氢氟酸和PSG牺牲层腐蚀的TDC模型

对不同结构,即直沟道结构、冒泡结构和组合沟道结构的氢氟酸牺牲层腐蚀进行了研究.以往的牺牲层腐蚀模型和实验结果不能很好地吻合.以往的模型和实验结果的误差随着腐蚀时间的增加而增大.本文提出了一个修正模型,在修正模型中:HF的扩散系数是浓度和温度的函数;腐蚀速率常数是温度的函数;此外还考虑了腐蚀产物对腐蚀过程的影响.对于组合沟道结构,对腐蚀前端形状的描述采用了一个新的数学模型.实验结果和以往的模型以及修正模型进行了对比,结果表明修正模型能够和实验结果吻合得很好.     

Roughness improvement of the CoSi2/Si-interface for an application as buried silicide

The material CoSi₂ is preferred for the fabrication of buried silicide films between silicon device layer and buried oxide of SOI substrates for BICMOS integrations. Such an application needs excellent quality of the interface between the silicide and the silicon device layer. Using the conventional cobalt salicide process the roughness and waviness of the interface is too large for a device application. In this presentation three technologies to improve the CoSi₂/Si-interface quality were characterized. Using the first technology a very thin single crystalline CoSi₂ film was fabricated on a silicon substrate. This film acts as initial layer to produce thicker single crystalline silicide films. By the second technology an interlayer between cobalt and the silicon substrate was used to mediate an epitaxial CoSi₂ growth. Different types and materials were tested. Using the third technique a sacrificial layer of polycrystalline silicon between cobalt and the silicon substrate was consumed during the silicidation reaction. This method gives the best results with interface roughness values of less than 1 nm. The interface roughness was measured after CoSi₂ removal using AFM. A possible epitaxial growth of the silicide films was investigated with XRD analysis. Cross sectional SEM images were prepared to analyze the interface waviness and the CoSi₂ structure.     

一种新型并联梳齿驱动的静电型微继电器

介绍了一种新型的、利用并联梳齿结构驱动的静电型微继电器及其制造工艺。通过优化并联梳齿结构的几何尺寸,可以使微继电器的阈值电压降低到5V。该微继电器的主体部分使用一套表面牺牲层标准工艺制造,同时,使用溅射工艺制作Au接触电极,可以使接触电阻降到100mΩ以下,增加了微继电器的使用寿命。由于该微继电器的驱动电压和制造工艺都和普通集成电路的驱动电压和制造工艺相兼容,因此两者在产业化生产中可以很容易地被集成在同一芯片上。     

一种新颖的MEMS表面工艺牺牲层厚度的电测量方法

牺牲层厚度是MEMS表面工艺中的一个重要参数,对它的测量和控制有着重要的意义。目前大多采用光机械的方法来测量,但是测试方法复杂、测试时间长。本文介绍了一种新颖的MEMS表面工艺牺牲层厚度测试技术,实现了牺牲层厚度的电测量。测试方法简单快捷,并且很便于测试系统集成。     

有机电合成中活性镁的产生及其反应

通过低还原电位的含活泼氢的烃类化合物及苯腈在消耗性镁阳极存在下的有机电解反应证实了阴极上高分散活性镁的存在,且其活性比以往方法所得的活性镁的活性更高。     

基于UV-LIGA技术的新型RF MEMS开关

介绍了一种基于UV-LIGA加工技术的双稳态电磁型RF MEMS开关,该结构由于使用了永磁体单元而使得开关在维持“开”或“关”态时不需要功耗,利用牺牲层UV-LIGA技术实现了开关的微制作。非接触式Wyko NT1100光学轮廓仪的测试表明,制备的开关实现了双稳态驱动功能,驱动脉冲电流50 mA,驱动行程17μm,响应时间20μs;开关完成一次驱动姿态转换所需要的功耗不到3μJ。AGILENT 8722ES型S参数网络分析仪的测试表明,开关在12 GHz时的插入损耗为-0.25 dB,隔离度为-30 dB。     

砷化镓基毫米波MEMS开关表面工艺研究

研究了砷化镓基毫米波MEMS开关的表面工艺方法,包括MEMS开关的工艺流程中的牺牲层技术、结构层技术、触点技术、薄膜电阻技术。重点阐述了以光敏聚酰亚胺作牺牲层和以电镀金作结构层的工艺制作方法。形成了砷化镓RF MEMS开关表面工艺流程,制作出了RF MEMS开关样品。开关驱动电压为60 V,35 GHz时的插入损耗<0.2 dB,隔离度>18 dB。     

绿色二氧化碳超流体半导体清洗设备

传统半导体清洗技术无法对硅片上的微小器件间的缝隙和线条进行有效清洗,以超临界二氧化碳为媒体的清洗技术则可克服上述缺点。超临界二氧化碳具有零表面张力、低黏度、强扩散能力和溶解能力等特性,并且无毒无臭、可以循环使用,在下一代半导体清洗和清洗后的干燥过程中有极强的应用前景。提出了一种绿色二氧化碳超流体半导体清洗设备,它可实现超流体清洗和超临界干燥,二氧化碳循环使用,属于新型高效的下一代绿色半导体清洗设备。     

Strikingly improved toughness of nonpolar rubber by incorporating sacrificial network at small fraction

It poses a huge challenge to create nonpolar rubber with high fracture toughness. In the present letter, inspired by the concept of sacrificial bonding associated with many biological materials, we propose that a small fraction of additional sacrificial network can strikingly improve the fracture toughness of nonpolar rubbers. As a proof of concept, we created the additional “fragile” epoxidized natural rubber (ENR) network in commercially available SBR rubber in a facile process. With addition of only 10 phr ENR, the SBR/ENR double network (DN) exhibits a fracture energy nearly fourfold higher than that for the neat SBR. The formation of DN formation and the correlation between the high toughness and presence of the second brittle network have been fully discussed. This is the first time sacrificial networks are created in diene‐based rubber towards high toughness elastomers in a facile and efficient way. © 2015 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys. 2016 , 54, 781–786