Analysis of S-SEED''s characteristics in optical switch

This article introduces the basic structure of a symmetric self-electrooptic effect device （S-SEED）, and applies the Kirchoff＇ s current law and a purely equivalent capacitive model, to analyze S-SEED＇s switch characteristics. Linear approximation and N-segment approximation are utilized to obtain S-SEED＇s voltage-time （V-T） and characteristics. Theoretical analysis is verified by simulations, and the results demonstrate that the precision of S-SEED＇s switch time can satisfy the requirement in applications with linear approximation. Moreover, the simulations compare S-SEED＇s switch characteristics with different input powers and input contrast ratios, which reveal that increasing input contrast ratio is an effective way to improve S-SEED＇s switch characteristics.     

Mid-infrared generation based on a periodically poled LiNbO3 optical parametric oscillator

We report a nanosecond Nd:YVO_4-pumped optical parametric oscillator (OPO) based on periodically poled LiNbO_3 (PPLN). Tuning is achieved in this experiment by varying the temperature and period of the PPLN. The design of double-pass singly resonant oscillator (DSRO) and confocal cavity enables the OPO threshold to be lowered considerably, resulting in a simple, compact, all-solid-state configuration with the mid-infrared idler powers of up to 466mW at 3.41μm.     

具有可调紫外滤光性能的富勒烯胺/壳聚糖共混膜的研究

通过溶液共混及流涎成膜法制备了一系列不同C60乙醇胺含量的壳聚糖共混膜。以及含Cu（Ⅱ）的C60乙醇胺/壳聚糖共混膜。研究表明，C60乙醇胺/壳聚糖共混膜具有优异的可调紫外滤光性能，随着C60乙醇胺含量的增加，其紫外滤光波长从200nm红移至400nm左右。在该复合体系中引入Cu（Ⅱ）能有效改善膜的紫外光学性能，同时还初步探讨了这类复合材料的紫外滤光机制。     

现代电子产品焊接质量的检测技术

介绍了现代电子产品焊接质量的检测技术,以及用于检查焊点质量和组装板(SMA)功能的测试仪器的工作原理及测试能力.目前常见和广泛使用的焊接质量检测方法是人工目测检查,其主要问题是其主观性,只能用来检测电子元件的形状、尺寸、颜色、表面特征及焊点的外观质量;自动光学检测(AOI)可以在整个过程中发现和纠正缺陷,但只是外在的焊点缺陷;激光/红外线组合式检测系统、X射线检测系统可以分析焊点微米级水平的缺陷,能找出其他检测所不能可靠地发现的缺陷,包括空洞、焊点形状差和冷焊锡点等;另外,X射线检测系统能一次测试单面或双面电路,准确地定位缺陷,获取工艺参数,例如锡膏厚度等.     

光纤荧光传感器衰减寿命的加权对数拟合法

荧光寿命的检测是荧光光学传感器的核心内容，国际上尝试了多种方法来拟合这种理论上为单指数衰减信号的荧光衰减曲线。这些方法包括非线性函数标准拟合方法。即Levenburg-Marquardt方法，以及Prony方法、FFT方法，对数拟合法等等。为了克服在实际应用中发生的信号退化，需要在测量信号衰减寿命的同时测量信号的初始强度。文章介绍了一种加权的对数拟合法，经计算机仿真及实际数据测试均可以得到和Levenburg-Marquardt方法非常接近的结果，且拟合时间大大缩短，测量稳定性大大提高。仿真测试及具体实验测试结果显示了这种方法的有效性。该方法不仅与Levenburg-Marquardt方法的偏差曲线非常相似，而且实验测得的荧光寿命与Levenburg-Marquardt方法偏差在0．2％以内。     

InP基应变补偿结构偏振不灵敏半导体光放大器制作的研究

为了制备偏振不灵敏的半导体光放大器(SOA)，将有源区设计为由4个压应变、3个张应变阱层及晶格匹配的垒层InGaAsP交替组合而成的应变补偿结构。器件做成带有倾角的扇形脊形波导结构，避免了常规制作SOA的复杂工艺。对样品3在80～125mA电流范围内，获得了偏振灵敏度≤0．6dB．最小可达0．1dB；较大的电流范围内FWHM值为40nm。     

Full Complex Amplitude Digital Holograms： Design, Fabrication and Optical Characterization

Diffractive optical elements have a large number of industrial applications, such as beam shaping and optical filtering. Traditionally, these elements modulate the phase of the incoming light or its amplitude, but not both. To overcome this limitation, full complex-amplitude modulation diffractive optical elements were developed. Well-established integrated circuit fabrication steps were employed to fabricate the devices with high precision. Using this approach, the new element‘s optical performances are improved also for near field operations. With this device it is possible to obtain 100% efficient spatial filtering and low noise reconstructed images.     

γ-辐照对纯Y_2SiO_5和Eu~(3+)∶Y_2SiO_5晶体光谱性能的影响

研究了γ-辐照前后纯Y2SiO5和Eu3+掺杂的Y2SiO5晶体吸收光谱的变化,辐照后,未退火和氢气退火的纯Y2SiO5晶体在260~270 nm和320 nm波段产生了附加吸收峰,分别是由F心和O-心的吸收引起的;经过空气退火的纯YSO晶体中,由于消除了氧空位,因此辐照后没有出现色心吸收峰。在Eu3+∶Y2SiO5晶体中,不但有相同的F心和O-心吸收峰,而且还有Eu2+离子在300 nm和390 nm的吸收峰。随着辐照剂量的增加,色心附加吸收峰增强。空气退火能减少Eu3+∶Y2SiO5晶体中的色心,而氢气退火能增加色心。     

Survivability in IP-over-WDM Networks: WDM Lightpath Protection versus IP LSP Protection

This article compares the performance of WDM lightpath protection and IP LSP protection schemes for IP-over-WDM networks. A mathematical formulation of the maximum throughput problem is presented and analytical expressions for recovery time are derived for both schemes. The throughputs and recovery times are analyzed and compared. Results show that the IP LSP protection scheme presents higher throughputs then WDM lightpath protection. The IP LSP protection scheme, providing individual IP LSP protection has, however, scalability problems. This scheme presents high recovery times when a failure affects many lightpaths and many hops are allowed for the primary routes of IP LSPs.     

机载海洋激光测深系统参量设计与最大探测深度能力分析

详细讨论了机载海洋激光测深系统最大测量深度与相关因子之间的关系，并利用最小可探测信噪比为判据，对机载海洋激光测深系统在白天和晚上工作进行了数值模拟，通过比较最大测量深度与激光脉冲峰值功率、接收视场角、接收口径和光谱接收带宽等关系，确定了系统的主要参量。以确定的参量建立的系统具有白天49m和晚上65m的最大测深能力，可完全满足在沿岸带以及岛礁的测量要求。