Trade-offs in scan path and BIST implementations for RAMs

In this article we propose efficient scan path and BIST schemes for RAMs. Tools for automatic generation of these schemes have been implemented. They reduce the design effort and thus allow the designer to select the more appropriate scheme with respect to various constraints.     

Techniques for estimating test length under random test

When a circuit is tested using random or pseudorandom patterns, it is essential to determine the amount of time (test length) required to test it adequately. We present a methodology for predicting different statistics of random pattern test length. While earlier methods allowed estimation only of upper bounds of test length and only for exhaustive fault coverage, the technique presented here is capable of providing estimates of all statistics of interest (including expected value and variance) for all coverage specifications.Our methodology is based on sampling models developed for fault coverage estimation [1]. Test length is viewed as awaiting time on fault coverage. Based on this relation we derive the distribution of test length as a function of fault coverage. Methods of approximating expected value and variance of test length are presented. Accuracy of these approximations can be controlled by the user. A practical technique for predicting expected test length is developed. This technique is based on clustering faults into equal detectability subsets. A simple and effective algorithm for fault clustering is also presented. The sampling model is applied to each cluster independently and the results are then aggregated to yield test lengths for the whole circuit. Results of experiments with several circuits (both ISCAS '85 benchmarks and other practical circuits) are also provided.This work was done while the author was with the Department of Electrical Engineering, Southern Illinois University, Carbondale, IL 62901.     

Large Sample Properties of Mixture Models with Covariates for Competing Risks

We study the large-sample properties of a class of parametric mixture models with covariates for competing risks. The models allow general distributions for the survival times and incorporate the idea of long-term survivors. Asymptotic results are obtained under a commonly assumed independent censoring mechanism and some modest regularity conditions on the survival distributions. The existence, consistency, and asymptotic normality of maximum likelihood estimators for the parameters of the model are rigorously derived under general sufficient conditions. Specific conditions for particular models can be derived from the general conditions for ready check. In addition, a likelihood-ratio statistic is proposed to test various hypotheses of practical interest, and its asymptotic distribution is provided.     

一种红外成像系统作用距离试验评估方法

进行红外成像系统作用距离考核试验时，由于外场试验中的目标特性及气象条件与指标提出对应的目标特性及气象条件有差别，因此需要进行必要的折算。提出一种基于信噪比准则的可行的红外成像系统作用距离试验评估方法。     

Mixed-Signal Circuit Classification in a Pseudo-Random Testing Scheme

Pseudo-random testing techniques for mixed-signal circuits offer several advantages compared to explicit time-domain and frequency-domain test methods, especially in a BIST structure. To fully exploit these advantages a suitable choice of the pseudo-random input parameters should be done and an investigation on the accuracy of the circuit response samples needed to reduce the risk of misclassification should be carried out. Here these issues have been addressed for a testing scheme based on the estimation of the impulse response of the device under test (DUT) by means of input-output cross-correlation. Moreover, new acceptance criteria for the DUT are suggested which solve some ambiguity problems arising if the classification of the DUT as good or bad is based on a few samples of the cross-correlation function. Examples of application of the proposed techniques to real cases are also shown in order to assess the impact of the measurement system inaccuracies on the reliability of the test.     

Duane模型在斯特林制冷机研制过程中的应用

介绍一种实用的可靠性增长模型杜安 (Duane)模型 ,并探讨如何运用该模型来分析、指导斯特林制冷机的可靠性增长试验 ,包括试验前的准备、试验数据的处理、曲线的绘制 ,以及如何对增长过程进行估计和监测     

Reducing Average and Peak Test Power Through Scan Chain Modification

Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average and peak power considerations. The typical test vector loading techniques result in frequent transitions in the scan chain, which in turn reflect into significant levels of circuit switching unnecessarily. Judicious utilization of logic in the scan chain can help reduce transitions while loading the test vector needed. The transitions embedded in both test stimuli and the responses are handled through scan chain modifications consisting of logic gate insertion between scan cells as well as inversion of capture paths. No performance degradation ensues as these modifications have no impact on functional execution. To reduce average and peak power, we herein propose computationally efficient schemes that identify the location and the type of logic to be inserted. The experimental results confirm the significant reductions in test power possible under the proposed scheme.     

Z900MCM综述

介绍了Z900 MCM设计和布局,可控塌陷芯片连接(C4)工艺在Z900 MCM组装中的应用。从设计上通过加入垂直电感器及去耦电容器减小其噪声。通过基板测试和功能测试,剔除有缺陷的基板和芯片。Z900 MCM采用先进的MCM—D技术和MCM返工及冷却技术。Z900 MCM平均无故障时间高达40年。     

一种基于小波变换的OTDR事件分析算法的研究

简单分析了用 OTDR卡进行光纤检测的原理 ,根据小波分析检测信号突变点的理论 ,提出了运用小波分析对光纤断点及反射事件准确定位的方法。理论分析和实例计算表明 ,这种方法对 OTDR曲线中反射事件尤其是断点的定位非常准确 ,是一种行之有效的方法     

某军用直流电源的RET方法研究

可靠性强化试验(RET)是一种新兴的试验技术,它使用在产品的设计阶段,用于快速暴露产品的缺陷和薄弱环节。以某军用直流电源为例介绍了可靠性试验方法,并对可靠性强化试验方法的优越性进行了讨论。