光电对抗仿真试验系统综述

论述了研制光电对抗仿真试验系统建设的目的和意义,光电武器系统的现状和发展趋势,介绍了光电对抗仿真试验系统的一般组成,给出了光电武器系统的常规试验内容和试验流程,并论述了可能采用的试验方法。     

电子产品研制阶段可靠性增长试验研究

结合工程实际经验,深入讨论了可靠性增长过程及实现途径,在保持试验条件和改进过程不变的条件下,实施了对具体型号电子产品的可靠性增长试验,达到了预期的可靠性增长目标,并且利用可靠性增长试验的数学模型(AMSAA模型)来评估产品的可靠性增长,对开展可靠性增长与可靠性增长试验工作具有重要的实际意义.     

应用TEXTIO和MATLAB进行复杂数字系统仿真

在基于FPGA的复杂数字系统的仿真测试中,设计者常常面临各种挑战.以数字图像处理系统的仿真为例,如果采用完备性仿真测试方法,那么测试矢量的数量将是非常巨大的;如果采用常规方法,不仅效率不高,而且可能无法达到仿真测试的目的.针对这个难题,提出一种进行仿真测试的新方法,该方法应用TEXTIO和MATLAB来辅助仿真测试过程,使问题得到较好的解决.以电视图像实时多目标捕获单元的仿真测试为例,全面、细致地讨论这种新方法.     

玻璃纤维布内中空纤维丝的检测

介绍了玻璃纤维布内中空纤维丝的检测方法。     

基于Agilent-VEE平台的测试系统设计与应用

美国安捷伦公司(原惠普公司)的Agilent-VEE，NI公司的Lab VIEW和Lab Windows／CVI开发软件等是国际上公认的优秀的虚拟仪器开发平台软件，人们对以应用后两者开发测试系统比较了解，但对VEE在测试系统中的应用少有介绍。本文介绍基于Agilent-VEE平台和GPIB总线的实用测试系统的组成、特点及仪器控制方式。     

Signal Integrity: Fault Modeling and Testing in High-Speed SoCs

As we approach 100 nm technology the interconnect issues are becoming one of the main concerns in the testing of gigahertz system-on-chips. Voltage distortion (noise) and delay violations (skew) contribute to the signal integrity loss and ultimately functional error, performance degradation and reliability problems. In this paper, we first define a model for integrity faults on the high-speed interconnects. Then, we present a BIST-based test methodology that includes two special cells to detect and measure noise and skew occurring on the interconnects of the gigahertz system-on-chips. Using an inexpensive test architecture the integrity information accumulated by these special cells can be scanned out for final test and reliability analysis.     

The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICs

Modular testing is an attractive approach to testing large system ICs, especially if they are built from pre-designed reusable embedded cores. This paper describes an automated modular test development approach. The basis of this approach is that a core or module test is dissected into a test protocol and a test pattern list. A test protocol describes in detail how to apply one test pattern to the core, while abstracting from the specific test pattern stimulus and response values. Subsequent automation tasks, such as the expansion from core-level tests to system-chip-level tests and test scheduling, all work on test protocols, thereby greatly reducing the amount of compute time and data involved. Finally, an SOC-level test is assembled from the expanded and scheduled test protocols and the (so far untouched) test patterns. This paper describes and formalizes the notion of test protocols and the algorithms for test protocol expansion and scheduling. A running example is featured throughout the paper. We also elaborate on the industrial usage of the concepts described.     

铁路电力试验车软件的设计与实现

介绍了铁路电力试验车软件的设计思想、框架结构及其总体控制策略 ,并就其中的测试程序、数据库管理系统、串口通讯程序、复杂式样报表生成和系统安装程序的设计策略作了叙述。     

Model validation and model structure determination

This paper gives a tutorial overview of basic approaches for model validation and model structure determination.Work partially supported by the Swedish Research Council for Engineering Sciences under contract 98-654.