磁控溅射LaB6薄膜光学性能研究

采用磁控溅射法在玻璃基片上沉积LaB6薄膜。通过改变溅射功率参数,获得最佳制备工艺条件。采用XPS、X射线衍射仪和分光光度计研究薄膜的成分、结构、晶向以及透过率。当溅射功率为44 W,氩气气压为1.5 Pa,氩气流量为27 sccm时制备的LaB6薄膜表面相对平整,结构致密。 XRD数据也表明,此时LaB6薄膜结晶度最高且(110)晶面发生明显的择优生长。同时分光光度计结果显示：薄膜的透过率随溅射时间的增加而降低,并且最高透过率对应的波长没有发生变化。     

Application of XPS imaging analysis in understanding interfacial delamination and X‐ray radiation degradation of PMMA

The recent development of X‐ray Photoelectron Spectroscopy (XPS) instrumentation with spatial resolution down to several microns has advanced the capability of elemental and chemical state imaging. XPS imaging analysis has been applied in understanding the delamination problems of siloxane coatings on polymethyl‐methacrylate (PMMA) polymer. It was found that delamination occurred by interfacial failure, and the coating suffered complete delamination from a PMMA substrate. This example offered an opportunity for the investigation of X‐ray damage on polymers encountered in XPS imaging analysis. This paper also demonstrated how to construct a constrained peak model with the aid of chemical knowledge and supporting evidence of the sample. Monte Carlo error analysis was used to determine the validity of the peak fit models used. Copyright © 2013 John Wiley & Sons, Ltd.     

The effect of terminal chain modifications on the mesomorphic properties of 4,4′-disubstituted diphenyldiacetylenes

The typical sidewalls produced in the fabrication of protrusion electrodes are proposed to create a low voltage (4.5 V_rms) and high transmittance (93%) blue-phase liquid crystal display (BP-LCD). The tilted electrodes produce a strong horizontal electrical field that reduces the operating voltage considerably. The common problem of the ‘dead zones’ is solved by reflecting the light onto the electrodes. In order to estimate the phase retardation of the reflected light, a ray tracing simulation program for anisotropic mediums has been developed. The proposed device is more competitive than vertical field switching based BP-LCD and also, has the advantages of protruded in-plane-switching structures. These facts make this technology a potential candidate for the next generation of BP-LCDs.     

LABVIEW下冲击试验测试信号分析模块的设计

根据GJB冲击环境试验测试要求,介绍LABVIEW平台下两类典型冲击信号分析模块的设计方法,主要讲述利用多图层叠加编程技术实现GJB150.18-1986标准规定的半正弦波与后峰锯齿波动态套容差曲线分析模块的设计以及利用递归算法实现冲击响应谱分析模块的设计。其次,采用资源DLL封装技术对LABVIEW编程实现的冲击信号分析模块进行封装,在其他编程语言中调用DLL实现冲击信号分析模块在其他编程语言中的功能链接。实践表明,LABVIEW图形化编程技术可快速实现两类冲击信号分析模块的设计,将高速数据采集模块与冲击信号分析模块集成,可有效完成冲击试验测试与信号分析处理任务。     

A new asymmetric Pseudo‐Voigt function for more efficient fitting of XPS lines

Asymmetric peak profiles for the application in spectroscopy can be obtained in a simple way by substituting the usually constant full width at half maximum parameter in Pseudo‐Voigt functions with an energy‐dependent expression, for instance of sigmoidal shape. While this approach has been successfully applied to vibrational spectra, we find that the resulting curves are less suitable for least‐squares fits of X‐ray photoelectron spectroscopy (XPS) data. However, if one additionally allows a variable displacement of the sigmoidal step relative to the peak, excellent fitting results can be obtained. We demonstrate the applicability of our extended approach on several inherently asymmetric XPS lines, i.e. the C 1s signal of graphite and C₂H₂/Pd(100), the 3d_5/2–3d_3/2 doublet of palladium, and the 4f_7/2–4f_5/2 doublet of platinum. Comparison of the corresponding fit results with the results obtained by the application of more elaborate, theory‐based line profiles (Doniach‐?unji? and Mahan functions) shows that the modified Pseudo‐Voigt function gives practically identical results in terms of peak shape and area, while requiring much less computational effort since no convolution procedures are required for its calculation. Thus, this function is most suitable for application in one of the following situations: (i) the peak shape of a given signal is known but cannot be calculated with ease, and (ii) the theoretical peak shape is not (yet) known, however, one wants to perform a first quantitative screening of the data at issue. Copyright © 2014 John Wiley & Sons, Ltd.     

Study on the nanoscale current of ZnO film by photoassisted peak force tunnel atomic force: A novel technique for UV detection

ZnO film-based ultraviolet (UV) detector was fabricated by photoassisted peak force tunnel atomic force (PFTUNA) on fluorine tin oxide (FTO) substrate. The PFTUNA current in dark and in UV light was ~0.1 and 2.0 nA, respectively. The UV sensitivity (photocurrent/dark current) is more than 20. The response time and the recovery time are ~0.12 and 0.32 s, respectively. The UV sensing mechanism is that the holes will transport to the ZnO surface to capture the adsorbed oxygen ions to weaken the depletion layer under UV illumination. The PFTUNA current between the tip and the ZnO film is consistent with the Richardson–Schottky (RS) thermionic emission model.     

Heteronuclear Cross‐Relaxation Effects in the NMR Spectroscopy of Hyperpolarized Targets

Dissolution dynamic nuclear polarization (DNP) enables high‐sensitivity solution‐phase NMR experiments on long‐lived nuclear spin species such as ¹⁵N and ¹³C. This report explores certain features arising in solution‐state ¹H NMR upon polarizing low‐γ nuclear species. Following solid‐state hyperpolarization of both ¹³C and ¹H, solution‐phase ¹H NMR experiments on dissolved samples revealed transient effects, whereby peaks arising from protons bonded to the naturally occurring ¹³C nuclei appeared larger than the typically dominant ¹²C‐bonded ¹H resonances. This enhancement of the satellite peaks was examined in detail with respect to a variety of mechanisms that could potentially explain this observation. Both two‐ and three‐spin phenomena active in the solid state could lead to this kind of effect; still, experimental observations revealed that the enhancement originates from ¹³C→¹H polarization‐transfer processes active in the liquid state. Kinetic equations based on modified heteronuclear cross‐relaxation models were examined, and found to well describe the distinct patterns of growth and decay shown by the ¹³C‐bound ¹H NMR satellite resonances. The dynamics of these novel cross‐relaxation phenomena were determined, and their potential usefulness as tools for investigating hyperpolarized ensembles and for obtaining enhanced‐sensitivity ¹H NMR traces was explored.     

A discussion on mass resolution in secondary ion mass spectrometry

Mass resolution is a very important parameter for mass spectrometry. It is necessary to compare the mass resolution between the newly developed TOF-SIMS and the conventionally high-performance magnetic SIMS. However, the definitions of mass resolution for these two types of instruments are quite different. Whether it is possible to compare mass resolution and how to do such comparison is a challenge. This problem was raised officially during the 2012 ISO/TC 201 meeting at Tampa, Florida, the United States and the long-term cooperation with ISO started afterwards. The definition of mass resolution is one of the most important and fundamental problems for mass spectrometry and should attract significant attention. Here, some detail discussions on mass resolution as well as the related experimental studies in the past few years, including the collaborations with ISO/TC 201/SC6 and SC1 are summarized. This summary covers the common problem for almost all the current existing and still used definitions of mass resolution. A reasonable new definition for mass resolution considering the peak shape or resolution function has been proposed, which has also been confirmed by using experimental studies of the mass resolution comparison between TOF and magnetic SIMS. This study lays a foundation for the future mass resolution comparisons between different mass spectrometry.     

Compromising Science by Ignorant Instrument Calibration—Need to Revisit Half a Century of Published XPS Data

X‐ray photoelectron spectroscopy (XPS) is an indispensable technique in modern materials science for the determination of chemical bonding as evidenced by more than 10 000 XPS papers published annually. A literature survey reveals that in the vast majority of cases an incorrect referencing of the binding energy scale is used, neglecting warnings that have been formulated from the early days of the technique. Consequences for the data reliability are disastrous and decades of XPS work require revisiting. The purpose of this Viewpoint is to highlight the existing problems, review the criticism and suggest ways forward.     

Wavelet transforms in separation science for denoising and peak overlap detection

Wavelet transform is a versatile time‐frequency analysis technique, which allows localization of useful signals in time or space and separates them from noise. The detector output from any analytical instrument is mathematically equivalent to a digital image. Signals obtained in chemical separations that vary in time (e.g., high‐performance liquid chromatography) or space (e.g., planar chromatography) are amenable to wavelet analysis. This article gives an overview of wavelet analysis, and graphically explains all the relevant concepts. Continuous wavelet transform and discrete wavelet transform concepts are pictorially explained along with their chromatographic applications. An example is shown for qualitative peak overlap detection in a noisy chromatogram using continuous wavelet transform. The concept of signal decomposition, denoising, and then signal reconstruction is graphically discussed for discrete wavelet transform. All the digital filters in chromatographic instruments used today potentially broaden and distort narrow peaks. Finally, a low signal‐to‐noise ratio chromatogram is denoised using the procedure. Significant gains (>tenfold) in signal‐to‐noise ratio are shown with wavelet analysis. Peaks that were not initially visible were recovered with good accuracy. Since discrete wavelet transform denoising analysis applies to any detector used in separation science, researchers should strongly consider using wavelets for their research.