应用TEXTIO和MATLAB进行复杂数字系统仿真

在基于FPGA的复杂数字系统的仿真测试中,设计者常常面临各种挑战.以数字图像处理系统的仿真为例,如果采用完备性仿真测试方法,那么测试矢量的数量将是非常巨大的;如果采用常规方法,不仅效率不高,而且可能无法达到仿真测试的目的.针对这个难题,提出一种进行仿真测试的新方法,该方法应用TEXTIO和MATLAB来辅助仿真测试过程,使问题得到较好的解决.以电视图像实时多目标捕获单元的仿真测试为例,全面、细致地讨论这种新方法.     

玻璃纤维布内中空纤维丝的检测

介绍了玻璃纤维布内中空纤维丝的检测方法。     

基于Agilent-VEE平台的测试系统设计与应用

美国安捷伦公司(原惠普公司)的Agilent-VEE，NI公司的Lab VIEW和Lab Windows／CVI开发软件等是国际上公认的优秀的虚拟仪器开发平台软件，人们对以应用后两者开发测试系统比较了解，但对VEE在测试系统中的应用少有介绍。本文介绍基于Agilent-VEE平台和GPIB总线的实用测试系统的组成、特点及仪器控制方式。     

不同表面预处理对有机电致发光显示器性能的影响

从生产角度研究了基板表面的预处理工艺对OLED性能的影响,分别用UVOzone、氧Plasma以及两者相结合的方式对基板进行表面处理,并按照生产工艺制作器件,从接触角、方阻以及光电特性等测试结果对各种表面处理的样品进行比较。结果表明以上处理都改善了器件性能,不同程度提高了器件的清洁度、亮度和发光效率,其中UVOzone和氧Plasma结合的方式处理效果最为显著,器件在10V时亮度达到79920cd/m2,比其他两种处理方式亮度提高约25%。     

一种零电压转换有源功率因数校正电路的研究

提出了一种基于UC3854的零电压转换有源功率因数校正(ZVT-APFC)的控制电路实现方案,介绍了ZVT电路工作原理,着重分析了由分立元件构成的辅助开关管的驱动电路,通过实验证实了驱动电路的稳定性和可靠性,并通过效率比较验证了ZVT-APFC电路的优良性能。与采用UC3855的电路相比,该电路方案具有简单、可靠、成本低等优点。     

Signal Integrity: Fault Modeling and Testing in High-Speed SoCs

As we approach 100 nm technology the interconnect issues are becoming one of the main concerns in the testing of gigahertz system-on-chips. Voltage distortion (noise) and delay violations (skew) contribute to the signal integrity loss and ultimately functional error, performance degradation and reliability problems. In this paper, we first define a model for integrity faults on the high-speed interconnects. Then, we present a BIST-based test methodology that includes two special cells to detect and measure noise and skew occurring on the interconnects of the gigahertz system-on-chips. Using an inexpensive test architecture the integrity information accumulated by these special cells can be scanned out for final test and reliability analysis.     

The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs

Modular testing is an attractive approach to testing large system ICs, especially if they are built from pre-designed reusable embedded cores. This paper describes an automated modular test development approach. The basis of this approach is that a core or module test is dissected into a test protocol and a test pattern list. A test protocol describes in detail how to apply one test pattern to the core, while abstracting from the specific test pattern stimulus and response values. Subsequent automation tasks, such as the expansion from core-level tests to system-chip-level tests and test scheduling, all work on test protocols, thereby greatly reducing the amount of compute time and data involved. Finally, an SOC-level test is assembled from the expanded and scheduled test protocols and the (so far untouched) test patterns. This paper describes and formalizes the notion of test protocols and the algorithms for test protocol expansion and scheduling. A running example is featured throughout the paper. We also elaborate on the industrial usage of the concepts described.     

声光效应拉曼-内斯方程矩阵级数解法及声光调制器优化设计

提出一种求解正常声光相互作用拉曼 内斯 (Raman Nath)方程的矩阵级数解法 ,该解法直观方便且具有普遍性。计算结果表明 ,对Q =4 1π ,Bragg衍射的效率只有 97 5 % ;对非对称入射 ,以往的Raman Nath近似解误差较大 ;指出提高Bragg衍射效率的有效途径在于提高声光频率比并给出计算声光器件最优长度的计算公式。     

HIRFL–CSR加速器中束流与真空中剩余气体的碰撞损失

研究了重离子加速器中束流与真空中剩余气体的碰撞损失过程和碰撞截面,在依据大量实验数据的基础上,提出了一组计算离子一原子的电荷交换截面的经验公式.以兰州重离子加速器HDRFL及冷却储存环CSR为例,给出了依据碰撞截面的公式计算束流在加速器真空中的传输效率的方法,并计算了在不同真空度下HIRFL的ECR源轴向注入束运线、注入器SFC、前束运线、主加速器SSC和后束运线等不同加速阶段及CSR的传输效率,并提出合理的真空度要求.HIRFL的真空分布测量和束流的损失测量证明了该计算方法的可靠性.