Techniques for estimating test length under random test

When a circuit is tested using random or pseudorandom patterns, it is essential to determine the amount of time (test length) required to test it adequately. We present a methodology for predicting different statistics of random pattern test length. While earlier methods allowed estimation only of upper bounds of test length and only for exhaustive fault coverage, the technique presented here is capable of providing estimates of all statistics of interest (including expected value and variance) for all coverage specifications.Our methodology is based on sampling models developed for fault coverage estimation [1]. Test length is viewed as awaiting time on fault coverage. Based on this relation we derive the distribution of test length as a function of fault coverage. Methods of approximating expected value and variance of test length are presented. Accuracy of these approximations can be controlled by the user. A practical technique for predicting expected test length is developed. This technique is based on clustering faults into equal detectability subsets. A simple and effective algorithm for fault clustering is also presented. The sampling model is applied to each cluster independently and the results are then aggregated to yield test lengths for the whole circuit. Results of experiments with several circuits (both ISCAS '85 benchmarks and other practical circuits) are also provided.This work was done while the author was with the Department of Electrical Engineering, Southern Illinois University, Carbondale, IL 62901.     

Large Sample Properties of Mixture Models with Covariates for Competing Risks

We study the large-sample properties of a class of parametric mixture models with covariates for competing risks. The models allow general distributions for the survival times and incorporate the idea of long-term survivors. Asymptotic results are obtained under a commonly assumed independent censoring mechanism and some modest regularity conditions on the survival distributions. The existence, consistency, and asymptotic normality of maximum likelihood estimators for the parameters of the model are rigorously derived under general sufficient conditions. Specific conditions for particular models can be derived from the general conditions for ready check. In addition, a likelihood-ratio statistic is proposed to test various hypotheses of practical interest, and its asymptotic distribution is provided.     

Mixed-Signal Circuit Classification in a Pseudo-Random Testing Scheme

Pseudo-random testing techniques for mixed-signal circuits offer several advantages compared to explicit time-domain and frequency-domain test methods, especially in a BIST structure. To fully exploit these advantages a suitable choice of the pseudo-random input parameters should be done and an investigation on the accuracy of the circuit response samples needed to reduce the risk of misclassification should be carried out. Here these issues have been addressed for a testing scheme based on the estimation of the impulse response of the device under test (DUT) by means of input-output cross-correlation. Moreover, new acceptance criteria for the DUT are suggested which solve some ambiguity problems arising if the classification of the DUT as good or bad is based on a few samples of the cross-correlation function. Examples of application of the proposed techniques to real cases are also shown in order to assess the impact of the measurement system inaccuracies on the reliability of the test.     

Duane模型在斯特林制冷机研制过程中的应用

介绍一种实用的可靠性增长模型杜安 (Duane)模型 ,并探讨如何运用该模型来分析、指导斯特林制冷机的可靠性增长试验 ,包括试验前的准备、试验数据的处理、曲线的绘制 ,以及如何对增长过程进行估计和监测     

Reducing Average and Peak Test Power Through Scan Chain Modification

Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average and peak power considerations. The typical test vector loading techniques result in frequent transitions in the scan chain, which in turn reflect into significant levels of circuit switching unnecessarily. Judicious utilization of logic in the scan chain can help reduce transitions while loading the test vector needed. The transitions embedded in both test stimuli and the responses are handled through scan chain modifications consisting of logic gate insertion between scan cells as well as inversion of capture paths. No performance degradation ensues as these modifications have no impact on functional execution. To reduce average and peak power, we herein propose computationally efficient schemes that identify the location and the type of logic to be inserted. The experimental results confirm the significant reductions in test power possible under the proposed scheme.     

Researches of DC—Problem Under the Model S in which the Numbers of Defective Coins are not Fixed

In this paper,we research general Defective Cion Problem under the model S,i.e,the number d of Defective cions is not fixed. For d=O,1,or 2. we get some good results.     

有序分组资料的线性趋势检验的确切概率计算

有序分组资料的线性趋势检验主要用于检验几个二项总体反应率的线性趋势；在医学与生物学中最典型的用途是研究剂量和反应的关系． 如果用Ｚ检验来代替通常在本检验中所用的卡方检验，就可容易地导出本检验的确切概率计算方法，和其他２×Ｃ有序列联表有着相同的形式．本文给出了该检验的确切概率计算方法．     

An adaptive filter for gravitational-wave antennas

Summary We report on the development of an adaptive optimum filter for processing the data of a resonant bar gravitational-wave detector. This filter, based on the matched-filter theory, is adaptive in the sense that the function it realizes is derived from the actual noise spectrum of the data being analysed (instead from an idealized model of the noise). Its implementation is mostly based on frequency domain techniques. We also report on the application of the new filter to the data of the cryogenic antenna Explorer of the Rome group, with particular reference to the comparison between its performance and that of an otpimum filter with fixed values of the parameters.     

我国AB股双重上市公司经营业绩变化的实证分析

本文以46家在上海和深圳同时上市AB股的公司的样本,分析了公司实行双重上市前1年及其后4年的经营业绩的变化趋势以及股权结构和上市顺序对它的影响。研究表明,双重上市当年及其后4年经营业绩显著下降;股权结构和上市顺序对公司经营业绩影响明显。最后,文章提出了改善AB股公司经营业绩的对策建议。     

NEPCⅡ新电子枪热结构分析与测试

北京正负电子对撞机重大改造工程(BEPCⅡ)要求其直线注入器提供更高的能量和流强, 为此必须设计大电流和小发射度的新电子枪, 以提高正电子的产额. 利用ANSYS对BEPCⅡ新电子枪的温度场分布及结构的热变形进行了模拟分析. 对于电子枪复杂的内部结构形态以及能量转换方式, 分析了传导传热方式对温度场的影响. 在此基础上进行了温度场与结构变形的耦合分析, 利用EGUN对电子枪形变前后束流光学特性进行模拟分析, 并对模拟结果与试验 测试结果进行了分析比较.