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141.
142.
J Li M Hermann G Frenking C Jones 《Angewandte Chemie (International ed. in English)》2012,51(34):8611-8614
Taking the fizz out: A digermyne compound with a Ge?Ge single bond has been shown to quantitatively reduce CO(2) to CO at temperatures as low as -40?°C. The mechanism of this unprecedented reaction has been probed by spectroscopic and computational techniques and involves a metastable intermediate (see picture; Ar*=C(6) H(2) {C(H)Ph(2) }(2) Me-2,6,4). 相似文献
143.
144.
Kira M 《Proceedings of the Japan Academy. Series B, Physical and biological sciences》2012,88(5):167-191
Structure and properties of silicon-silicon doubly bonded compounds (disilenes) are shown to be remarkably different from those of alkenes. X-Ray structural analysis of a series of acyclic tetrakis(trialkylsilyl)disilenes has shown that the geometry of these disilenes is quite flexible, and planar, twist or trans-bent depending on the bulkiness and shape of the trialkylsilyl substituents. Thermal and photochemical interconversion between a cyclotetrasilene and the corresponding bicyclo[1.1.0]tetrasilane occurs via either 1,2-silyl migration or a concerted electrocyclic reaction depending on the ring substituents without intermediacy of the corresponding tetrasila-1,3-diene. Theoretical and spectroscopic studies of a stable spiropentasiladiene have revealed a unique feature of the spiroconjugation in this system. Starting with a stable dialkylsilylene, a number of elaborated disilenes including trisilaallene and its germanium congeners are synthesized. Unlike carbon allenes, the trisilaallene has remarkably bent and fluxional geometry, suggesting the importance of the π-σ* orbital mixing. 14-Electron three-coordinate disilene-palladium complexes are found to have much stronger π-complex character than related 16-electron tetracoordinate complexes. 相似文献
145.
A.R. Peaker V.P. Markevich I.D. Hawkins B. Hamilton K. Bonde Nielsen K. Gościński 《Physica B: Condensed Matter》2012,407(15):3026-3030
This paper is to commemorate the work of Leszek Dobaczewski1 who devoted much of his life to the development and application of high resolution DLTS. 相似文献
146.
用高温熔融法制备了Bi2O3掺杂的(0.9-x) GeO2-xNb2O5-0.1BaO (含量x为摩尔分数, x=0, 0.04, 0.07, 0.1)系列玻璃. 测定了玻璃样品的差热分析(DTA)曲线、吸收光谱、发射光谱及X射线光电子能谱(XPS). 从DTA曲线分析得到玻璃的结晶起始温度与软化温度之差(Tx-Tg)达200℃以上. 吸收光谱中可观察到位于500, 700, 808和1000 nm处的吸收峰, 并随着Nb2O5含量x的增加吸收边带发生红移. 在波长为808 nm激光激发下, 观察到发光中心位于1300 nm处、荧光光谱半高宽约为200 nm的宽带发光. 荧光强度随Bi2O3掺杂量δ的增加先增强后减弱, 当掺杂量δ达到约0.01时, 荧光强度达到最强. 随着Nb2O5含量x从0.04增加到0.1时, 荧光强度逐步减弱. 样品的XPS峰分别位于159.6和164.7 eV, 它们介于Bi3+与Bi5+的特征结合能之间, 因此Bi3+与Bi5+可能同时存在于玻璃基质中. 从XPS及Bi离子的发光特性推断, 宽带的荧光发射可能起因于Bi5+. 随着Nb2O5含量x的增加, 荧光强度逐步减弱. 分析认为, Nb2O5取代GeO2后形成了NbGe缺陷, 需要低价Bi离子进行电子补偿, 因而抑制了Bi5+形成, 致使荧光强度减弱. 相似文献
147.
The article presents a study for the evolution of growth interface in crystal growth by Liquid Phase Diffusion (LPD). Specific LPD experiments were designed to grow compositionally graded, germanium‐rich SixGe1‐x single crystals of 25 mm in diameter with various thicknesses. Measured interface shapes show the evolution of the growth interface. Silicon compositions were measured by the Energy Dispersive X‐ray analysis (EDX) in the growth and radial directions. The study shows the feasibility of extracting the desired seeds of uniform composition from LPD grown crystals, for subsequent use in other epitaxial growth processes. © 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim 相似文献
148.
ChemInform is a weekly Abstracting Service, delivering concise information at a glance that was extracted from about 200 leading journals. To access a ChemInform Abstract, please click on HTML or PDF. 相似文献
149.
针对铂等常用金属热敏材料电阻温度系数(TCR)不高,导致热式MEMS流速传感器宽量程测量时功耗高的问题,设计了 一种基于非晶锗(a-Ge)薄膜热电阻的低功耗、宽量程柔性MEMS流速传感器.非晶锗热电阻材料具有较高的TCR系数(约为-0.02/K)和室温电阻率(5Ω·m),传感器在较低的工作温差和功耗下可获得宽量程的流速测量.阐述了该柔性MEMS流速传感器的设计结构、工作原理、3D有限元建模和热-流场仿真结果.利用聚酰亚胺衬底空腔膜上的四个非晶锗热电阻同时作为自加热热源和测温元件.四个非晶锗热电阻组成一个惠斯通电桥,同时结合热损失和热温差原理来实现宽量程流速测量和测向.仿真结果表明,惠斯通电桥采用恒电流供电只需120μA,使得非晶锗热阻的工作温度与环境温度之间的温差不高于6 K,就可对0~50 m/s范围内的流速进行测量,且功耗在1.368 mW以内.该柔性流速传感器易于采用MEMS技术批量制造,可贴于曲面应用,非常适于物联网等低功耗流速传感领域. 相似文献
150.
Low dislocation density Ge wafers grown by a vertical gradient freeze (VGF) method used for the fabrication of multi-junction photovoltaic cells (MJC) have been studied by a whole wafer scale measurement of the lattice parameter, X-ray rocking curves, etch pit density (EPD), impurities concentration, minority carrier lifetime and residual stress. Impurity content in the VGF-Ge wafers, including that of B, is quite low although B2O3 encapsulation is used in the growth process. An obvious difference exists across the whole wafer regarding the distribution of etch pit density, lattice parameter, full width at half maximum (FWHM) of the X-ray rocking curve and residual stress measured by Raman spectra. These are in contrast to a reference Ge substrate wafer grown by the Cz method. The influence of the VGF-Ge substrate on the performance of the MJC is analyzed and evaluated by a comparison of the statistical results of cell parameters. 相似文献