一种InGaP/GaAs HBT高速预分频器MMIC

采用Foundry提供的InGaP/GaAs HBT工艺设计了一种数字静态除2高速预分频器MMIC.流片测试结果与仿真结果基本吻合,最高工作频率高于仿真结果.设计过程在速度和功耗之间进行了折中,并且考虑了自谐振频率对电路的影响.测试结果显示:在5V电源电压下,该预分频器静态电流为60mA,最高工作频率达到15GHz,自谐振频率为19.79GHz.该MMIC可以直接应用到S-X波段射频微波系统中.     

Characteristics of GdGaO grown by MBE

Ga₂O₃/GdGaO dielectric stacks have been grown on GaAs for MOSFETs. This paper highlights variations in the characteristics of GdGaO as the Gd flux, Ga₂O flux and substrate temperature are changed. The growth rate, composition, crystallinity are discussed and the sheet resistance of final MOSFET structures are presented. The Gd compositional variation with depth is examined using Rutherford back scattering (RBS) and electron energy loss spectroscopy (EELS).     

Optically induced level anticrossing in undoped GaAs/AlGaAs coupled double quantum wells

We report a photoluminescence detected anticrossing of the energy levels in an undoped asymmetric coupled-double-quantum-well buried in a p-i-n structure. Due to the built-in electric field, the quantum wells are tilted in such a way that the symmetric energy level is higher than that of the antisymmetric one in the conduction band. Keeping the laser excitation energy below the barrier, with increasing laser power, the level anticrossing and the quantum confined Stark effect were observed due to decreasing built-in electric field by the photogenerated electron and hole pairs.     

半绝缘GaAs的表面光伏谱研究

利用表面光伏法（ＳＰＶ）研究了半绝缘ＧａＡｓ（ＳＩ－ＧａＡｓ）的缺陷态,通过加直流光偏置测量了室温下带边以下的光伏响应,发现带隙内缺陷态的光伏向应主要是由于表面复合而在样品表面形成协流子浓度梯度引起的,通过实验表明ＳＰＶ是一种对ＳＩ－ＧａＡｓ晶片表面质量进行检测的非常灵敏的无损检测方法。     

Modulation spectroscopy study of a strained layer GaAs/GaAsP multiple quantum well structure

Using contactless electroreflectance (CER) and piezoreflectance at 300 K we have characterized a GaAs/GaAs_1?xP_x multiple quantum well (MQW) structure, “GaAs” (nominal) and GaAsP epilayers grown by chloride transport chemical vapor deposition on GaAs (001) substrates. From a detailed lineshape fit to the CER data from the epilayers we have determined the energies of the fundamental band gap and hence the phosphorous composition. The nominal “GaAs” epilayers were found to have phosphorous compositions of about 2.5–3.2%, a result of the phosphorous diffusion between growth chambers in the reactor. The GaAs_1?xP_x epilayer had x=0.29. For the GaAs_0.97P_0.03/GaAs_0.71P_0.29MQW comparison between the experimentally observed energies of a number of quantum transitions with a theoretical envelope function calculation, including the effects of strain in the barriers, made it possible to evaluate the unstrained conduction band offset parameter Q_c=0.50±0.05. Our value for this parameter is discussed in relation to other works. Atomic force microscopy was employed to investigate the surface morphology of the 230 Å GaAsP top layer of the MQW in addition to a 2000 Å GaAsP epilayer. From the absence of any cross-hatch pattern associated with misfit dislocations on the former we concluded that the GaAsP in the MQW is pseudomorphic. On the other hand the 2000 Å epilayer exhibited signs of strain relaxation.     

GaAs/GaAlAs透射式光电阴极的分辨力特性分析

Ｇａ Ａｓ／ Ｇａ Ａｌ Ａｓ 透射式光电阴极的分辨力是第３ 代微光像增强器的重要参数之一。从简化的二维扩散方程推导了 Ｇａ Ａｓ／ Ｇａ Ａｌ Ａｓ 透射式阴极的调制传递函数（ Ｆｍ ,ｔ） ,计算了２ μｍ 厚 Ｇａ Ａｓ 阴极层的 Ｇａ Ａｓ／ Ｇａ Ａｌ Ａｓ 透射阴极的理论分辨力特性曲线,并讨论了它与若干参数的关系。据此得出在设计 Ｇａ Ａｓ／ Ｇａ Ａｌ Ａｓ 透射式光电阴极时应主要考虑最大量子效率,分辨力的损失并不限制系统的性能。     

III–V quantum devices and circuits based on nanoscale Schottky gate control of hexagonal quantum wire networks

The concept, the present status, key issues and future prospects of a novel hexagonal binary decision diagram (BDD) quantum circuit approach for III–V quantum large-scale integrated circuits (QLSIs) are presented and discussed. In this approach, the BDD logic circuits are implemented on III–V semiconductor-based hexagonal nanowire networks controlled by nanoscale Schottky gates. The hexagonal BDD QLSIs can operate at delay-power products near the quantum limit in the quantum regime as well as in the many-electron classical regime. To demonstrate the feasibility of the present approach, GaAs Schottky wrap gate (WPG)-based single-electron BDD node devices and their integrated circuits were fabricated and their proper operations were confirmed. Selectively grown InGaAs sub-10 nm quantum wires and their hexagonal networks have been investigated to form high-density hexagonal BDD QLSIs operating in the quantum regime at room temperature.     

DEEP LEVEL DEFECTS IN SI-IMPLANTED LEC UNDOPED Si-GaAs

The residual electrically active defects in(4×10~(12)cm~(-2)(30KeV)+5×10~(12)cm~(-2)(130KeV))si-implanted LEC undoped si-GaAs activated by two-step rapid thermal annealing(RTA)LABELED AS 970℃(9S)+750℃(12S)have been investigated with deep level transient spec-troscopy(DLTS).Two electron traps ET_1(E_c-0.53eV,σ_n=2.3×10~(-16)cm~2)and ET_2(E_c-0.81eV,σ_n=9.7×10(-13)cm~2)are detected.Furthermore,the noticeable variations of trap's con-centration and energy level in the forbidden gap with the depth profile of defects induced by ion im-plantation and RTA process have also been observed.The[As_i·V_(As)·As_(Ga)]and[V_(As)·As_i·V_(Ga)·As_(Ga)]are proposed to be the possible atomic configurations of ET_1 and ET_2,respectively to explaintheir RTA behaviors.     

GaAs／AIGaAs量子阱红外探测器的发展

半导体超晶格量子阱红外探测器的研制近年来取得了引人注目的成果,其中 GaAs/AlGaAs 红外器件的发展最快。本文在简要综述其单元探测器的基础上,着重介绍这种材料用于红外探测器列阵和焦平面的新成果。