Experimental Evaluation of Procedures for Heat Capacity Measurement by Differential Scanning Calorimetry

Experimental evaluation of the procedures adopted for heat capacity measurements employing differential scanning calorimetry (DSC) has been carried out by taking nickel and sapphire as test samples. Among the various methodologies reported in literature, the absolute dual step method was chosen for this purpose due to its simplicity and minimum number of measurements required. By proper temperature and heat flux calibration employing indium as reference, it was possible to obtain the calibration factor independent of temperature. This was ascertained by analysing other pure metals namely Sn, Zn, Cd, and Pb and determining their melting temperatures and heats of melting. Various operator- and sample-dependent parameters such as heating rate, sample mass, the structure of the sample, reproducibility and repeatability in the measurements were investigated. Heat capacities of both nickel and sapphire have been determined using the above method. Further, the heat capacity of nickel has also been determined using the widely employed three-step method taking sapphire as the heat flux calibration standard. Both methods yielded the comparable heat capacity values for nickel. Based on the parameters investigated and their influence, it could be concluded that reasonably precise and accurate heat capacity measurements are possible with DSC. One advantage of this method is the elimination of a separate calibration run using a reference material of known heat capacity. This revised version was published online in August 2006 with corrections to the Cover Date.     

特征值为二重根的压电材料异材界面端奇异性

横观各向同性压电材料的特征值的不同,其一般解的形式也不同,压电结合材料问题的求解,可以归结为寻找合适的调和函数,针对材料特征值为二重根（s1^2≠s2^2=s3^2)的情况,将变量分离形式的调和函数作特征展开,推导了横观各向同性压电材料轴对称异材界面端附近的奇民异应力场和奇异电位移场,给出院 决定奇异性的特性方程,结果表明,电位移场和应力场具有相同的奇异性,奇异性次数不仅与界面端形状以及材料的机械性质有关。也与材料的压电特性有关。     

Ag/AgCl纳米粒子的制备及其共振散射光谱研究

以AgCl纳米粒子作晶种,在柠檬酸三钠存在条件下,AgCl纳米粒子表面结合的银离子被光化学还原而获得Ag/AgCl复合纳米粒子。研究了Ag/AgCl纳米粒子的光谱特性,在310和590nm处产生二个共振散射峰,在400nm处产生一个吸收峰。     

Spectroscopy of Ly-α Lines at Storage Rings by Crystal Spectrometry and Absorption Edge Technique

Crystal spectrometry and absorption edge technique have the capability to overcome the gap in accuracy between experiment and theory in the strong field domain of QED. New results are presented which indicate the capacity of these methods to measure the energies of X-rays emitted by highly charged heavy ions at modern storage rings with a precision sensitive to second order corrections to the Lambshift in H-like very heavy ions. This revised version was published online in July 2006 with corrections to the Cover Date.     

SUT‐NANOTEC‐SLRI beamline for X‐ray absorption spectroscopy

The SUT‐NANOTEC‐SLRI beamline was constructed in 2012 as the flagship of the SUT‐NANOTEC‐SLRI Joint Research Facility for Synchrotron Utilization, co‐established by Suranaree University of Technology (SUT), National Nanotechnology Center (NANOTEC) and Synchrotron Light Research Institute (SLRI). It is an intermediate‐energy X‐ray absorption spectroscopy (XAS) beamline at SLRI. The beamline delivers an unfocused monochromatic X‐ray beam of tunable photon energy (1.25–10 keV). The maximum normal incident beam size is 13 mm (width) × 1 mm (height) with a photon flux of 3 × 10⁸ to 2 × 10¹⁰ photons s^?1 (100 mA)^?1 varying across photon energies. Details of the beamline and XAS instrumentation are described. To demonstrate the beamline performance, K‐edge XANES spectra of MgO, Al₂O₃, S₈, FeS, FeSO₄, Cu, Cu₂O and CuO, and EXAFS spectra of Cu and CuO are presented.     

一些图的Mycielski图的均匀邻强边染色

如果图G的一个正常边染色满足相邻点的色集不同,且任意两种颜色所染边数目相差不超过1,则称为均匀邻强边染色,其所用最少染色数称为均匀邻强边色数.本文得到了路、圈、星和扇的Mycielski图的均匀邻强边色数.     

聚酰亚胺薄膜的电致发光和光致发光

测量了氙灯辐照后聚酰亚胺(PI)薄膜的光致发光(PL)强度、PL谱和氙灯辐照后直流高电场下PI薄膜的电致发光(EL)强度、EL谱、XRD谱和吸收光谱,研究了其EL、PL特性与微观结构的关系.结果表明:PI薄膜的PL强度随测量时间呈指数衰减,EL强度随场强呈指数增长;辐照39 h后,PI的预击穿场强为2.56MV/cm,...     

Soft X‐ray absorption spectroscopy and resonant inelastic X‐ray scattering spectroscopy below 100 eV: probing first‐row transition‐metal M‐edges in chemical complexes

X‐ray absorption and scattering spectroscopies involving the 3d transition‐metal K‐ and L‐edges have a long history in studying inorganic and bioinorganic molecules. However, there have been very few studies using the M‐edges, which are below 100 eV. Synchrotron‐based X‐ray sources can have higher energy resolution at M‐edges. M‐edge X‐ray absorption spectroscopy (XAS) and resonant inelastic X‐ray scattering (RIXS) could therefore provide complementary information to K‐ and L‐edge spectroscopies. In this study, M_2,3‐edge XAS on several Co, Ni and Cu complexes are measured and their spectral information, such as chemical shifts and covalency effects, are analyzed and discussed. In addition, M_2,3‐edge RIXS on NiO, NiF₂ and two other covalent complexes have been performed and different d–d transition patterns have been observed. Although still preliminary, this work on 3d metal complexes demonstrates the potential to use M‐edge XAS and RIXS on more complicated 3d metal complexes in the future. The potential for using high‐sensitivity and high‐resolution superconducting tunnel junction X‐ray detectors below 100 eV is also illustrated and discussed.     

一种适于自适应光学的旋转软刀口波面传感器的研究

利用傅里叶光学理论,证明了一种新型波面传感器——旋转软刀口波面传感器的概念.在经典刀口法的刀口区,以渐变透过率代替突变透过率函数,在光瞳象面上可获得反映光瞳面位置待测波面位相梯度及位相梯度方向的调制信号.文中给出了实验结果和讨论.     

边缘相似度及其在散斑噪声抑制算法比较中的应用

对于滤波算法,噪声抑制能力和边缘保持能力一直是考核其性能的两个重要指标。对于前者,通常都有相应的参数进行表征,而对于后者,通常却只能依靠人眼进行主观评判。根据标准边缘图像和待测边缘图像边缘点位置的相似性,定义了边缘相似度参数,用来表征滤波算法的边缘保持能力。将此参数应用于高斯噪声图像和椒盐噪声图像滤波算法的比较中,取得了预期的效果:此参数值准确地反映了各滤波算法的边缘保持能力。对激光雷达图像而言,散斑噪声滤波算法的边缘保持能力具有非常重要的意义,为此,将边缘相似度用于散斑噪声滤波算法的边缘保持能力比较,结果表明Lee滤波算法和增强Lee滤波算法具有较强的边缘保持能力,而常规的均值滤波和中值滤波边缘保持能力较差。