),Dy(3)),其CuⅡ离子被GdⅢ离子有效分隔且分子内部仅拥有铁磁相互作用,因而对其进行了低温磁制冷性能研究。在已报道实验方法上加以改进,用一锅法制备出一系列异金属{LnCu3}簇合物(Ln=Gd(1),Tb(2),Dy(3)),并运用元素分析、红外、单晶/粉末X-射线衍射等方法对其进行表征,以证明其同构性及相纯度。低温磁热效应的研究结果表明簇合物1-3在ΔH=0~7T下的最大磁熵变值(-ΔSm)分别为16.1(2K),6.9(5K)和8.1(5K)J·kg-1·K-1。簇合物1与已报道的Gd-Cu簇合物的磁熵变对比再次证明了弱铁磁相互作用在3d-4f分子磁制冷剂设计中起到重要的作用。 相似文献
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设计了一台以氯化钙/活性炭复合吸附剂和氨作为吸附工质对的多功能热管型吸附制冷机组,采用一种新型的基于二次回热的二级循环方式来降低驱动热源的温度梯度,吸附床的加热解吸、冷却吸附及回热过程均由无外加驱动力的多功能热管工作完成.研究结果表明:当解吸温度为103℃及冷却水温度为30℃时,回热型二级循环相对传统二级循环可显著提高机组的工作性能,制冷系数COP及单位质量吸附剂制冷功率SCP提高幅度均在23%以上;相对单级循环,二级吸附循环的最大优点在于能有效利用更低品位的余热和可再生能源作为驱动热源进行制冷,吸附制冷技术在低温热源场合的应用提供了有效途径. 相似文献
405.
Preparation, structural and electrical properties of zinc oxide grown on silicon nanoporous pillar array 下载免费PDF全文
Polycrystalline thick film of zinc oxide (ZnO) is grown on a unique
silicon substrate with a hierarchical structure, silicon nanoporous
pillar array (Si-NPA), by using a vapour phase transport method. It
is found that as-grown ZnO film is composed of closely packed ZnO
crystallites with an average size of $\sim$10\,\mu$m. The film
resistivity of ZnO/Si-NPA is measured to be
$\sim$8.9\Omega\cdot$\,cm by the standard four probe method. The
lengthwise $I$-$V$ curve of ZnO/Si-NPA heterostructure is measured.
Theoretical analysis shows that the carrier transport across
ZnO/Si-NPA heterojunction is dominated by two mechanisms, i.e. a
thermionic process at high voltages and a quantum tunnelling process
at low voltages. 相似文献
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Cheng Xu Binbin Zhang Aurelia Chi Wang Wenzhe Cai Yunlong Zi Peizhong Feng Zhong Lin Wang 《Advanced functional materials》2019,29(29)
Triboelectric nanogenerator (TENG) is a direct measure of the surface charge density, thus providing a novel and powerful tool to study the essential mechanism of contact electrification (CE). A variety of TENGs including a Pt‐Al2O3 TENG, Au‐Al2O3 TENG, Ti‐Al2O3 TENG, Al‐Al2O3 TENG, and SiO2‐Al2O3 TENG are prepared in this study. After introducing initial charges on the Al2O3 surface of the TENGs, the long‐term evolution of surface charge quantity is investigated at different temperatures. The results show that charge variation of all the TENGs is analogous to exponential decay and is in accord with the thermionic emission model, verifying the electron transfer dominated mechanism of CE. Additionally, it is explored for the first time that the potential barrier of materials can be regulated by changing the contacting metals or dielectrics. Regulation of the barrier at high temperatures fully excludes the influence of ions from moisture and functional groups, which further indicates the dominant role played by electron transfer in CE. Surface state models for explaining barrier regulation during CE for both metal–dielectric and dielectric–dielectric pairs are proposed. This study provides a new perspective of the exploration of CE, and a novel method for further increasing or rapidly eliminating electrification of charged materials. 相似文献
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Study and modeling of the transport mechanism in a Schottky diode on the basis of a GaAs semiinsulator 总被引:1,自引:0,他引:1
The current through a metal-semiconductor junction is mainly due to the majority carriers. Three distinctly different mechanisms exist in a Schottky diode: diffusion of the semiconductor carriers in metal, thermionic emission-diffusion (TED) of carriers through a Schottky gate, and a mechanical quantum that pierces a tunnel through the gate. The system was solved by using a coupled Poisson-Boltzmann algorithm. Schottky BH is defined as the difference in energy between the Fermi level and the metal band carrier majority of the metal-semiconductor junction to the semiconductor contacts. The insulating layer converts the MS device in an MIS device and has a strong influence on its current-voltage (I-V) and the parameters of a Schottky barrier from 3.7 to 15 eV. There are several possible reasons for the error that causes a deviation of the ideal behaviour of Schottky diodes with and without an interfacial insulator layer. These include the particular distribution of interface states, the series resistance, bias voltage and temperature. The GaAs and its large concentration values of trap centers will participate in an increase in the process of thermionic electrons and holes, which will in turn act on the I-V characteristic of the diode, and an overflow maximum value [NT = 3 × 1020] is obtained. The I-V characteristics of Schottky diodes are in the hypothesis of a parabolic summit. 相似文献