Testing for additivity with B-splines

Regression splines are often used for fitting nonparametric functions, and they work especially well for additivity models. In this paper, we consider two simple tests of additivity: an adaptation of Tukey's one degree of freedom test and a nonparametric version of Rao's score test. While the Tukey-type test can detect most forms of the local non-additivity at the parametric rate of O(n-1/2), the score test is consistent for all alternative at a nonparametric rate. The asymptotic distribution of these test statistics is derived under both the null and local alternative hypotheses. A simulation study is conducted to compare their finite-sample performances with some existing kernel-based tests. The score test is found to have a good overall performance.     

环境试验与可靠性试验的关系

从环境试验和可靠性试验的相关标准入手，详细论述了两者之间的相互关系与区别：互为补充，互为依存，共同发展，共同为保障产品的环境适应性和使用可靠性发挥作用。最后阐述了加强自然环境试验的重要性，它是检验实验结果的基本标准。     

Endoscopic Observation of Tissue by Narrowband Illumination

We propose a new illumination method for a medical endoscope: narrow band imaging (NBI), in which the spectral bandwidth of the filtered light is narrowed. To confirm how the spectral specifications of the filtered light influence a reproduced image, an experiment was conducted observing the endoscopic images of the back mucosa of a human tongue. In addition, the effect of NBI on endoscopic images was investigated through preliminary clinical tests in colonoscopy and upper gastrointestinal endoscopy. It has been shown that NBI can enhance the capillary pattern and the crypt pattern on the mucosa. These patterns are useful features for diagnosing an early cancer.     

应用参数假设检验分析特异功能是否存在

本文应用参数假设检验知识分析“特异功能”者是否有特异功能。     

BAHADUR ASYMPTOTIC EFFICIENCY IN A SEMIPARAMETRIC REGRESSION MODEL

ＢＡＨＡＤＵＲＡＳＹＭＰＴＯＴＩＣＥＦＦＩＣＩＥＮＣＹＩＮＡＳＥＭＩＰＡＲＡＭＥＴＲＩＣＲＥＧＲＥＳＳＩＯＮＭＯＤＥＬ￥ＬＩＡＮＧＨＵＡ；ＣＨＥＮＧＰＩＮＧＡｂｓｔｒａｃｔ：ＴｈｅａｕｔｈｏｒＳｇｉｖｅＭＬＥθ１ＭＬｏｆθ１ｉｎｔｈｅｍｏｄｅｌＹ＝θ...     

Partial scan design and test sequence generation based on reduced scan shift method

This paper presents a partial scan algorithm, calledPARES (PartialscanAlgorithm based onREduced Scan shift), for designing partial scan circuits. PARES is based on the reduced scan shift that has been previously proposed for generating short test sequences for full scan circuits. In the reduced scan shift method, one determines proch FFs must be controlled and observed for each test vector. According to the results of similar analysis, PARES selects these FFs that must be controlled or observed for a large number of test vectors, as scanned FFs. Short test sequences are generated by reducing scan shift operations using a static test compaction method. To minimize the loss of fault coverage, the order of test vectors is so determined that the unscanned FFs are in the state required by the next test vector. If there are any faults undetected yet by a test sequence derived from the test vectors, then PARES uses a sequential circuit test generator to detect the faults. Experimental results for ISCAS'89 benchmark circuits are given to demonstrate the effectiveness of PARES.     

约束放电激励千瓦级基模CO2激光器

本文研究了约束放电激励千瓦级基模CO2激光器。约束放电激励的思想核心是:利用正交或基本正交的电场或者电磁场在阴极位降区附近形成对带电粒子的捕集阱,由此产生对放电过程中从阴极发出的带电粒子的约束作用从而影响整个气体放电激励过程。     

铯原子激光共振电离

用Ｎｄ：ＹＡＧ及其泵浦的染料激光进行铯原子三步共振电离。求解了非饱和共振过程速率方程，计算出基态和激发态共振吸收截面，给出电离效率分别与激发电离速率以及作用时间的变化关系，得到饱和激发电离的流量条件和通量条件。     

SXDG-1型汽车前照灯全自动检测仪的微机控制

SXDG—1型汽车前照灯全自动检测仪是用于检测汽车前照大灯光轴的偏斜情况及发光强度并进行定量检验的专用设备。它可以自动测出有关参数,并予以数字显示和打印输出。本文介绍了该仪器的主要性能、工作原理及微机控制系统(包括硬件结构和软件设计思想等)。     

Test Generation for Crosstalk-Induced Faults: Framework and Computational Results

Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital combinational circuits. These noise effects can propagate through a circuit and create a logic error in a latch or at a primary output. We have developed a mixed-signal test generator, called XGEN, that incorporates classical static values as well as dynamic signals such as transitions and pulses, and timing information such as signal arrival times, rise/fall times, and gate delay. In this paper we first discuss the general framework of the test generation algorithm followed by computational results. Comparison of results with SPICE simulations confirms the accuracy of this approach.