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61.
We study the convergence of greedy algorithms in Banach spaces. We construct an example of a smooth Banach space, where the X-greedy algorithm converges not for all dictionaries and initial vectors. We also study the R-greedy algorithm, which, along with the X-greedy algorithm, is a generalization of the simple greedy algorithm in Hilbert space. We prove its convergence for a certain class of Banach spaces. In particular, this class contains, the spaces p,p 2. 相似文献
62.
A number of formulas of linguistic statistics are refined. The notions of real and virtual cardinality of a sign are introduced. We show that a formula refining Zipf’s law for the occurrence frequencies in frequency dictionaries can be extended to arbitrary sign objects, i.e., semiotic systems. 相似文献
63.
The major problem of fault diagnosis with a fault dictionary is the enormous amount of data. The technique used to manage
this data can have a significant effect on the outcome of the fault diagnosis procedure. If information is removed from a
fault dictionary in order to reduce the size of the dictionary, its ability to diagnose stuck-at faults and unmodeled faults
may be severely debased. Therefore, we focus on methods for producing a dictionary that is both small and lossless-compacted.
We propose an efficient dictionary for maximum diagnosis, which is called SD-Dictionary. This dictionary consists of a static
sub-dictionary and a dynamic sub-dictionary in order to make a smaller dictionary while maintaining the critical information
needed for the diagnostic ability. Experimental results on ISCAS’ 85, ISCAS’ 89 and ITC’ 99 benchmark circuits show that the
size of the proposed dictionary is substantially reduced, while the dictionary retains most or all of the diagnostic capability
of the full dictionary.
This work was supported by the “System IC 2010” project of Korea Ministry of Science and Technology and Ministry of Commerce,
Industry and Energy.
Editor: Y. Takamatsu
Sunghoon Chun received the B.S. degrees in Electrical and Electronic Engineering from Yonsei University, Seoul, Korea, in 2002. He was
a Reseach Engineer with ASIC Research Center in Yonsei University. He researched for test methodologies for SoC. He received
the M.S. degrees in Electrical and Electronic Engineering from Yonsei University in 2005. He is currently working toward Ph.D.
degree in Electrical and Electronic Engineering at Yonsei University. His area of interests includes SoC testing, delay testing,
fault diagnosis, functional testing for processor based system and test methodologies for signal integrity faults.
Sangwook Kim received the B.S., and M.S. degrees in Electrical and Electronic Engineering from Yonsei University, Seoul, Korea, in 1999,
and 2001, respectively. He researched for Digital Signal Processor design and fault diagnosis of VLSI. He is a Research Engineer
with SoC Design Group of System IC Division in LG Electronics, Inc. He is currently interested in SoC design for HDTV and
design verification.
Hong-Sik Kim was born in Seoul, Korea, on April 4, 1973. He received the B.S., M.S. and Ph.D. degrees in Electrical and Electronic Engineering
from Yonsei University, Seoul, Korea, in 1977, 1999, and 2004, respectively. He was a Post-Doctorial Fellow with the Institute
of Virginia Technology. He is currently working on System LSI Group in the Samsung Electronics. His current research interest
includes design-for-testability, built-in self tests and fault diagnosis.
Sungho Kang received the B.S. degree from Seoul National University, Seoul, Korea, and the M.S. and Ph.D. degrees in electrical and computer
engineering from The University of Texas at Austin. He was a Post-Doctorial Fellow with the University of Texas at Austin,
a Research Scientist with the Schlumberger Laboratory for Computer Science, Schlumberger Inc., and a Senior Staff Engineer
with the Semiconductor Systems Design Technology, Motorola Inc. Since 1994, he has been an Associate Professor with the Department
of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea. His current research interests include VLSI design,
VLSI CAD and VLSI testing and design for testability. 相似文献
64.
模拟电路故障诊断的新故障字典法 总被引:16,自引:0,他引:16
基于节点电压灵敏度,将文献[1]中的线性无容差电路的故障字典法推广到可以诊断容差模拟电路和非线性电路软故障的新故障字典法。讨论了该方法的原理和字典的建立方法,给出了仿真实例。 相似文献
65.
对于不完全投影角度的重建研究是CT图像重建中一个重要的问题.将压缩感知中字典学习的方法与CT重建算法ART迭代算法相结合.字典学习方法中字典更新采用K-SVD(K-奇异值分解)算法,稀疏编码采用OMP(正交匹配追踪)算法.最后通过对标准Head头部模型进行仿真实验,验证了字典学习方法在CT图像重建中对于提高图像的重建质量和提高信噪比的可行性与有效性.另外还研究了字典学习中图像块大小和滑动距离对重建图像的影响 相似文献
66.
67.
在基于稀疏表示分类的模式识别中,字典学习(DL) 可以为稀疏表示获得更为精简的数据表示。最近的基于Fisher判别的字典学习(FDDL)可以学 习到更加判别的稀疏字典,使得稀疏表示分类具有很强的识别性能。核空间变换可以学习到 非线性结构信息,这对判别分类非常有用。为了充分利用 核空间特性以学习更加判别的稀疏字典来提升最终的识别性能,在FDDL的基础上,提出了两 种核化的稀疏表示DL方法。首先原始训练数据被投影到高维核空间,进行基于Fisher 判别的核稀 疏表示DLFDKDL;其次在稀疏系数上附加核Fisher约束,进行基于核Fisher判别的核稀疏表 示DL(KFDKDL),使得所学习的字典具有更强的判别能力。在多个公开的图像数据库上的稀疏 表示分类实验结果验证了所提出的FDKDL和KFDKDL方法的有效性。 相似文献
68.
针对微波辐射测量成像系统在一次观测中所采集的数据量大,基于奈奎斯特采样的常规,微波辐射成像方法难以实现高分辨率要求。本文在挖掘微波辐射图像多结构信息可压缩的基础上,利用随机观测矩阵对微波辐射图像进行线性压缩投影,减少数据采集量,降低系统的复杂性。考虑微波辐射图像具有多结构形式,采用单一的正交基难以稀疏表示复杂场景的微波辐射图像,利用全变差分和小波的级联字典对微波辐射图像进行稀疏表示,然后用OMP 算法重构微波辐射图像。仿真实验结果表明:级联字典重构微波辐射图像的性能优于单一正交基。 相似文献
69.
基于稀疏重构的图像修复依赖于图像全局自相似性信息的利用和稀疏分解字典的选择,为此提出了基于分类学习字典全局稀疏表示模型的图像修复思路.该算法首先将图像未丢失信息聚类为具有相似几何结构的多个子区域,并分别对各个子区域用K-SVD字典学习方法得到与各子区域结构特征相适应的学习字典.然后根据图像自相似性特点构建能够描述图像块空间组织结构关系的全局稀疏最大期望值表示模型,迭代地使用该模型交替更新图像块的组织结构关系和损坏图像的估计直到修复结果趋于稳定.实验结果表明,方法对于图像的纹理细节、结构信息都能起到好的修复作用. 相似文献
70.
通过研究帧间自相似性对图像重建的影响,提出一种自相似性约束的单视频稀疏超分辨率重建算法,以达到保持图像局部结构完整性的同时有效去噪的目的。该算法运用主成分分析PCA训练出适应图像不同局部结构的分类词典;通过帧间光流场的粗略运动估计和帧内帧间的精确块匹配,搜索自相似信息,运用非局部均值NLM滤波,并以此约束稀疏模型。仿真实验表明,提出的算法无论是客观指标,还是主观视觉上都超过了进行比较的几种分辨率提高算法。 相似文献