户外柜式通讯电源系统设计的自然环境因素分析

列举了影响户外柜式通讯电源系统的自然环境因素，并论述了各个因素对产品可靠性的影响机理，提出了产品设计时需要考虑的要点。为该类产品的环境适应性设计和可靠性设计提供了必要的参考，对其它户外电子设备也有借鉴意义。     

Optimization of ohmic contacts for reliable heterostructure GaAs materials

We studied silver barrier ohmic (Ni/AuGe/Ag/Au) contacts to the GaAs based HEMT structures and observed strong dependence of the cleaning procedures on the ohmic con-tact resistance (R_c), its stability and reliability. The chemical profiles of the metal con-tacts before and after alloying were measured by SIMS. Samples cleaned with the com-bined plasma O₂ and NH₄OH process exhibited excellent results:R _c ∼ 0.1–0.12 ohm-mm when alloyed in the temperature range of 440–540° C and remained stable when subjected to a 200° C and 600mA/mm stress condition for 1000 hr.     

故障树分析法及其应用

介绍了故障树分析法的基本原理及其应用实例，并利用c语言来解决可靠性问题。从实验中，获得了值得借鉴的经验。     

网络可靠性仿真

讨论了在链路以及节点均可能失效情况下,把节点的失效等效为与之相连链路的失效,运用蒙特卡洛法对网络可靠性进行仿真。并给出了仿真次数对仿真结果的误差的影响。     

多层陶瓷外壳的失效分析和可靠性设计

文章对多层陶瓷外壳的失效模式,包括陶瓷底座断裂失效、绝缘电阻失效、断路和短路失效、外引线和无引线外壳引出端焊盘与外电路连接失效、电镀层锈蚀失效、密封失效、键合和芯片剪切失效和使用不当造成失效等进行讨论,并对这些失效的失效机理进行了分析,根据以上的失效模式及其失效机理分析,对多层陶瓷外壳的可靠性设计进行了探讨。     

Ambient Temperature Ultrasonic Bonding of Si-Dice Using Sn-3.5wt.%Ag

Ultrasonic bonding of Si-dice to type FR-4 printed circuit boards (PCB) with Sn-3.5wt.%Ag solder at ambient temperature was investigated. The under-bump metallization (UBM) on the Si-dice comprised Cu/Ni/Al from top to bottom with thicknesses of 0.4 μm, 0.4 μm, and 0.3 μm, respectively. The pads on the PCBs consisted of Au/Ni/Cu with thicknesses of 0.05/5/18 μm, sequentially from top to bottom. Solder was supplied as Sn-3.5wt.%Ag foil rolled to 100 μm thickness, and inserted in the joints. The ultrasonic bonding time was varied from 0.5 s to 3.0 s, and the ultrasonic power was 1400 W. The experimental results showed that reliable joints could be produced between the Si-dice and the PCBs with Sn-3.5wt.%Ag solder. The joint breaking force of “Si-die/solder/FR-4” increased with bonding times up to 2.5 s with a maximum value of 65 N. A bonding time of 3.0 s proved to be excessive, and resulted in cracks along the intermetallic compound between the UBM and solder, which caused a decrease in the bond strength. The intermetallic compound produced by ultrasonic bonding between the UBM and solder was confirmed to be (Cu, Ni)₆Sn₅. An erratum to this article can be found at     

Status and prospects for phosphor-based white LED packaging

The status and prospects for high-power, phosphor-based white light-emitting diode (LED) pack-aging have been presented. A system view for packaging design is proposed to address packaging issues. Four aspects of packaging are reviewed: optical control, thermal management, reliability and cost. Phosphor materials play the most important role in light extraction and color control. The conformal coating method improves the spatial color distribution (SCD) of LEDs. High refractive index (RI) encapsulants with high transmittance and modified surface morphology can enhance light extraction. Multi-phosphor-based packaging can realize the control of correlated color temperature (CCT) with high color rendering index (CRI). Effective thermal management can dissipate heat rapidly and reduce thermal stress caused by the mismatch of the coefficient of thermal expansion (CTE). Chip-on-board (COB) technology with a multi-layer ceramic substrate is the most promising method for high-power LED packaging. Low junction temperature will improve the reliability and provide longer life. Advanced processes, precise fabrication and careful operation are essential for high reliability LEDs. Cost is one of the biggest obstacles for the penetration of white LEDs into the market for general illumination products. Mass production in terms of CoB, system in packaging (SIP), 3D packaging and wafer level packaging (WLP) can reduce the cost significantly, especially when chip cost is lowered by using a large wafer size.     

一种考虑部件冷备冗余的可靠性仿真方法

在考虑部件冗余情况下,通过分析系统部件的状态与系统最小割集之间的关系,研究了部件故障对系统状态的影响;建立了系统的仿真模型,根据系统完成任务的情况,得到了系统可靠性与平均失效时间的统计值,旨在为系统可靠性的设计提供依据.     

片式电阻混合焊点热循环负载可靠性研究

对在不同工艺参数下形成的、并且经过不同周数热循环负载的片式电阻混合焊点、有铅焊点和无铅焊点进行了外观检测和剪切测试。结果显示,在不同工艺参数下形成的混合焊点的剪切力,随热循环周数的变化趋势有所不同,但是在保证片式电阻焊端和焊料充分熔融的情况下,部分混合焊点的平均剪切力比有铅焊点高,热循环1 000周后,为9.1～11.1 N。