Covalently attached self‐assembly of ultrathin films from hydroxy‐containing porphyrin and diazoresin

Ultrathin films from 5,10,15,20‐tetrakis(4‐hydroxyphenyl) porphyrin (HPP) and diazoresin (DR) via a H bonding interaction were fabricated with the self‐assembly technique. Under UV irradiation, the H bonds between the layers will convert to covalent bonds following the decomposition of the diazonium group of DR. The stability of the film against the polar solvent and electrolyte aqueous solution increases a lot because of the formation of the covalent crosslinking structure. Thus, the photoelectric conversion property of DR/HPP film can be measured directly with a normal photoelectric chemical cell with potassium chloride as the electrolyte. The maximum of the anodic photocurrent was measured as 1.7 μ Å for an eight bilayer DR/HPP film deposited on an indium–tin oxide glass electrode. The action spectrum of the photocurrent generation indicated that the HPP contained in the film is responsible for the generation of the observed photocurrent. © 2003 Wiley Periodicals, Inc. J Polym Sci Part A: Polym Chem 41: 3103–3108, 2003     

Facile preparation of core‐crosslinked micelles from azide‐containing thermoresponsive double hydrophilic diblock copolymer via click chemistry

Double hydrophilic diblock copolymer, poly(N,N‐dimethylacrylamide)‐b‐poly(N‐isopropylacrylamide‐co‐3‐azidopropylacrylamide) (PDMA‐b‐P(NIPAM‐co‐AzPAM), containing azide moieties in one of the blocks was synthesized via consecutive reversible addition‐fragmentation chain transfer polymerization. The obtained diblock copolymer molecularly dissolves in aqueous solution at room temperature, and can further supramolecularly self‐assemble into core‐shell nanoparticles consisting of thermoresponsive P(NIPAM‐co‐AzPAM) cores and water‐soluble PDMA coronas above the lower critical solution temperature of P(NIPAM‐co‐AzPAM) block. As the micelle cores contain reactive azide residues, core crosslinking can be facilely achieved upon addition of difunctional propargyl ether via click chemistry. In an alternate approach in which the PDMA‐b‐P(NIPAM‐co‐AzPAM) diblock copolymer was dissolved in a common organic solvent (DMF), the core‐crosslinked (CCL) micelles can be fabricated via “click” crosslinking upon addition of propargyl ether and subsequent dialysis against water. CCL micelles prepared by the latter approach typically possess larger sizes and broader size distributions, compared with that obtained by the former one. In both cases, the obtained (CCL) micelles possess thermoresponsive cores, and the swelling/shrinking of which can be finely tuned with temperature, rendering them as excellent candidates as intelligent drug nanocarriers. Because of the high efficiency and quite mild conditions of click reactions, we expect that this strategy can be generalized for the structural fixation of other self‐assembled nanostructures. © 2007 Wiley Periodicals, Inc. J Polym Sci Part A: Polym Chem 46: 860–871, 2008     

Balance testing and balance-testable design of logic circuits

We propose a low-cost method for testing logic circuits, termed balance testing, which is particularly suited to built-in self testing. Conceptually related to ones counting and syndrome testing, it detects faults by checking the difference between the number of ones and the number of zeros in the test response sequence. A key advantage of balance testing is that the testability of various fault types can be easily analyzed. We present a novel analysis technique which leads to necessary and sufficient conditions for the balance testability of the standard single stuck-line (SSL) faults. This analysis can be easily extended to multiple stuck-line and bridging faults. Balance testing also forms the basis for design for balance testability (DFBT), a systematic DFT technique that achieves full coverage of SSL faults. It places the unit under test in a low-cost framework circuit that guarantees complete balance testability. Unlike most existing DFT techniques, DFBT requires only one additional control input and no redesign of the underlying circuit is necessary. We present experimental results on applying balance testing to the ISCAS 85 benchmark circuits, which show that very high fault coverage is obtained for large circuits even with reduced deterministic test sets. This coverage can always be made 100% either by adding tests or applying DFBT.This research was supported by the National Science Foundation under Grant No. MIP-9200526. Parts of this paper were published in preliminary form in Proc. 23rd Symp. Fault-Tolerant Computing, Toulouse, June 1993, and in Proc. 31st Design Automation Conf, San Diego, June 1994.